The PreAmplifier ShAper for the ALICE TPC-Detector

In this paper the PreAmplifier ShAper (PASA) for the Time Projection Chamber (TPC) of the ALICE experiment at LHC is presented. The ALICE TPC PASA is an ASIC that integrates 16 identical channels, each consisting of Charge Sensitive Amplifiers (CSA) followed by a Pole-Zero network, self-adaptive bias network, two second-order bridged-T filters, two non-inverting level shifters and a start-up circuit. The circuit is optimized for a detector capacitance of 18-25 pF. For an input capacitance of 25 pF, the PASA features a conversion gain of 12.74 mV/fC, a peaking time of 160 ns, a FWHM of 190 ns, a power consumption of 11.65 mW/ch and an equivalent noise charge of 244e + 17e/pF. The circuit recovers smoothly to the baseline in about 600 ns. An integral non-linearity of 0.19% with an output swing of about 2.1 V is also achieved. The total area of the chip is 18 mm$^2$ and is implemented in AMS's C35B3C1 0.35 micron CMOS technology. Detailed characterization test were performed on about 48000 PASA circuits before mounting them on the ALICE TPC front-end cards. After more than two years of operation of the ALICE TPC with p-p and Pb-Pb collisions, the PASA has demonstrated to fulfill all requirements

A Non-linearity Correction Method for Fast Digital Multi-Channel Analyzers

AbstractFast digital multi-channel analyzers (FDMCA) which based on flash ADCs have been intensively used recently. The FDMCA is different from traditional MCAs which based on Wilkinson ADCs. The non-linearity, including the integral non-linearity (INL) and differential non-linearity (DNL), mainly arising from flash ADCs, degrade the accuracy of fast digital MCAs. To improve the non-linearity of FDMCA, a practical off-line correction method has been proposed in this paper. The non-linearity features of the FDMCA system is obtained by a special measurement previously. In light of that the non-linearity of a system is inherent; the non-linearity can be eliminated by comparing the data between the general measurement and the special one

Hilbert Based Testing of ADC Differential Non-linearity Using Wavelet Transform Algorithms

In testing Mixed Signal Devices such as Analog to Digital and Digital to Analog Converters, some dynamic parameters, such as Differential Non-Linearity and Integral Non-linearity, are very critical to evaluating devises performance. However, such analysis has been notorious for complexity and massive compiling process. Therefore, this research will focus on testing dynamic parameters such as Differential Non-Linearity by simulating numerous numbers of bits Analog to Digital Converters and test the output signals base on new testing algorithms of Wavelet transform based on Hilbert process. Such a new testing algorithm should enhance the testing process by using less compiling data samples and prompt testing results. In addition, new testing results will be compared with the conventional testing process of Histogram algorithms for accuracy and enactment