Energy Recovery Clocked Dynamic Logic

Abstrac

Design of Adiabatic MTJ-CMOS Hybrid Circuits

Low-power designs are a necessity with the increasing demand of portable devices which are battery operated. In many of such devices the operational speed is not as important as battery life. Logic-in-memory structures using nano-devices and adiabatic designs are two methods to reduce the static and dynamic power consumption respectively. Magnetic tunnel junction (MTJ) is an emerging technology which has many advantages when used in logic-in-memory structures in conjunction with CMOS. In this paper, we introduce a novel adiabatic hybrid MTJ/CMOS structure which is used to design AND/NAND, XOR/XNOR and 1-bit full adder circuits. We simulate the designs using HSPICE with 32nm CMOS technology and compared it with a non-adiabatic hybrid MTJ/CMOS circuits. The proposed adiabatic MTJ/CMOS full adder design has more than 7 times lower power consumtion compared to the previous MTJ/CMOS full adder

Students’ acceptance towards kahoot application in mastering culinary terminology

Kahoot! is a game-based learning platform used to review students’ knowledge, for formative assessment and provides an opportunity not only to assess students' conceptual understanding but also to build new knowledge through further clarification during or after the game. The objective of this study is to assess the acceptability of culinary students in the use of Kahoot! application for mastery the culinary terminology. This study aimed to identify students' acceptance of learning applications, to identify students' acceptance of Kahoot! use in terms of memory as well as students' level of mastering Kahoot! in the learning process. This study is a descriptive study that used a five-point Likert scale questionnaire as an instrument. A total of 48 second year students from the Catering program were used as the study sample. The collected data were analyzed using Statistical Package for Social Science Version 23.0 for Windows (SPSS). The results show that the aspect of students' level of mastering the culinary terminology using Kahoot! application is high with a mean score of 4.55. Whereas the students’ acceptance of Kahoot! as a learning application, was also high with a mean score of 4.44. Finally, the students’ acceptance of the culinary terminology tested using Kahoot! is high with a mean score of 4.45

Empowering a helper cluster through data-width aware instruction selection policies

Narrow values that can be represented by less number of bits than the full machine width occur very frequently in programs. On the other hand, clustering mechanisms enable cost- and performance-effective scaling of processor back-end features. Those attributes can be combined synergistically to design special clusters operating on narrow values (a.k.a. helper cluster), potentially providing performance benefits. We complement a 32-bit monolithic processor with a low-complexity 8-bit helper cluster. Then, in our main focus, we propose various ideas to select suitable instructions to execute in the data-width based clusters. We add data-width information as another instruction steering decision metric and introduce new data-width based selection algorithms which also consider dependency, inter-cluster communication and load imbalance. Utilizing those techniques, the performance of a wide range of workloads are substantially increased; helper cluster achieves an average speedup of 11% for a wide range of 412 apps. When focusing on integer applications, the speedup can be as high as 22% on averagePeer ReviewedPostprint (published version

Electronics implementation of the solar neutron experiment

The electronic equipment design and function are discussed for the solar neutron counter experiment. Circuit diagrams are included

Design and Implementation of Low Power Multiplier Using Proposed Two Phase Clocked Adiabatic Static CMOS Logic Circuit

This paper presents a design and implementation of 2*2 array and 4*4 array multiplier using proposed Two Phase Clocked Adiabatic Static CMOS logic (2PASCL) circuit. The proposed 2PASCL circuit is based on adiabatic energy recovery principle which consumes less power. The proposed 2PASCL uses two sinusoidal power clocks which are 1800 phase shifted with each other. The measurement result of 2*2 array proposed 2PASCL multiplier gives 80.16 % and 97.67 %power reduction relative to reported 2PASCL and conventional CMOS logic and the measurement result of 4*4 array proposed 2PASCL multiplier demonstrate 32.88 % and 82.02 %power reduction compared to reported 2PASCL and conventional CMOS logic . Another advantage of the proposed circuit is that it gives less power though the number of transistor in proposed and reported 2PASCL circuit is same. From the result we conclude that proposed 2PASCL technology is advantageous to application in low power digital systems, pacemakers and sensors. The circuits are simulated at 180nm technology mode

Gate Leakage Reduction by Clocked Power Supply of Adiabatic Logic Circuits

Losses due to gate-leakage-currents become more dominant in new technologies as gate leakage currents increase exponentially with decreasing gate oxide thickness. The most promising Adiabatic Logic (AL) families use a clocked power supply with four states. Hence, the full <i>V</i>_<i>DD</i> voltage drops over an AL gate only for a quarter of the clock cycle, causing a full gate leakage only for a quarter of the clock period. The rising and falling ramps of the clocked power supply lead to an additional energy consumption by gate leakage. This energy is smaller than the fraction caused by the constant <i>V</i>_<i>DD</i> drop, because the gate leakage exponentially depends on the voltage across the oxide. To obtain smaller energy consumption, Improved Adiabatic Logic (IAL) has been introduced. IAL swaps all n- and p-channel transistors. The logic blocks are built of p-channel devices which show gate tunneling currents significantly smaller than in n-channel devices. Using IAL instead of conventional AL allows an additional reduction of the energy consumption caused by gate leakage. Simulations based on a 90nm CMOS process show a lowering in gate leakage energy consumption for AL by a factor of 1.5 compared to static CMOS. For IAL the factor is up to 4. The achievable reduction varies depending on the considered AL family and the complexity of the gate

