Impact of particles on the Planck HFI detectors: Ground-based measurements and physical interpretation

The Planck High Frequency Instrument (HFI) surveyed the sky continuously from August 2009 to January 2012. Its noise and sensitivity performance were excellent, but the rate of cosmic ray impacts on the HFI detectors was unexpectedly high. Furthermore, collisions of cosmic rays with the focal plane produced transient signals in the data (glitches) with a wide range of characteristics. A study of cosmic ray impacts on the HFI detector modules has been undertaken to categorize and characterize the glitches, to correct the HFI time-ordered data, and understand the residual effects on Planck maps and data products. This paper presents an evaluation of the physical origins of glitches observed by the HFI detectors. In order to better understand the glitches observed by HFI in flight, several ground-based experiments were conducted with flight-spare HFI bolometer modules. The experiments were conducted between 2010 and 2013 with HFI test bolometers in different configurations using varying particles and impact energies. The bolometer modules were exposed to 23 MeV protons from the Orsay IPN TANDEM accelerator, and to $^{241}$Am and $^{244}$Cm $\alpha$-particle and $^{55}$Fe radioactive X-ray sources. The calibration data from the HFI ground-based preflight tests were used to further characterize the glitches and compare glitch rates with statistical expectations under laboratory conditions. Test results provide strong evidence that the dominant family of glitches observed in flight are due to cosmic ray absorption by the silicon die substrate on which the HFI detectors reside. Glitch energy is propagated to the thermistor by ballistic phonons, while there is also a thermal diffusion contribution. The implications of these results for future satellite missions, especially those in the far-infrared to sub-millimetre and millimetre regions of the electromagnetic spectrum, are discussed.Comment: 11 pages, 13 figure

Direct Experimental Evidence of Metal-Mediated Etching of Suspended Graphene

Atomic resolution high angle annular dark field imaging of suspended, single-layer graphene, onto which the metals Cr, Ti, Pd, Ni, Al and Au atoms had been deposited was carried out in an aberration corrected scanning transmission electron microscope. In combination with electron energy loss spectroscopy, employed to identify individual impurity atoms, it was shown that nano-scale holes were etched into graphene, initiated at sites where single atoms of all the metal species except for gold come into close contact with the graphene. The e-beam scanning process is instrumental in promoting metal atoms from clusters formed during the original metal deposition process onto the clean graphene surface, where they initiate the hole-forming process. Our observations are discussed in the light of calculations in the literature, predicting a much lowered vacancy formation in graphene when metal ad-atoms are present. The requirement and importance of oxygen atoms in this process, although not predicted by such previous calculations, is also discussed, following our observations of hole formation in pristine graphene in the presence of Si-impurity atoms, supported by new calculations which predict a dramatic decrease of the vacancy formation energy, when SiOx molecules are present.Comment: final version accepted in ACS Nano + supplementary info. 22+6 pages, 4+5 figure

Novel Boron-10-based detectors for Neutron Scattering Science

Nowadays neutron scattering science is increasing its instrumental power. Most of the neutron sources in the world are pushing the development of their technologies to be more performing. The neutron scattering development is also pushed by the European Spallation Source (ESS) in Sweden, a neutron facility which has just started construction. Concerning small area detectors (1m^2), the 3He technology, which is today cutting edge, is reaching fundamental limits in its development. Counting rate capability, spatial resolution and cost-effectiveness, are only a few examples of the features that must be improved to fulfill the new requirements. On the other hand, 3He technology could still satisfy the detector requirements for large area applications (50m^2), however, because of the present 3He shortage that the world is experiencing, this is not practical anymore. The recent detector advances (the Multi-Grid and the Multi-Blade prototypes) developed in the framework of the collaboration between the Institut Laue-Langevin (ILL) and ESS are presented in this manuscript. In particular two novel 10B-based detectors are described; one for large area applications (the Multi-Grid prototype) and one for application in neutron refectometry (small area applications, the Multi-Blade prototype)

Transverse Beam Profiles

The performance and safe operation of a particle accelerator is closely connected to the transverse emittance of the beams it produces. For this reason many techniques have been developed over the years for monitoring the transverse distribution of particles along accelerator chains or over machine cycles. The definition of beam profiles is explained and the different techniques available for the detection of the particle distributions are explored. Examples of concrete applications of these techniques are given.Comment: 37 pages, 53 figure