GOexpress: an R/Bioconductor package for the identification and visualisation of robust gene ontology signatures through supervised learning of gene expression data

Background: Identification of gene expression profiles that differentiate experimental groups is critical for discovery and analysis of key molecular pathways and also for selection of robust diagnostic or prognostic biomarkers. While integration of differential expression statistics has been used to refine gene set enrichment analyses, such approaches are typically limited to single gene lists resulting from simple two-group comparisons or time-series analyses. In contrast, functional class scoring and machine learning approaches provide powerful alternative methods to leverage molecular measurements for pathway analyses, and to compare continuous and multi-level categorical factors. Results: We introduce GOexpress, a software package for scoring and summarising the capacity of gene ontology features to simultaneously classify samples from multiple experimental groups. GOexpress integrates normalised gene expression data (e.g., from microarray and RNA-seq experiments) and phenotypic information of individual samples with gene ontology annotations to derive a ranking of genes and gene ontology terms using a supervised learning approach. The default random forest algorithm allows interactions between all experimental factors, and competitive scoring of expressed genes to evaluate their relative importance in classifying predefined groups of samples. Conclusions: GOexpress enables rapid identification and visualisation of ontology-related gene panels that robustly classify groups of samples and supports both categorical (e.g., infection status, treatment) and continuous (e.g., time-series, drug concentrations) experimental factors. The use of standard Bioconductor extension packages and publicly available gene ontology annotations facilitates straightforward integration of GOexpress within existing computational biology pipelines.Department of Agriculture, Food and the MarineEuropean Commission - Seventh Framework Programme (FP7)Science Foundation IrelandUniversity College Dubli

To Index or Not to Index: Optimizing Exact Maximum Inner Product Search

Exact Maximum Inner Product Search (MIPS) is an important task that is widely pertinent to recommender systems and high-dimensional similarity search. The brute-force approach to solving exact MIPS is computationally expensive, thus spurring recent development of novel indexes and pruning techniques for this task. In this paper, we show that a hardware-efficient brute-force approach, blocked matrix multiply (BMM), can outperform the state-of-the-art MIPS solvers by over an order of magnitude, for some -- but not all -- inputs. In this paper, we also present a novel MIPS solution, MAXIMUS, that takes advantage of hardware efficiency and pruning of the search space. Like BMM, MAXIMUS is faster than other solvers by up to an order of magnitude, but again only for some inputs. Since no single solution offers the best runtime performance for all inputs, we introduce a new data-dependent optimizer, OPTIMUS, that selects online with minimal overhead the best MIPS solver for a given input. Together, OPTIMUS and MAXIMUS outperform state-of-the-art MIPS solvers by 3.2$\times$ on average, and up to 10.9$\times$, on widely studied MIPS datasets.Comment: 12 pages, 8 figures, 2 table

Connecting Software Metrics across Versions to Predict Defects

Accurate software defect prediction could help software practitioners allocate test resources to defect-prone modules effectively and efficiently. In the last decades, much effort has been devoted to build accurate defect prediction models, including developing quality defect predictors and modeling techniques. However, current widely used defect predictors such as code metrics and process metrics could not well describe how software modules change over the project evolution, which we believe is important for defect prediction. In order to deal with this problem, in this paper, we propose to use the Historical Version Sequence of Metrics (HVSM) in continuous software versions as defect predictors. Furthermore, we leverage Recurrent Neural Network (RNN), a popular modeling technique, to take HVSM as the input to build software prediction models. The experimental results show that, in most cases, the proposed HVSM-based RNN model has a significantly better effort-aware ranking effectiveness than the commonly used baseline models

A Survey on Metric Learning for Feature Vectors and Structured Data

The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method