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked

RAKSHA:Reliable and Aggressive frameworK for System design using High-integrity Approaches

Advances in the fabrication technology have been a major driving force in the unprecedented increase in computing capabilities over the last several decades. Despite huge reductions in the switching energy of the transistors, two major issues have emerged with decreasing fabrication technology scales. They are: 1) increased impact of process, voltage, and temperature (PVT) variation on transistor performance, and 2) increased susceptibility of transistors to soft errors induced by high energy particles. In presence of PVT variation, as transistor sizes continue to decrease, the design margins used to guarantee correct operation in the presence of worst-case scenarios have been increasing. Systems run at a clock frequency, which is determined by accounting the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable and aggressive clocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. Such design methodology exploits the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case scenarios. Better-than-worst-case design methodology is advocated by several recent research pursuits, which propose to exploit in-built fault tolerance mechanisms to enhance computer system performance. Recent works have also shown that the performance lose due to over provisioning base on worst-case design margins is upward of 20\% in terms operating frequency and upward of 50\% in terms of power efficiency. The threat of soft error induced system failure in computing systems has become more prominent as we adopt ultra-deep submicron process technologies. With respect to soft error susceptibility, decreasing transistor geometries lower the energy threshold needed by high-energy particles to induce errors. As this trend continues, the need for fault tolerance mechanisms to counteract this effect has moved from a nice to have, to be a requirement in current and future systems. In this dissertation, RAKSHA (meaning to protect and save in Sanskrit), we take a multidimensional look at the challenges of system design built with scaled-technologies using high integrity techniques. In RAKSHA, to mitigate soft errors, we propose lightweight high-integrity mechanisms as basic system building blocks which allow system to offer performance levels comparable to a non-fault tolerant system. In addition, we also propose to effectively exploit and use the availability of fault tolerant mechanisms to allow and tolerate data-dependent failures, thus setting systems to operate at typical case circuit delays and enhance system performance. We also propose the use of novel high-integrity cells for increasing system energy efficiency and also potentially increasing system security by combating power-analysis-based side channel attacks. Such an approach allows balancing of performance, power, and security with no further overhead over the resources needed to incorporate fault tolerance. Using our framework, instead of designing circuits to meet worst-case requirements, circuits can be designed to meet typical-case requirements. In RAKSHA, we propose two efficient soft error mitigation schemes, namely Soft Error Mitigation (SEM) and Soft and Timing Error Mitigation (STEM), using the approach of multiple clocking of data for protecting combinational logic blocks from soft errors. Our first technique, SEM, based on distributed and temporal voting of three registers, unloads the soft error detection overhead from the critical path of the systems. SEM is also capable of ignoring false errors and recovers from soft errors using in-situ fast recovery avoiding recomputation. Our second technique, STEM, while tolerating soft errors, adds timing error detection capability to guarantee reliable execution in aggressively clocked designs that enhance system performance by operating beyond worst-case clock frequency. We also present a specialized low overhead clock phase management scheme that ably supports our proposed techniques. Timing annotated gate level simulations, using 45nm libraries, of a pipelined adder-multiplier and DLX processor show that both our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a conventional triple modular redundancy voter based soft error mitigation scheme, while STEM outperforms SEM by 27.42%. We refer to systems built with SEM and STEM cells as reliable and aggressive systems. Energy consumption minimization in computing systems has attracted a great deal of attention and has also become critical due to battery life considerations and environmental concerns. To address this problem, many task scheduling algorithms are developed using dynamic voltage and frequency scaling (DVFS). Majority of these algorithms involve two passes: schedule generation and slack reclamation. Using this approach, linear combination of frequencies has been proposed to achieve near optimal energy for systems operating with discrete and traditional voltage frequency pairs. In RAKSHA, we propose a new slack reclamation algorithm, aggressive dynamic and voltage scaling (ADVFS), using reliable and aggressive systems. ADVFS exploits the enhanced voltage frequency spectrum offered by reliable and aggressive designs for improving energy efficiency. Formal proofs are provided to show that optimal energy for reliable and aggressive designs is either achieved by using single frequency or by linear combination of frequencies. ADVFS has been evaluated using random task graphs and our results show 18% reduction in energy when compared with continuous DVFS and over more than 33% when compared with scheme using linear combination of traditional voltage frequency pairs. Recent events have indicated that attackers are banking on side-channel attacks, such as differential power analysis (DPA) and correlation power analysis (CPA), to exploit information leaks from physical devices. Random dynamic voltage frequency scaling (RDVFS) has been proposed to prevent such attacks and has very little area, power, and performance overheads. But due to the one-to-one mapping present between voltage and frequency of DVFS voltage-frequency pairs, RDVFS cannot prevent power attacks. In RAKSHA, we propose a novel countermeasure that uses reliable and aggressive designs to break this one-to-one mapping. Our experiments show that our technique significantly reduces the correlation for the actual key and also reduces the risk of power attacks by increasing the probability for incorrect keys to exhibit maximum correlation. Moreover, our scheme also enables systems to operate beyond the worst-case estimates to offer improved power and performance benefits. For the experiments conducted on AES S-box implemented using 45nm CMOS technology, our approach has increased performance by 22% over the worst-case estimates. Also, it has decreased the correlation for the correct key by an order and has increased the probability by almost 3.5X times for wrong keys when compared with the original key to exhibit maximum correlation. Overall, RAKSHA offers a new way to balance the intricate interplay between various design constraints for the systems designed using small scaled-technologies