Automatic programming methodologies for electronic hardware fault monitoring

This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the Stressor - susceptibility interaction model. A circuit or a system is considered to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after pre-processing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm and classification and regression trees. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.This research was supported by the International Joint Research Grant of the IITA (Institute of Information Technology Assessment) foreign professor invitation program of the MIC (Ministry of Information and Communication), Korea

Modeling Human Aspects to Enhance Software Quality Management

The aim of the research is to explore the impact of cognitive biases and social networks in testing and developing software. The research will aim to address two critical areas: i) to predict defective parts of the software, ii) to determine the right person to test the defective parts of the software. Every phase in software development requires analytical problem solving skills. Moreover, using everyday life heuristics instead of laws of logic and mathematics may affect quality of the software product in an undesirable manner. The proposed research aims to understand how mind works in solving problems. People also work in teams in software development that their social interactions in solving a problem may affect the quality of the product. The proposed research also aims to model the social network structure of testers and developers to understand their impact on software quality and defect prediction performance

Fast, Scalable, and Interactive Software for Landau-de Gennes Numerical Modeling of Nematic Topological Defects

Numerical modeling of nematic liquid crystals using the tensorial Landau-de Gennes (LdG) theory provides detailed insights into the structure and energetics of the enormous variety of possible topological defect configurations that may arise when the liquid crystal is in contact with colloidal inclusions or structured boundaries. However, these methods can be computationally expensive, making it challenging to predict (meta)stable configurations involving several colloidal particles, and they are often restricted to system sizes well below the experimental scale. Here we present an open-source software package that exploits the embarrassingly parallel structure of the lattice discretization of the LdG approach. Our implementation, combining CUDA/C++ and OpenMPI, allows users to accelerate simulations using both CPU and GPU resources in either single- or multiple-core configurations. We make use of an efficient minimization algorithm, the Fast Inertial Relaxation Engine (FIRE) method, that is well-suited to large-scale parallelization, requiring little additional memory or computational cost while offering performance competitive with other commonly used methods. In multi-core operation we are able to scale simulations up to supra-micron length scales of experimental relevance, and in single-core operation the simulation package includes a user-friendly GUI environment for rapid prototyping of interfacial features and the multifarious defect states they can promote. To demonstrate this software package, we examine in detail the competition between curvilinear disclinations and point-like hedgehog defects as size scale, material properties, and geometric features are varied. We also study the effects of an interface patterned with an array of topological point-defects.Comment: 16 pages, 6 figures, 1 youtube link. The full catastroph

Evidence-based defect assessment and prediction for software product lines

The systematic reuse provided by software product lines provides opportunities to achieve increased quality and reliability as a product line matures. This has led to a widely accepted assumption that as a product line evolves, its reliability improves. However, evidence in terms of empirical investigation of the relationship among change, reuse and reliability in evolving software product lines is lacking. To address the problem this work investigates: 1) whether reliability as measured by post-deployment failures improves as the products and components in a software product line change over time, and 2) whether the stabilizing effect of shared artifacts enables accurate prediction of failure-prone files in the product line. The first part of this work performs defect assessment and investigates defect trends in Eclipse, an open-source software product line. It analyzes the evolution of the product line over time in terms of the total number of defects, the percentage of severe defects and the relationship between defects and changes. The second part of this work explores prediction of failure-prone files in the Eclipse product line to determine whether prediction improves as the product line evolves over time. In addition, this part investigates the effect of defect and data collection periods on the prediction performance. The main contributions of this work include findings that the majority of files with severe defects are reused files rather than new files, but that common components experience less change than variation components. The work also found that there is a consistent set of metrics which serve as prominent predictors across multiple products and reuse categories over time. Classification of post-release, failure-prone files using change data for the Eclipse product line gives better recall and false positive rates as compared to classification using static code metrics. The work also found that on-going change in product lines hinders the ability to predict failure-prone files, and that predicting post-release defects using pre-release change data for the Eclipse case study is difficult. For example, using more data from the past to predict future failure-prone files does not necessarily give better results than using data only from the recent past. The empirical investigation of product line change and defect data leads to an improved understanding of the interplay among change, reuse and reliability as a product line evolves

Software defect prediction using maximal information coefficient and fast correlation-based filter feature selection

Software quality ensures that applications that are developed are failure free. Some modern systems are intricate, due to the complexity of their information processes. Software fault prediction is an important quality assurance activity, since it is a mechanism that correctly predicts the defect proneness of modules and classifies modules that saves resources, time and developers’ efforts. In this study, a model that selects relevant features that can be used in defect prediction was proposed. The literature was reviewed and it revealed that process metrics are better predictors of defects in version systems and are based on historic source code over time. These metrics are extracted from the source-code module and include, for example, the number of additions and deletions from the source code, the number of distinct committers and the number of modified lines. In this research, defect prediction was conducted using open source software (OSS) of software product line(s) (SPL), hence process metrics were chosen. Data sets that are used in defect prediction may contain non-significant and redundant attributes that may affect the accuracy of machine-learning algorithms. In order to improve the prediction accuracy of classification models, features that are significant in the defect prediction process are utilised. In machine learning, feature selection techniques are applied in the identification of the relevant data. Feature selection is a pre-processing step that helps to reduce the dimensionality of data in machine learning. Feature selection techniques include information theoretic methods that are based on the entropy concept. This study experimented the efficiency of the feature selection techniques. It was realised that software defect prediction using significant attributes improves the prediction accuracy. A novel MICFastCR model, which is based on the Maximal Information Coefficient (MIC) was developed to select significant attributes and Fast Correlation Based Filter (FCBF) to eliminate redundant attributes. Machine learning algorithms were then run to predict software defects. The MICFastCR achieved the highest prediction accuracy as reported by various performance measures.School of ComputingPh. D. (Computer Science