Hierarchical formal verification using a hybrid tool

We describe a hybrid formal hardware verification tool that links the HOL interactive proof system and the MDG automated hardware verification tool. It supports a hierarchical verification approach that mirrors the hierarchical structure of designs. We obtain the advantages of both verification paradigms. We illustrate its use by considering a component of a communications chip. Verification with the hybrid tool is significantly faster and more tractable than using either tool alone

The Design, modeling and simulation of switching fabrics: For an ATM network switch

The requirements of today\u27s telecommunication systems to support high bandwidth and added flexibility brought about the expansion of (Asynchronous Transfer Mode) ATM as a new method of high-speed data transmission. Various analytical and simulation methods may be used to estimate the performance of ATM switches. Analytical methods considerably limit the range of parameters to be evaluated due to extensive formulae used and time consuming iterations. They are not as effective for large networks because of excessive computations that do not scale linearly with network size. One the other hand, simulation-based methods allow determining a bigger range of performance parameters in a shorter amount of time even for large networks. A simulation model, however, is more elaborate in terms of implementation. Instead of using formulae to obtain results, it has to operate software or hardware modules requiring a certain amount of effort to create. In this work simulation is accomplished by utilizing the ATM library - an object oriented software tool, which uses software chips for building ATM switches. The distinguishing feature of this approach is cut-through routing realized on the bit level abstraction treating ATM protocol data units, called cells, as groups of 424 bits. The arrival events of cells to the system are not instantaneous contrary to commonly used methods of simulation that consider cells as instant messages. The simulation was run for basic multistage interconnection network types with varying source arrival rate and buffer sizes producing a set of graphs of cell delays, throughput, cell loss probability, and queue sizes. The techniques of rearranging and sorting were considered in the simulation. The results indicate that better performance is always achieved by bringing additional stages of elements to the switching system

NuMDG: A New Tool for Multiway Decision Graphs Construction

Multiway Decision Graphs (MDGs) are a canonical representation of a subset of many-sorted first-order logic. This subset generalizes the logic of equality with abstract types and uninterpreted function symbols. The distinction between abstract and concrete sorts mirrors the hardware distinction between data path and control. Here we consider ways to improve MDGs construction. Efficiency is achieved through the use of the Generalized-If-Then-Else (GITE) commonly operator in Binary Decision Diagram packages. Consequently, we review the main algorithms used for MDGs verification techniques. In particular, Relational Product and Pruning by Subsumption are algorithms defined uniformly through this single GITE operator which will lead to a more efficient implementation. Moreover, we provide their correctness proof. This work can be viewed as a way to accommodate the ROBBD algorithms to the realm of abstract sorts and uninterpreted functions. The new tool, called NuMDG, accepts an extended SMV language, supporting abstract data sorts. Finally, we present experimental results demonstrating the efficiency of the NuMDG tool and evaluating its performance using a set of benchmarks from the SMV package

Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems

RÉSUMÉ La croissance exponentielle du nombre de transistors par puce a apporté des progrès considérables aux performances et fonctionnalités des dispositifs semi-conducteurs avec une miniaturisation des dimensions physiques ainsi qu’une augmentation de vitesse. De nos jours, les appareils électroniques utilisés dans un large éventail d’applications telles que les systèmes de divertissement personnels, l’industrie automobile, les systèmes électroniques médicaux, et le secteur financier ont changé notre façon de vivre. Cependant, des études récentes ont démontré que le rétrécissement permanent de la taille des transistors qui s’approchent des dimensions nanométriques fait surgir des défis majeurs. La réduction de la fiabilité au sens large (c.-à-d., la capacité à fournir la fonction attendue) est l’un d’entre eux. Lorsqu’un système est conçu avec une technologie avancée, on s’attend à ce qu’ il connaît plus de défaillances dans sa durée de vie. De telles défaillances peuvent avoir des conséquences graves allant des pertes financières aux pertes humaines. Les erreurs douces induites par la radiation, qui sont apparues d’abord comme une source de panne plutôt exotique causant des anomalies dans les satellites, sont devenues l’un des problèmes les plus difficiles qui influencent la fiabilité des systèmes microélectroniques modernes, y compris les dispositifs terrestres. Dans le secteur médical par exemple, les erreurs douces ont été responsables de l’échec et du rappel de plusieurs stimulateurs cardiaques implantables. En fonction du transistor affecté lors de la fabrication, le passage d’une particule peut induire des perturbations isolées qui se manifestent comme un basculement du contenu d’une cellule de mémoire (c.-à-d., Single Event Upsets (SEU)) ou un changement temporaire de la sortie (sous forme de bruit) dans la logique combinatoire (c.-à-d., Single Event Transients (SETs)). Les SEU ont été largement étudiés au cours des trois dernières décennies, car ils étaient considérés comme la cause principale des erreurs douces. Néanmoins, des études expérimentales ont montré qu’avec plus de miniaturisation technologique, la contribution des SET au taux d’erreurs douces est remarquable et qu’elle peut même dépasser celui des SEU dans les systèmes à haute fréquence [1], [2]. Afin de minimiser l’impact des erreurs douces, l’effet des SET doit être modélisé, prédit et atténué. Toutefois, malgré les progrès considérables accomplis dans la vérification fonctionnelle des circuits numériques, il y a eu très peu de progrès en matiàre de vérification non-fonctionnelle (par exemple, l’analyse des erreurs douces). Ceci est dû au fait que la modélisation et l’analyse des propriétés non-fonctionnelles des SET pose un grand défi. Cela est lié à la nature aléatoire des défauts et à la difficulté de modéliser la variation de leurs caractéristiques lorsqu’ils se propagent.----------ABSTRACT The exponential growth in the number of transistors per chip brought tremendous progress in the performance and the functionality of semiconductor devices associated with reduced physical dimensions and higher speed. Electronic devices used in a wide range of applications such as personal entertainment systems, automotive industry, medical electronic systems, and financial sector changed the way we live nowadays. However, recent studies reveal that further downscaling of the transistor size at nano-scale technology leads to major challenges. Reliability (i.e., ability to provide intended functionality) is one of them, where a system designed in nano-scale nodes is expected to experience more failures in its lifetime than if it was designed using larger technology node size. Such failures can lead to serious conséquences ranging from financial losses to even loss of human life. Soft errors induced by radiation, which were initially considered as a rather exotic failure mechanism causing anomalies in satellites, have become one of the most challenging issues that impact the reliability of modern microelectronic systems, including devices at terrestrial altitudes. For instance, in the medical industry, soft errors have been responsible of the failure and recall of many implantable cardiac pacemakers. Depending on the affected transistor in the design, a particle strike can manifest as a bit flip in a state element (i.e., Single Event Upset (SEU)) or temporally change the output of a combinational gate (i.e., Single Event Transients (SETs)). Initially, SEUs have been widely studied over the last three decades as they were considered to be the main source of soft errors. However, recent experiments show that with further technology downscaling, the contribution of SETs to the overall soft error rate is remarkable and in high frequency systems, it might exceed that of SEUs [1], [2]. In order to minimize the impact of soft errors, the impact of SETs needs to be modeled, predicted, and mitigated. However, despite considerable progress towards developing efficient methodologies for the functional verification of digital designs, advances in non-functional verification (e.g., soft error analysis) have been lagging. This is due to the fact that the modeling and analysis of non-functional properties related to SETs is very challenging. This can be related to the random nature of these faults and the difficulty of modeling the variation in its characteristics while propagating. Moreover, many details about the design structure and the SETs characteristics may not be available at high abstraction levels. Thus, in high level analysis, many assumptions about the SETs behavior are usually made, which impacts the accuracy of the generated results. Consequently, the lowcost detection of soft errors due to SETs is very challenging and requires more sophisticated techniques

Verification of an ATM Switch Fabric using Multiway Decision Graphs

. We present our results on formally verifying the implementation of an ATM switch fabric. The verification is performed automatically at the Register-Transfer level using a new class of decision graphs called Multiway Decision Graphs (MDGs). We performed the verification of the RTL description against its gate-level implementation and also the checking of specific properties that characterize the behavior of the switch fabric. 1. Introduction and related work Simulation has traditionally been used for design validation. However, it is impractical to run an exhaustive simulation for complex systems. The use of formal verification for determining the correctness of digital systems is thus gaining interest, as the correctness of a formally verified design implicitly involves all cases of the input values. There exist only few references in the literature which address the formal verification of ATM related circuits. P. Curzon [3] formally verified the 4 by 4 fabric of the Fairisle swit..

Modeling and Automatic Formal Verification of the Fairisle ATM Switch Fabric Using MDGs

In this paper we present several techniques for modeling and formal verification of the Fairisle Asynchronous Transfer Mode (ATM) switch fabric using Multiway Decision Graphs (MDGs). MDGs represent a new class of decision graphs which subsumes ROBDDs while accommodating abstract sorts and uninterpreted function symbols. The ATM device we investigated is in use for real applications in the Cambridge University Fairisle network. We modeled and verified the switch fabric at three levels of abstraction: behavior, RT and gate levels. In a first stage, we validated the high-level specification by checking specific safety properties that reflect the behavior of the fabric in its real operating environment. Using the intermediate abstract RTL model, we hierarchically completed the verification of the original gate-level implementation of the switch fabric against the behavioral specification given as an abstract state machine (ASM). Since MDGs avoid model explosion induced by data values, this work demonstrates the effectiveness of MDG-based verification as an extension of ROBDD-based approaches. All the verifications were carried out fully automatically in a reasonable amount of CPU time

Sixth Goddard Conference on Mass Storage Systems and Technologies Held in Cooperation with the Fifteenth IEEE Symposium on Mass Storage Systems

This document contains copies of those technical papers received in time for publication prior to the Sixth Goddard Conference on Mass Storage Systems and Technologies which is being held in cooperation with the Fifteenth IEEE Symposium on Mass Storage Systems at the University of Maryland-University College Inn and Conference Center March 23-26, 1998. As one of an ongoing series, this Conference continues to provide a forum for discussion of issues relevant to the management of large volumes of data. The Conference encourages all interested organizations to discuss long term mass storage requirements and experiences in fielding solutions. Emphasis is on current and future practical solutions addressing issues in data management, storage systems and media, data acquisition, long term retention of data, and data distribution. This year's discussion topics include architecture, tape optimization, new technology, performance, standards, site reports, vendor solutions. Tutorials will be available on shared file systems, file system backups, data mining, and the dynamics of obsolescence