Flexible Multi-layer Sparse Approximations of Matrices and Applications

The computational cost of many signal processing and machine learning techniques is often dominated by the cost of applying certain linear operators to high-dimensional vectors. This paper introduces an algorithm aimed at reducing the complexity of applying linear operators in high dimension by approximately factorizing the corresponding matrix into few sparse factors. The approach relies on recent advances in non-convex optimization. It is first explained and analyzed in details and then demonstrated experimentally on various problems including dictionary learning for image denoising, and the approximation of large matrices arising in inverse problems

Convolutional Deblurring for Natural Imaging

In this paper, we propose a novel design of image deblurring in the form of one-shot convolution filtering that can directly convolve with naturally blurred images for restoration. The problem of optical blurring is a common disadvantage to many imaging applications that suffer from optical imperfections. Despite numerous deconvolution methods that blindly estimate blurring in either inclusive or exclusive forms, they are practically challenging due to high computational cost and low image reconstruction quality. Both conditions of high accuracy and high speed are prerequisites for high-throughput imaging platforms in digital archiving. In such platforms, deblurring is required after image acquisition before being stored, previewed, or processed for high-level interpretation. Therefore, on-the-fly correction of such images is important to avoid possible time delays, mitigate computational expenses, and increase image perception quality. We bridge this gap by synthesizing a deconvolution kernel as a linear combination of Finite Impulse Response (FIR) even-derivative filters that can be directly convolved with blurry input images to boost the frequency fall-off of the Point Spread Function (PSF) associated with the optical blur. We employ a Gaussian low-pass filter to decouple the image denoising problem for image edge deblurring. Furthermore, we propose a blind approach to estimate the PSF statistics for two Gaussian and Laplacian models that are common in many imaging pipelines. Thorough experiments are designed to test and validate the efficiency of the proposed method using 2054 naturally blurred images across six imaging applications and seven state-of-the-art deconvolution methods.Comment: 15 pages, for publication in IEEE Transaction Image Processin

Dictionary Learning for Deblurring and Digital Zoom

This paper proposes a novel approach to image deblurring and digital zooming using sparse local models of image appearance. These models, where small image patches are represented as linear combinations of a few elements drawn from some large set (dictionary) of candidates, have proven well adapted to several image restoration tasks. A key to their success has been to learn dictionaries adapted to the reconstruction of small image patches. In contrast, recent works have proposed instead to learn dictionaries which are not only adapted to data reconstruction, but also tuned for a specific task. We introduce here such an approach to deblurring and digital zoom, using pairs of blurry/sharp (or low-/high-resolution) images for training, as well as an effective stochastic gradient algorithm for solving the corresponding optimization task. Although this learning problem is not convex, once the dictionaries have been learned, the sharp/high-resolution image can be recovered via convex optimization at test time. Experiments with synthetic and real data demonstrate the effectiveness of the proposed approach, leading to state-of-the-art performance for non-blind image deblurring and digital zoom

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter