E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Real-Time Lossless Compression of SoC Trace Data

Nowadays, with the increasing complexity of System-on-Chip (SoC), traditional debugging approaches are not enough in multi-core architecture systems. Hardware tracing becomes necessary for performance analysis in these systems. The problem is that the size of collected trace data through hardware-based tracing techniques is usually extremely large due to the increasing complexity of System-on-Chips. Hence on-chip trace compression performed in hardware is needed to reduce the amount of transferred or stored data. In this dissertation, the feasibility of different types of lossless data compression algorithms in hardware implementation are investigated and examined. A lossless data compression algorithm LZ77 is selected, analyzed, and optimized to Nexus traces data. In order to meet the hardware cost and compression performances requirements for the real-time compression, an optimized LZ77 compression algorithm is proposed based on the characteristics of Nexus trace data. This thesis presents a hardware implementation of LZ77 encoder described in Very High Speed Integrated Circuit Hardware Description Language (VHDL). Test results demonstrate that the compression speed can achieve16 bits/clock cycle and the average compression ratio is 1.35 for the minimal hardware cost case, which is a suitable trade-off between the hardware cost and the compression performances effectively

On using lossless compression of debug data in embedded logic analysis

The capacity of on-chip trace buffers employed for embedded logic analysis limits the observation window of a debug ex-periment. To increase the debug observation window, we pro-pose a novel architecture for embedded logic analysis based on lossless compression. The proposed architecture is particu-larly useful for in-field debugging of custom circuits that have sources of nondeterministic behavior such as asynchronous interfaces. In order to measure the tradeoff between the area overhead and the increase in the observation window, we also introduce a new compression ratio metric. We use this metric to quantify the performance gain of three lossless compression algorithms suitable for embedded logic analysis.

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present