Intrinsically Motivated Learning of Visual Motion Perception and Smooth Pursuit

We extend the framework of efficient coding, which has been used to model the development of sensory processing in isolation, to model the development of the perception/action cycle. Our extension combines sparse coding and reinforcement learning so that sensory processing and behavior co-develop to optimize a shared intrinsic motivational signal: the fidelity of the neural encoding of the sensory input under resource constraints. Applying this framework to a model system consisting of an active eye behaving in a time varying environment, we find that this generic principle leads to the simultaneous development of both smooth pursuit behavior and model neurons whose properties are similar to those of primary visual cortical neurons selective for different directions of visual motion. We suggest that this general principle may form the basis for a unified and integrated explanation of many perception/action loops.Comment: 6 pages, 5 figure

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter

Sparse Modeling for Image and Vision Processing

In recent years, a large amount of multi-disciplinary research has been conducted on sparse models and their applications. In statistics and machine learning, the sparsity principle is used to perform model selection---that is, automatically selecting a simple model among a large collection of them. In signal processing, sparse coding consists of representing data with linear combinations of a few dictionary elements. Subsequently, the corresponding tools have been widely adopted by several scientific communities such as neuroscience, bioinformatics, or computer vision. The goal of this monograph is to offer a self-contained view of sparse modeling for visual recognition and image processing. More specifically, we focus on applications where the dictionary is learned and adapted to data, yielding a compact representation that has been successful in various contexts.Comment: 205 pages, to appear in Foundations and Trends in Computer Graphics and Visio

Proceedings of the second "international Traveling Workshop on Interactions between Sparse models and Technology" (iTWIST'14)

The implicit objective of the biennial "international - Traveling Workshop on Interactions between Sparse models and Technology" (iTWIST) is to foster collaboration between international scientific teams by disseminating ideas through both specific oral/poster presentations and free discussions. For its second edition, the iTWIST workshop took place in the medieval and picturesque town of Namur in Belgium, from Wednesday August 27th till Friday August 29th, 2014. The workshop was conveniently located in "The Arsenal" building within walking distance of both hotels and town center. iTWIST'14 has gathered about 70 international participants and has featured 9 invited talks, 10 oral presentations, and 14 posters on the following themes, all related to the theory, application and generalization of the "sparsity paradigm": Sparsity-driven data sensing and processing; Union of low dimensional subspaces; Beyond linear and convex inverse problem; Matrix/manifold/graph sensing/processing; Blind inverse problems and dictionary learning; Sparsity and computational neuroscience; Information theory, geometry and randomness; Complexity/accuracy tradeoffs in numerical methods; Sparsity? What's next?; Sparse machine learning and inference.Comment: 69 pages, 24 extended abstracts, iTWIST'14 website: http://sites.google.com/site/itwist1

Jitter-Adaptive Dictionary Learning - Application to Multi-Trial Neuroelectric Signals

Dictionary Learning has proven to be a powerful tool for many image processing tasks, where atoms are typically defined on small image patches. As a drawback, the dictionary only encodes basic structures. In addition, this approach treats patches of different locations in one single set, which means a loss of information when features are well-aligned across signals. This is the case, for instance, in multi-trial magneto- or electroencephalography (M/EEG). Learning the dictionary on the entire signals could make use of the alignement and reveal higher-level features. In this case, however, small missalignements or phase variations of features would not be compensated for. In this paper, we propose an extension to the common dictionary learning framework to overcome these limitations by allowing atoms to adapt their position across signals. The method is validated on simulated and real neuroelectric data.Comment: 9 pages, 5 figures, minor correction