Process and device requirements for mixed-signal integrated circuits in broadband networking, Journal of Telecommunications and Information Technology, 2004, nr 1

The paper describes the present status of the broadband wireline infrastructure consisting of the backbone core, metro rings, access network, local and storage area networks. Examples of various mixed-signal integrated circuits are described. Based on these considerations required process and device performance is extrapolated

New Cdc Design Tool For Analog Layout Workflow

The placement and routing on CMOS analog layout design had always been a time consuming and irritating process due to large amount of transistor devices placements, arrangements and a lot of critical nets routing constraint. Manual efforts to complete analog layout design took few weeks to months’ time in previous project cycle according to the complexity of the circuit. In the meantime, designer needs to convert the devices from schematic into layout in canvas of layout editor, and then arrange the devices accordingly one by one or group by group by moving the devices in order to complete device placement. While for routing, even though there are different auto-routers in existing layout editing tool, but these routers are mostly developed for digital design and unable to route analog signals precisely especially when there are constraints for the routing like matching and shielding. This research presents a new automation solution, Cartoon Diagram Compiler (CDC) tool that enabling a significant productivity improvement on analog layout design. The automation tool provides capability to drag-and-drop the transistor devices/instance cells from schematics canvas to floor planning canvas and is able to auto-place non-critical cells and devices in a virtual mode before converting into real layout. After the floorplan/placement fulfill the design requirement, topologies generator can be used for quick preview of routing option and auto-router support for constrained (shield critical net) and un-constrained nets routing. The area and routing quality nearly matched with hand-drawn layout. The CDC tool has been compare and evaluated on Intel in-house analog layout design projects. In research evaluation, the average time to complete manual device placement and layout routing required 640 minutes and 554 minutes respectively. With device placement and layout routing process only required 139 minutes and 112 minutes or significant reduction in period of about 5.14x and 6.31x respectively. In conclusion, CDC tool increases the productivity by allowing fully automatic derivation of placement and routing, incremental design updates and smart placement guaranteeing design rule free from violation

Analog design for manufacturability: lithography-aware analog layout retargeting

As transistor sizes shrink over time in the advanced nanometer technologies, lithography effects have become a dominant contributor of integrated circuit (IC) yield degradation. Random manufacturing variations, such as photolithographic defect or spot defect, may cause fatal functional failures, while systematic process variations, such as dose fluctuation and defocus, can result in wafer pattern distortions and in turn ruin circuit performance. This dissertation is focused on yield optimization at the circuit design stage or so-called design for manufacturability (DFM) with respect to analog ICs, which has not yet been sufficiently addressed by traditional DFM solutions. On top of a graph-based analog layout retargeting framework, in this dissertation the photolithographic defects and lithography process variations are alleviated by geometrical layout manipulation operations including wire widening, wire shifting, process variation band (PV-band) shifting, and optical proximity correction (OPC). The ultimate objective of this research is to develop efficient algorithms and methodologies in order to achieve lithography-robust analog IC layout design without circuit performance degradation

Journal of Telecommunications and Information Technology, 2004, nr 1

kwartalni

Investigation into voltage and process variation-aware manufacturing test

Increasing integration and complexity in IC design provides challenges for manufacturing testing. This thesis studies how process and supply voltage variation influence defect behaviour to determine the impact on manufacturing test cost and quality. The focus is on logic testing of static CMOS designs with respect to two important defect types in deep submicron CMOS: resistive bridges and full opens. The first part of the thesis addresses testing for resistive bridge defects in designs with multiple supply voltage settings. To enable analysis, a fault simulator is developed using a supply voltage-aware model for bridge defect behaviour. The analysis shows that for high defect coverage it is necessary to perform test for more than one supply voltage setting, due to supply voltage-dependent behaviour. A low-cost and effective test method is presented consisting of multi-voltage test generation that achieves high defect coverage and test set size reduction without compromise to defect coverage. Experiments on synthesised benchmarks with realistic bridge locations validate the proposed method.The second part focuses on the behaviour of full open defects under supply voltage variation. The aim is to determine the appropriate value of supply voltage to use when testing. Two models are considered for the behaviour of full open defects with and without gate tunnelling leakage influence. Analysis of the supply voltage-dependent behaviour of full open defects is performed to determine if it is required to test using more than one supply voltage to detect all full open defects. Experiments on synthesised benchmarks using an extended version of the fault simulator tool mentioned above, measure the quantitative impact of supply voltage variation on defect coverage.The final part studies the impact of process variation on the behaviour of bridge defects. Detailed analysis using synthesised ISCAS benchmarks and realistic bridge model shows that process variation leads to additional faults. If process variation is not considered in test generation, the test will fail to detect some of these faults, which leads to test escapes. A novel metric to quantify the impact of process variation on test quality is employed in the development of a new test generation tool, which achieves high bridge defect coverage. The method achieves a user-specified test quality with test sets which are smaller than test sets generated without consideration of process variation

