Low cost attitude control system scanwheel development

In order to satisfy a growing demand for low cost attitude control systems for small spacecraft, development of low cost scanning horizon sensor coupled to a low cost/low power consumption Reaction Wheel Assembly was initiated. This report addresses the details of the versatile design resulting from this effort. Tradeoff analyses for each of the major components are included, as well as test data from an engineering prototype of the hardware

A 94/183 GHz aircraft radiometer system for Project Storm Fury

A radiometer design suitable for use in NASA's WB-57F aircraft to collect data from severe storm regions was developed. The design recommended was a 94/183 GHz scanning radiometer with 3 IF channels on either side of the 183.3 GHz water vapor line and a single IF channel for a low loss atmospheric window channel at 94 GHz. The development and construction of the 94/183 GHz scanning radiometer known as the Advanced Microwave Moisture Sounder (AMMS) is presented. The radiometer scans the scene below the aircraft over an angle of + or - 45 degrees with the beamwidth of the scene viewed of approximately 2 degrees at 94 GHz and 1 degree at 183 GHz. The AMMS data collection system consists of a microcomputer used to store the radiometer data on the flight cartridge recorder, operate the stepper motor driven scanner, and collect housekeeping data such as thermistor temperature readings and aircraft time code

An IEEE 1149.x Embedded Test Coprocessor

This paper describes a microprogrammed architecture for an embedded coprocessor that is ableto control IEEE 1149.1 to IEEE 1149.7 test infrastructures, and explains how to expand the supportedtest command set. The coprocessor uses a fast simplex link (FSL) channel to interface a32-bit MicroBlaze CPU, but it can work with any microprocessor core that accepts this simpleFIFO-based interface method. The implementation cost (logic resource usage for a Xilinx Spartan6FPGA) and the performance data (operating frequency) are presented for a test command setcomprising two parts: 1) the full IEEE 1149.1 structural test operations; 2) a subset of IEEE 1149.7operations selected to illustrate the implementation of advanced scan formats

Breadboard linear array scan imager using LSI solid-state technology

The performance of large scale integration photodiode arrays in a linear array scan (pushbroom) breadboard was evaluated for application to multispectral remote sensing of the earth's resources. The technical approach, implementation, and test results of the program are described. Several self scanned linear array visible photodetector focal plane arrays were fabricated and evaluated in an optical bench configuration. A 1728-detector array operating in four bands (0.5 - 1.1 micrometer) was evaluated for noise, spectral response, dynamic range, crosstalk, MTF, noise equivalent irradiance, linearity, and image quality. Other results include image artifact data, temporal characteristics, radiometric accuracy, calibration experience, chip alignment, and array fabrication experience. Special studies and experimentation were included in long array fabrication and real-time image processing for low-cost ground stations, including the use of computer image processing. High quality images were produced and all objectives of the program were attained

Discrete input equipment design study

The study to improve the reliability of the LUT system by discrete input equipment (DIE) is reported. Subjects discussed include: specifications, packaging, aircraft integrated systems, and word formats DIE. It is recommended that maximal use of advanced technology be made, particularly the "know how' developed on the Saturn project

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Extreme ultraviolet and X-ray spectroheliograph for OSO-H

A complex scientific instrument was designed, fabricated, tested, and calibrated for launch onboard OSO-H. This instrument consisted of four spectroheliographs and an X-ray polarimeter. The instrument is designed to study solar radiation at selected wavelengths in the X-ray and the extreme ultraviolet ranges, make observations at the H-alpha wavelength, and measure the degree of polarization of X-ray emissions

Research in the development effort of an improved multiplier phototube final report

Single electron counting characteristics of multiplier phototubes - Pulse height distribution of windowless multiplie