LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

Testing a Quantum Computer

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.Comment: 15 pages, 17 equations, 27 tables, 8 figure

Canonical multi-valued input Reed-Muller trees and forms

There is recently an increased interest in logic synthesis using EXOR gates. The paper introduces the fundamental concept of Orthogonal Expansion, which generalizes the ring form of the Shannon expansion to the logic with multiple-valued (mv) inputs. Based on this concept we are able to define a family of canonical tree circuits. Such circuits can be considered for binary and multiple-valued input cases. They can be multi-level (trees and DAG's) or flattened to two-level AND-EXOR circuits. Input decoders similar to those used in Sum of Products (SOP) PLA's are used in realizations of multiple-valued input functions. In the case of the binary logic the family of flattened AND-EXOR circuits includes several forms discussed by Davio and Green. For the case of the logic with multiple-valued inputs, the family of the flattened mv AND-EXOR circuits includes three expansions known from literature and two new expansions

Technology Mapping, Design for Testability, and Circuit Optimizations for NULL Convention Logic Based Architectures

Delay-insensitive asynchronous circuits have been the target of a renewed research effort because of the advantages they offer over traditional synchronous circuits. Minimal timing analysis, inherent robustness against power-supply, temperature, and process variations, reduced energy consumption, less noise and EMI emission, and easy design reuse are some of the benefits of these circuits. NULL Convention Logic (NCL) is one of the mainstream asynchronous logic design paradigms that has been shown to be a promising method for designing delay-insensitive asynchronous circuits. This dissertation investigates new areas in NCL design and test and is made of three sections. The first section discusses different CMOS implementations of NCL gates and proposes new circuit techniques to enhance their operation. The second section focuses on mapping multi-rail logic expressions to a standard NCL gate library, which is a form of technology mapping for a category of NCL design automation flows. Finally, the last section proposes design for testability techniques for a recently developed low-power variant of NCL called Sleep Convention Logic (SCL)

Testing a Quantum Computer

We address the problem of quantum test set generation using measurement from a single basis and the single fault model. Experimental physicists currently test quantum circuits exhaustively, meaning that each n-bit permutative circuit requires ζ x 2n tests to assure functionality, and for an m stage permutative circuit proven not to function properly the current method requires ζ x 2n x m tests as the upper bound for fault localization, where zeta varies with physical implementation. Indeed, the exhaustive methods complexity grows exponentially with the number of qubits, proportionally to the number of stages in a quantum circuit and directly with zeta. This testability bound grows still exponentially with the attempted verification of quantum effects, such as the emission of a quantum source. The exhaustive method will soon not be feasible for practical application provided the number of qubits increases even a small number from the current state of the art. An algorithm is presented making fault detection feasible both now and in the foreseeable future for quantum circuits. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. The quantum fault table is introduced, and the test generation method explained, we show that all faults can be detected that impact calculations from the computational basis. It is believed that this fundamental research will lead to the simplification of testing for commercial quantum computers

Custom Integrated Circuits

Contains reports on twelve research projects.Analog Devices, Inc.International Business Machines, Inc.Joint Services Electronics Program (Contract DAAL03-86-K-0002)Joint Services Electronics Program (Contract DAAL03-89-C-0001)U.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)Rockwell International CorporationOKI Semiconductor, Inc.U.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)Charles Stark Draper LaboratoryNational Science Foundation (Grant MIP 84-07285)National Science Foundation (Grant MIP 87-14969)Battelle LaboratoriesNational Science Foundation (Grant MIP 88-14612)DuPont CorporationDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation (Grant MIP-88-58764

ATPG for Reversible Circuits using Technology-Related Fault Models

We address the problem of test set generation and test set reduction, to first detect, and later localize faults occurring in reversible circuits. Reversible Computation has high promise of low power consumption. Some new fault models are first presented here. An explanation of the new fault models is made based on a physical realization representing the state of the art in the reversible CMOS circuit technology. Evidence is then presented showing that the fault models presented in the current literature are not adequate for existing realizations of reversible logic such as CMOS. We designed a ATPG software package with a friendly graphical user interface to aid experimentation with various fault models. The purpose of this work is to give an overview of our findings and pave the way for a later paper fully addressing the CMOS fault models. The key experimental results are presented

Synthesis, testing and tolerance in reversible logic

In recent years, reversible computing has established itself as a promising research area and emerging technology. This thesis focuses on three important areas of reversible logic, which is an area of reversible computing. Firstly, this thesis proposes a transformation based synthesis approach for realizing conservative reversible functions using SWAP and Fredkin gates. This thesis also proposes ten templates for optimizing SWAP and Fredkin gates-based reversible circuits. Secondly, this thesis proposes an approach for the design of online testable reversible circuits. A reversible circuit composed of NOT, CNOT and Toffoli gates can be made online testable by adding two sets of CNOT gates and a single parity line. Finally, we have proposed an approach to achieve fault tolerance in reversible circuits. A design of a 3-bit reversible majority voter circuit is presented. This voter circuit can be used to design fault tolerant reversible circuits

AN EXTENDED GREEN-SASAO HIERARCHY OF CANONICAL TERNARY GALOIS FORMS AND UNIVERSAL LOGIC MODULES

A new extended Green-Sasao hierarchy of families and forms with a new sub-family for many-valued Reed-Muller logic is introduced. Recently, two families of binary canonical Reed-Muller forms, called Inclusive Forms (IFs) and Generalized Inclusive Forms (GIFs) have been proposed, where the second family was the first to include all minimum Exclusive Sum-Of-Products (ESOPs). In this paper, we propose, analogously to the binary case, two general families of canonical ternary Reed-Muller forms, called Ternary Inclusive Forms (TIFs) and their generalization of Ternary Generalized Inclusive Forms (TGIFs), where the second family includes minimum Galois Field Sum-Of-Products (GFSOPs) over ternary Galois field GF(3). One of the basic motivations in this work is the application of these TIFs and TGIFs to find the minimum GFSOP for many-valued input-output functions within logic synthesis, where a GFSOP minimizer based on IF polarity can be used to minimize the many-valued GFSOP expression for any given function. The realization of the presented S/D trees using Universal Logic Modules (ULMs) is also introduced, whereULMs are complete systems that can implement all possible logic functions utilizing the corresponding S/D expansions of many-valuedShannon and Davio spectral transforms.   

34th Midwest Symposium on Circuits and Systems-Final Program

Organized by the Naval Postgraduate School Monterey California. Cosponsored by the IEEE Circuits and Systems Society. Symposium Organizing Committee: General Chairman-Sherif Michael, Technical Program-Roberto Cristi, Publications-Michael Soderstrand, Special Sessions- Charles W. Therrien, Publicity: Jeffrey Burl, Finance: Ralph Hippenstiel, and Local Arrangements: Barbara Cristi