949 research outputs found

    VLSI signal processing through bit-serial architectures and silicon compilation

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    A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs

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    Radiation sources exist in different kinds of environments where electronic devices often operate. Correct device operation is usually affected negatively by radiation. The radiation resultant effect manifests in several forms depending on the operating environment of the device like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). CMOS circuits and Floating gate MOS circuits suffer from an increase in the delay and the leakage current due to TID effect. This may damage the proper operation of the integrated circuit. Exhaustive testing is needed for devices operating in harsh conditions like space and military applications to ensure correct operations in the worst circumstances. The use of worst case test vectors (WCTVs) for testing is strongly recommended by MIL-STD-883, method 1019, which is the standard describing the procedure for testing electronic devices under radiation. However, the difficulty of generating these test vectors hinders their use in radiation testing. Testing digital circuits in the industry is usually done nowadays using design for testability (DFT) techniques as they are very mature and can be relied on. DFT techniques include, but not limited to, ad-hoc technique, built-in self test (BIST), muxed D scan, clocked scan and enhanced scan. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Despite all these recommendations for DFT, radiation testing has not benefited from this reliable technology yet. Also, with the big variation in the DFT techniques, choosing the right technique is the bottleneck to achieve the best results for TID testing. In this thesis, a comprehensive comparison between different DFT techniques for TID testing of flash-based FPGAs is made to help designers choose the best suitable DFT technique depending on their application. The comparison includes muxed D scan technique, clocked scan technique and enhanced scan technique. The comparison is done using ISCAS-89 benchmarks circuits. Points of comparisons include FPGA resources utilization, difficulty of designs bring-up, added delay by DFT logic and robust testable paths in each technique

    Testing of Asynchronous NULL Conventional Logic (NCL) Circuits

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    Due to the absence of a global clock and presence of more state holding elements that synchronize the control and data paths, conventional automatic test pattern generation (ATPG) algorithms would fail when applied to asynchronous circuits, leading to poor fault coverage. This paper focuses on design for test (DFT) techniques aimed at making asynchronous NCL designs testable using existing DFT CAD tools with reasonable gate overhead, by enhancing controllability of feedback nets and observability for fault sites that are flagged unobservable. The proposed approach performs scan and test points insertion on NCL designs using custom ATPG library. The approach has been automated, which is essential for large systems; and are fully compatible with industry standard tools

    Advanced Launch System Multi-Path Redundant Avionics Architecture Analysis and Characterization

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    The objective of the Multi-Path Redundant Avionics Suite (MPRAS) program is the development of a set of avionic architectural modules which will be applicable to the family of launch vehicles required to support the Advanced Launch System (ALS). To enable ALS cost/performance requirements to be met, the MPRAS must support autonomy, maintenance, and testability capabilities which exceed those present in conventional launch vehicles. The multi-path redundant or fault tolerance characteristics of the MPRAS are necessary to offset a reduction in avionics reliability due to the increased complexity needed to support these new cost reduction and performance capabilities and to meet avionics reliability requirements which will provide cost-effective reductions in overall ALS recurring costs. A complex, real-time distributed computing system is needed to meet the ALS avionics system requirements. General Dynamics, Boeing Aerospace, and C.S. Draper Laboratory have proposed system architectures as candidates for the ALS MPRAS. The purpose of this document is to report the results of independent performance and reliability characterization and assessment analyses of each proposed candidate architecture and qualitative assessments of testability, maintainability, and fault tolerance mechanisms. These independent analyses were conducted as part of the MPRAS Part 2 program and were carried under NASA Langley Research Contract NAS1-17964, Task Assignment 28

    Space Transportation Avionics Technology Symposium. Volume 1: Executive summary

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    The focus of the symposium was to examine existing and planned avionics technology processes and products and to recommend necessary changes for strengthening priorities and program emphases. Innovative changes in avionics technology development and design processes, identified during the symposium, are needed to support the increasingly complex, multi-vehicle, integrated, autonomous space-based systems. Key technology advances make such a major initiative viable at this time: digital processing capabilities, integrated on-board test/checkout methods, easily reconfigurable laboratories, and software design and production techniques

    Constraint-Based Automatic SBST Generation for RISC-V Processor Families

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    Software-Based Self-Tests (SBST) allow at-speed, native online-testing of processors by running software programs on the processor core, requiring no Design for Testability (DfT) infrastructure. The creation of such SBST programs often requires time-consuming manual labour that is expensive and requires in-depth knowledge of the processor’s architecture to target hard-to-test faults. In contrast, encoding the SBST generation task as a Bounded Model Checking (BMC) problem allows using sophisticated, state-of-the-art BMC solvers to automatically generate an SBST. Constraints for the BMC problem are encoded in a circuit called Validity Checker Module (VCM) and applied during SBST generation.In this paper, we focus on presenting a VCM architecture and a constraint set that allows building SBSTs that make minimal assumptions about the firmware, targeting hard-to-test faults in the ALU and register file of multiple scalar, in-order RISC-V processor families. The VCM architecture consists of a processor-specific mapping layer and a generic constraint set connected via a well-defined interface. The generic constraint set enforces the desired SBST behaviour, including controlling the processor’s pipeline state, memory accesses, and with that executed instructions, register state, and fault propagations. Using a generic constraint set allows for rapid SBST generation targeting new RISC-V processor families while keeping the generic constraints untouched. Lastly, we evaluate this approach on two RISC-V processor families, namely the DarkRISCV and a proprietary, industrial core showing the portability and strength of the approach, allowing for rapidly targeting new processors

    Design-for-delay-testability techniques for high-speed digital circuits

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    The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important
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