A hierarchical test generation methodology for digital circuits

A new hierarchical modeling and test generation technique for digital circuits is presented. First, a high-level circuit model and a bus fault model are introduced—these generalize the classical gate-level circuit model and the single-stuck-line (SSL) fault model. Faults are represented by vectors allowing many faults to be implicitly tested in parallel. This is illustrated in detail for the special case of array circuits using a new high-level representation, called the modified pseudo-sequential model, which allows simultaneous test generation for faults on individual lines of a multiline bus. A test generation algorithm called VPODEM is then developed to generate tests for bus faults in high-level models of arbitrary combinational circuits. VPODEM reduces to standard PODEM if gate-level circuit and fault models are used. This method can be used to generate tests for general circuits in a hierarchical fashion, with both high- and low-level fault types, yielding 100 percent SSL fault coverage with significantly fewer test patterns and less test generation effort than conventional one-level approaches. Experimental results are presented for representative circuits to compare VPODEM to standard PODEM and to random test generation techniques, demonstrating the advantages of the proposed hierarchical approach.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43007/1/10836_2004_Article_BF00137388.pd

A simulation and diagnosis system incorporating various time delay models and functional elements

The application of digital simulation to all phases of digital network design is considered here as oppossed [sic] to development of simulation for one or two restricted parts of the digital process. For this reason a simulator is presented which can be consistent by varying the level of expression from the simulation of architectural structures to such detailed simulation requirements as race analysis of asynchronous sequential circuits. In order to make system simulation more than just an idea, it must be capable of handling large circuits in reasonable times. It is demonstrated that functional simulation has the potential to increase simulation speed while reducing the required storage. This potential is realized with the following features of this simulator structure: 1) a modular structure for specification and execution, 2) the capability of being easily interfaced with gate level simulation, 3) the capability of utilizing the highest level of expression for simulation, 4) a variable level of expression, 5) a relatively unrestricted type of logic that can be simulated, 6) the capabilities of using standard functional modules, 7) a fairly universal means of expressing functional modules and, 8) the use of data and control signals to further force selective trace capabilities on a module level. Greater gate level simulation capabilities are obtained by extending the basic simulator to perform the simulation of undefined signal values and the simulation of ambiguities in signal propagation speeds. The simulator presented here is part of a Test Generation and Simulation System. This system includes preprocessing, combinational test generation, automatic fault insertion as well as simulation --Abstract, page ii

Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs

Gate Delay Fault Test Generation for Non-Scan Circuits

This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation-backward justification technique: The test pattern generation is started at the fault location, and after successful ¿local¿ test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this pape

Parallelization of cycle-based logic simulation

Verification of digital circuits by Cycle-based simulation can be performed in parallel. The parallel implementation requires two phases: the compilation phase, that sets up the data needed for the execution of the simulation, and the simulation phase, that consists in executing the parallel simulation of the considered circuit for a certain number of cycles. During the early phase of design, compilation phase has to be repeated each time a bug is found. Thus, if the time of the compilation phase is too high, the advantages stemming from the parallel approach may be lost. In this work we propose an effective version of the compilation phase and compute the corresponding execution time. We also analyze the percentage of execution time required by the different steps of the compilation phase for a set of literature benchmarks. Further, we implemented the simulation phase exploiting the GPU architecture, and we computed the execution times for a set of benchmarks obtaining values comparable with literature ones. Finally, we implemented the sequential version of the Cycle-based simulation in such a way that the execution time is optimized. We used the sequential values to compute the speedup of the parallel version for the considered set of benchmarks

Optimising Simulation Data Structures for the Xeon Phi

In this paper, we propose a lock-free architecture to accelerate logic gate circuit simulation using SIMD multi-core machines. We evaluate its performance on different test circuits simulated on the Intel Xeon Phi and 2 other machines. Comparisons are presented of this software/hardware combination with reported performances of GPU and other multi-core simulation platforms. Comparisons are also given between the lock free architecture and a leading commercial simulator running on the same Intel hardware