Design for manufactureability with regular fabrics in digital integrated circuits

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.Includes bibliographical references (p. 113-115).Integrated circuit design is limited by manufacturability. As devices scale down, sensitivity to process variation increases dramatically, making design for manufacturability a critical concern. Designers must identify the designs that generate the least systematic process variation, e.g., from pattern dependent effects, but must also build circuits that are robust to the remaining process or environmental random variations. This research addresses both ideas, by examining integrated circuit design styles and aspects that can help curb process variation and improve manufacturability and performance in future technology generations. One suggested method to reduce variation sensitivity in system designs has been the concept of design regularity. Long used in FPGAs, and SRAMs, the concept of repeatable blocks is examined in this work as a method of reducing circuit variation. Layout based variation is examined in three designs with different distinctions of regularity: a Via-Patterned Gate Array (VPGA) FPU, a Berkeley BEE-generated decoder, and a low power FPGA. The circuit level impact on variation is also considered, by examining several circuit architectures. This includes analysis of the novel Limited Switch Dynamic Logic (LSDL) style, which reduces design area and encourages regularity through minimum logic sizing.(cont.) Robustness to spatial variation and slanted plane effects is examined with a common-centroid based layout methodology for digital integrated circuits. Finally, a methodology is introduced in the form of the Monte Carlo Variation Analysis Engine whereby distributed process variables are fed into repeated simulation runs, output metrics are recorded, and regressions are measured to expose design sensitivities. The results for different layout and circuit design styles identify improvements that may be made to improve robustness to variation. We show that design regularity is a significant factor in mitigating sensitivity to process variation and is worthy of further examination.by Mehdi Gazor.S.M

NASA SERC 1990 Symposium on VLSI Design

This document contains papers presented at the first annual NASA Symposium on VLSI Design. NASA's involvement in this event demonstrates a need for research and development in high performance computing. High performance computing addresses problems faced by the scientific and industrial communities. High performance computing is needed in: (1) real-time manipulation of large data sets; (2) advanced systems control of spacecraft; (3) digital data transmission, error correction, and image compression; and (4) expert system control of spacecraft. Clearly, a valuable technology in meeting these needs is Very Large Scale Integration (VLSI). This conference addresses the following issues in VLSI design: (1) system architectures; (2) electronics; (3) algorithms; and (4) CAD tools

High Performance Optical Transmitter Ffr Next Generation Supercomputing and Data Communication

High speed optical interconnects consuming low power at affordable prices are always a major area of research focus. For the backbone network infrastructure, the need for more bandwidth driven by streaming video and other data intensive applications such as cloud computing has been steadily pushing the link speed to the 40Gb/s and 100Gb/s domain. However, high power consumption, low link density and high cost seriously prevent traditional optical transceiver from being the next generation of optical link technology. For short reach communications, such as interconnects in supercomputers, the issues related to the existing electrical links become a major bottleneck for the next generation of High Performance Computing (HPC). Both applications are seeking for an innovative solution of optical links to tackle those current issues. In order to target the next generation of supercomputers and data communication, we propose to develop a high performance optical transmitter by utilizing CISCO Systems®\u27s proprietary CMOS photonic technology. The research seeks to achieve the following outcomes: 1. Reduction of power consumption due to optical interconnects to less than 5pJ/bit without the need for Ring Resonators or DWDM and less than 300fJ/bit for short distance data bus applications. 2. Enable the increase in performance (computing speed) from Peta-Flop to Exa-Flops without the proportional increase in cost or power consumption that would be prohibitive to next generation system architectures by means of increasing the maximum data transmission rate over a single fiber. 3. Explore advanced modulation schemes such as PAM-16 (Pulse-Amplitude-Modulation with 16 levels) to increase the spectrum efficiency while keeping the same or less power figure. This research will focus on the improvement of both the electrical IC and optical IC for the optical transmitter. An accurate circuit model of the optical device is created to speed up the performance optimization and enable co-simulation of electrical driver. Circuit architectures are chosen to minimize the power consumption without sacrificing the speed and noise immunity. As a result, a silicon photonic based optical transmitter employing 1V supply, featuring 20Gb/s data rate is fabricated. The system consists of an electrical driver in 40nm CMOS and an optical MZI modulator with an RF length of less than 0.5mm in 0.13&mu m SOI CMOS. Two modulation schemes are successfully demonstrated: On-Off Keying (OOK) and Pulse-Amplitude-Modulation-N (PAM-N N=4, 16). Both versions demonstrate signal integrity, interface density, and scalability that fit into the next generation data communication and exa-scale computing. Modulation power at 20Gb/s data rate for OOK and PAM-16 of 4pJ/bit and 0.25pJ/bit are achieved for the first time of an MZI type optical modulator, respectively