Robust design of deep-submicron digital circuits

Avec l'augmentation de la probabilité de fautes dans les circuits numériques, les systèmes développés pour les environnements critiques comme les centrales nucléaires, les avions et les applications spatiales doivent être certifies selon des normes industrielles. Cette thèse est un résultat d'une cooperation CIFRE entre l'entreprise Électricité de France (EDF) R&D et Télécom Paristech. EDF est l'un des plus gros producteurs d'énergie au monde et possède de nombreuses centrales nucléaires. Les systèmes de contrôle-commande utilisé dans les centrales sont basés sur des dispositifs électroniques, qui doivent être certifiés selon des normes industrielles comme la CEI 62566, la CEI 60987 et la CEI 61513 à cause de la criticité de l'environnement nucléaire. En particulier, l'utilisation des dispositifs programmables comme les FPGAs peut être considérée comme un défi du fait que la fonctionnalité du dispositif est définie par le concepteur seulement après sa conception physique. Le travail présenté dans ce mémoire porte sur la conception de nouvelles méthodes d'analyse de la fiabilité aussi bien que des méthodes d'amélioration de la fiabilité d'un circuit numérique.The design of circuits to operate at critical environments, such as those used in control-command systems at nuclear power plants, is becoming a great challenge with the technology scaling. These circuits have to pass through a number of tests and analysis procedures in order to be qualified to operate. In case of nuclear power plants, safety is considered as a very high priority constraint, and circuits designed to operate under such critical environment must be in accordance with several technical standards such as the IEC 62566, the IEC 60987, and the IEC 61513. In such standards, reliability is treated as a main consideration, and methods to analyze and improve the circuit reliability are highly required. The present dissertation introduces some methods to analyze and to improve the reliability of circuits in order to facilitate their qualification according to the aforementioned technical standards. Concerning reliability analysis, we first present a fault-injection based tool used to assess the reliability of digital circuits. Next, we introduce a method to evaluate the reliability of circuits taking into account the ability of a given application to tolerate errors. Concerning reliability improvement techniques, first two different strategies to selectively harden a circuit are proposed. Finally, a method to automatically partition a TMR design based on a given reliability requirement is introduced.PARIS-Télécom ParisTech (751132302) / SudocSudocFranceF

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

EIU Centennial 1995

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Report of the Secretary of War; being part of the message and documents communicated to the two Houses of Congress at the beginning of the second session of the Fifty-fourth Congress, 1896

Annual Report of the Sec. of War. 24 Nov. HD 2, 54-2, v2-9, 5975p. (3478-3485] Pursuit of renegade Apaches; deportation of Canadian Crees; etc

Whole Issue 2020

THE UNIVERSITY OF CHICAGO LEGAL FORUM VOLUME 202

Accountants\u27 index. Twenty-seventh supplement, January-December 1978, volume 2: M-Z

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Space Commerce 1994 Forum: The 10th National Space Symposium. Proceedings report

The theme of the 10th National Space Symposium was 'New Windows of Opportunity'. These proceedings cover the following: Business Trends in High Tech Commercialization; How to Succeed in Space Technology Business -- Making Dollars and Sense; Obstacles and Opportunities to Success in Technology Commercialization NASA's Commercial Technology Mission -- a New Way of Doing Business: Policy and Practices; Field Center Practices; Practices in Action -- A New Way: Implementation and Business Opportunities; Space Commerce Review; Windows of Opportunity; the International Space Station; Space Support Forum; Spacelift Update; Competitive Launch Capabilities; Supporting Life on Planet Earth; National Security Space Issues; NASA in the Balance; Earth and Space Observations -- Did We Have Cousins on Mars?; NASA: A New Vision for Science; and Space Technology Hall of Fame

Bowdoin Orient v.64, no.1-26 (1934-1935)

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