Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

Mathematical Estimation of Logical Masking Capability of Majority/Minority Gates Used in Nanoelectronic Circuits

In nanoelectronic circuit synthesis, the majority gate and the inverter form the basic combinational logic primitives. This paper deduces the mathematical formulae to estimate the logical masking capability of majority gates, which are used extensively in nanoelectronic digital circuit synthesis. The mathematical formulae derived to evaluate the logical masking capability of majority gates holds well for minority gates, and a comparison with the logical masking capability of conventional gates such as NOT, AND/NAND, OR/NOR, and XOR/XNOR is provided. It is inferred from this research work that the logical masking capability of majority/minority gates is similar to that of XOR/XNOR gates, and with an increase of fan-in the logical masking capability of majority/minority gates also increases

Study of fault-tolerant software technology

Presented is an overview of the current state of the art of fault-tolerant software and an analysis of quantitative techniques and models developed to assess its impact. It examines research efforts as well as experience gained from commercial application of these techniques. The paper also addresses the computer architecture and design implications on hardware, operating systems and programming languages (including Ada) of using fault-tolerant software in real-time aerospace applications. It concludes that fault-tolerant software has progressed beyond the pure research state. The paper also finds that, although not perfectly matched, newer architectural and language capabilities provide many of the notations and functions needed to effectively and efficiently implement software fault-tolerance

Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Quantifying Masking Fault-Tolerance via Fair Stochastic Games

We introduce a formal notion of masking fault-tolerance between probabilistic transition systems using stochastic games. These games are inspired in bisimulation games, but they also take into account the possible faulty behavior of systems. When no faults are present, these games boil down to probabilistic bisimulation games. Since these games could be infinite, we propose a symbolic way of representing them so that they can be solved in polynomial time. In particular, we use this notion of masking to quantify the level of masking fault-tolerance exhibited by almost-sure failing systems, i.e., those systems that eventually fail with probability 1. The level of masking fault-tolerance of almost-sure failing systems can be calculated by solving a collection of functional equations. We produce this metric in a setting in which one of the player behaves in a strong fair way (mimicking the idea of fair environments).Comment: In Proceedings EXPRESS/SOS2023, arXiv:2309.05788. arXiv admin note: substantial text overlap with arXiv:2207.0204