IEEE Standard 1500 Compliance Verification for Embedded Cores

Core-based design and reuse are the two key elements for an efficient system-on-chip (SoC) development. Unfortunately, they also introduce new challenges in SoC testing, such as core test reuse and the need of a common test infrastructure working with cores originating from different vendors. The IEEE 1500 Standard for Embedded Core Testing addresses these issues by proposing a flexible hardware test wrapper architecture for embedded cores, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Several intellectual property providers have already announced IEEE Standard 1500 compliance in both existing and future design blocks. In this paper, we address the problem of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE Standard 1500. This step is mandatory to fully trust the wrapper functionalities in applying the test sequences to the core. We present a systematic methodology to build a verification framework for IEEE Standard 1500 compliant cores, allowing core providers and/or integrators to verify the compliance of their products (sold or purchased) to the standar

Automating the IEEE std. 1500 compliance verification for embedded cores

The IEEE 1500 standard for embedded core testing proposes a very effective solution for testing modern system-on-chip (SoC). It proposes a flexible hardware test wrapper architecture, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Already several IP providers have announced compliance in both existing and future design blocks. In this paper we address the challenge of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE std. 1500. This is a mandatory step to fully trust the wrapper functionalities in applying the test sequences to the core. The proposed solution aims at implementing a verification framework allowing core providers and/or integrators to automatically verify the compliancy of their products (sold or purchased) to the standar

Comprehensive Evaluation of OpenCL-based Convolutional Neural Network Accelerators in Xilinx and Altera FPGAs

Deep learning has significantly advanced the state of the art in artificial intelligence, gaining wide popularity from both industry and academia. Special interest is around Convolutional Neural Networks (CNN), which take inspiration from the hierarchical structure of the visual cortex, to form deep layers of convolutional operations, along with fully connected classifiers. Hardware implementations of these deep CNN architectures are challenged with memory bottlenecks that require many convolution and fully-connected layers demanding large amount of communication for parallel computation. Multi-core CPU based solutions have demonstrated their inadequacy for this problem due to the memory wall and low parallelism. Many-core GPU architectures show superior performance but they consume high power and also have memory constraints due to inconsistencies between cache and main memory. FPGA design solutions are also actively being explored, which allow implementing the memory hierarchy using embedded BlockRAM. This boosts the parallel use of shared memory elements between multiple processing units, avoiding data replicability and inconsistencies. This makes FPGAs potentially powerful solutions for real-time classification of CNNs. Both Altera and Xilinx have adopted OpenCL co-design framework from GPU for FPGA designs as a pseudo-automatic development solution. In this paper, a comprehensive evaluation and comparison of Altera and Xilinx OpenCL frameworks for a 5-layer deep CNN is presented. Hardware resources, temporal performance and the OpenCL architecture for CNNs are discussed. Xilinx demonstrates faster synthesis, better FPGA resource utilization and more compact boards. Altera provides multi-platforms tools, mature design community and better execution times

The Chameleon Architecture for Streaming DSP Applications

We focus on architectures for streaming DSP applications such as wireless baseband processing and image processing. We aim at a single generic architecture that is capable of dealing with different DSP applications. This architecture has to be energy efficient and fault tolerant. We introduce a heterogeneous tiled architecture and present the details of a domain-specific reconfigurable tile processor called Montium. This reconfigurable processor has a small footprint (1.8 mm$^2$ in a 130 nm process), is power efficient and exploits the locality of reference principle. Reconfiguring the device is very fast, for example, loading the coefficients for a 200 tap FIR filter is done within 80 clock cycles. The tiles on the tiled architecture are connected to a Network-on-Chip (NoC) via a network interface (NI). Two NoCs have been developed: a packet-switched and a circuit-switched version. Both provide two types of services: guaranteed throughput (GT) and best effort (BE). For both NoCs estimates of power consumption are presented. The NI synchronizes data transfers, configures and starts/stops the tile processor. For dynamically mapping applications onto the tiled architecture, we introduce a run-time mapping tool

Monolithic integration of erbium-doped amplifiers with silicon-on-insulator waveguides

Monolithic integration of Al2O3:Er3+ amplifier technology with passive silicon-on-insulator waveguides is demonstrated. A signal enhancement of >7 dB at 1533 nm wavelength is obtained. The straightforward wafer-scale fabrication process, which includes reactive co-sputtering and subsequent reactive ion etching, allows for parallel integration of multiple amplifier and laser sections with silicon or other photonic circuits on a chip

SoC Test: Trends and Recent Standards

The well-known approaching test cost crisis, where semiconductor test costs begin to approach or exceed manufacturing costs has led test engineers to apply new solutions to the problem of testing System-On-Chip (SoC) designs containing multiple IP (Intellectual Property) cores. While it is not yet possible to apply generic test architectures to an IP core within a SoC, the emergence of a number of similar approaches, and the release of new industry standards, such as IEEE 1500 and IEEE 1450.6, may begin to change this situation. This paper looks at these standards and at some techniques currently used by SoC test engineers. An extensive reference list is included, reflecting the purpose of this publication as a review paper