On-Line Dependability Enhancement of Multiprocessor SoCs by Resource Management

This paper describes a new approach towards dependable design of homogeneous multi-processor SoCs in an example satellite-navigation application. First, the NoC dependability is functionally verified via embedded software. Then the Xentium processor tiles are periodically verified via on-line self-testing techniques, by using a new IIP Dependability Manager. Based on the Dependability Manager results, faulty tiles are electronically excluded and replaced by fault-free spare tiles via on-line resource management. This integrated approach enables fast electronic fault detection/diagnosis and repair, and hence a high system availability. The dependability application runs in parallel with the actual application, resulting in a very dependable system. All parts have been verified by simulation

A study of the selection of microcomputer architectures to automate planetary spacecraft power systems

Performance and reliability models of alternate microcomputer architectures as a methodology for optimizing system design were examined. A methodology for selecting an optimum microcomputer architecture for autonomous operation of planetary spacecraft power systems was developed. Various microcomputer system architectures are analyzed to determine their application to spacecraft power systems. It is suggested that no standardization formula or common set of guidelines exists which provides an optimum configuration for a given set of specifications

Fault Diagnosis of Hybrid Computing Systems Using Chaotic-Map Method

Computing systems are becoming increasingly complex with nodes consisting of a combination of multi-core central processing units (CPUs), many integrated core (MIC) and graphics processing unit (GPU) accelerators. These computing units and their interconnections are subject to different classes of hardware and software faults, which should be detected to support mitigation measures. We present the chaotic-map method that uses the exponential divergence and wide Fourier properties of the trajectories, combined with memory allocations and assignments to diagnose component-level faults in these hybrid computing systems. We propose lightweight codes that utilize highly parallel chaotic-map computations tailored to isolate faults in arithmetic units, memory elements and interconnects. The diagnosis module on a node utilizes pthreads to place chaotic-map threads on CPU and MIC cores, and CUDA C and OpenCL kernels on GPU blocks. We present experimental diagnosis results on five multi-core CPUs; one MIC; and, seven GPUs with typical diagnosis run-times under a minute

Multi-core devices for safety-critical systems: a survey

Multi-core devices are envisioned to support the development of next-generation safety-critical systems, enabling the on-chip integration of functions of different criticality. This integration provides multiple system-level potential benefits such as cost, size, power, and weight reduction. However, safety certification becomes a challenge and several fundamental safety technical requirements must be addressed, such as temporal and spatial independence, reliability, and diagnostic coverage. This survey provides a categorization and overview at different device abstraction levels (nanoscale, component, and device) of selected key research contributions that support the compliance with these fundamental safety requirements.This work has been partially supported by the Spanish Ministry of Economy and Competitiveness under grant TIN2015-65316-P, Basque Government under grant KK-2019-00035 and the HiPEAC Network of Excellence. The Spanish Ministry of Economy and Competitiveness has also partially supported Jaume Abella under Ramon y Cajal postdoctoral fellowship (RYC-2013-14717).Peer ReviewedPostprint (author's final draft

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Chip level simulation of fault tolerant computers

Chip level modeling techniques, functional fault simulation, simulation software development, a more efficient, high level version of GSP, and a parallel architecture for functional simulation are discussed

Towards standardisation of no fault found taxonomy

There is a phenomenon which exists in complex engineered systems, most notably those which are electrical or electronic which is the inability to diagnose faults reported during operation. This includes difficulties in detecting the same reported symptoms with standard testing, the inability to correctly localise the suspected fault and the failure to diagnose the problem which has resulted in maintenance work. However an inconsistent terminology is used in connection with this phenomenon within both scientific communities and industry. It has become evident that ambiguity, misuse and misunderstanding have directly compounded the issue. The purpose of this paper is to work towards standardisation of the taxonomy surrounding the phenomena popularly termed No Fault Found, Retest Okay, Cannot Duplicate or Fault Not Found amongst many others. This includes discussion on how consistent terminology is essential to the experts within organisation committees and, to the larger group of users, who do not have specialised knowledge of the field

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

Reliable and Fault-Resilient Schemes for Efficient Radix-4 Complex Division

Complex division is commonly used in various applications in signal processing and control theory including astronomy and nonlinear RF measurements. Nevertheless, unless reliability and assurance are embedded into the architectures of such structures, the suboptimal (and thus erroneous) results could undermine the objectives of such applications. As such, in this thesis, we present schemes to provide complex number division architectures based on (Sweeney, Robertson, and Tocher) SRT-division with fault diagnosis mechanisms. Different fault resilient architectures are proposed in this thesis which can be tailored based on the eventual objectives of the designs in terms of area and time requirements, among which we pinpoint carefully the schemes based on recomputing with shifted operands (RESO) to be able to detect both natural and malicious faults and with proper modification achieve high throughputs. The design also implements a minimized look up table approach which favors in error detection based designs and provides high fault coverage with relatively-low overhead. Additionally, to benchmark the effectiveness of the proposed schemes, extensive fault diagnosis assessments are performed for the proposed designs through fault simulations and FPGA implementations; the design is implemented on Xilinx Spartan-VI and Xilinx Virtex-VI FPGA families