A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

Algorithms for Verification of Analog and Mixed-Signal Integrated Circuits

Over the past few decades, the tremendous growth in the complexity of analog and mixed-signal (AMS) systems has posed great challenges to AMS verification, resulting in a rapidly growing verification gap. Existing formal methods provide appealing completeness and reliability, yet they suffer from their limited efficiency and scalability. Data oriented machine learning based methods offer efficient and scalable solutions but do not guarantee completeness or full coverage. Additionally, the trend towards shorter time to market for AMS chips urges the development of efficient verification algorithms to accelerate with the joint design and testing phases. This dissertation envisions a hierarchical and hybrid AMS verification framework by consolidating assorted algorithms to embrace efficiency, scalability and completeness in a statistical sense. Leveraging diverse advantages from various verification techniques, this dissertation develops algorithms in different categories. In the context of formal methods, this dissertation proposes a generic and comprehensive model abstraction paradigm to model AMS content with a unifying analog representation. Moreover, an algorithm is proposed to parallelize reachability analysis by decomposing AMS systems into subsystems with lower complexity, and dividing the circuit's reachable state space exploration, which is formulated as a satisfiability problem, into subproblems with a reduced number of constraints. The proposed modeling method and the hierarchical parallelization enhance the efficiency and scalability of reachability analysis for AMS verification. On the subject of learning based method, the dissertation proposes to convert the verification problem into a binary classification problem solved using support vector machine (SVM) based learning algorithms. To reduce the need of simulations for training sample collection, an active learning strategy based on probabilistic version space reduction is proposed to perform adaptive sampling. An expansion of the active learning strategy for the purpose of conservative prediction is leveraged to minimize the occurrence of false negatives. Moreover, another learning based method is proposed to characterize AMS systems with a sparse Bayesian learning regression model. An implicit feature weighting mechanism based on the kernel method is embedded in the Bayesian learning model for concurrent quantification of influence of circuit parameters on the targeted specification, which can be efficiently solved in an iterative method similar to the expectation maximization (EM) algorithm. Besides, the achieved sparse parameter weighting offers favorable assistance to design analysis and test optimization

Advanced RF and Microwave Design Optimization: A Journey and a Vision of Future Trends

In this paper, we outline the historical evolution of RF and microwave design optimization and envisage imminent and future challenges that will be addressed by the next generation of optimization developments. Our journey starts in the 1960s, with the emergence of formal numerical optimization algorithms for circuit design. In our fast historical analysis, we emphasize the last two decades of documented microwave design optimization problems and solutions. From that retrospective, we identify a number of prominent scientific and engineering challenges: 1) the reliable and computationally efficient optimization of highly accurate system-level complex models subject to statistical uncertainty and varying operating or environmental conditions; 2) the computationally-efficient EM-driven multi-objective design optimization in high-dimensional design spaces including categorical, conditional, or combinatorial variables; and 3) the manufacturability assessment, statistical design, and yield optimization of high-frequency structures based on high-fidelity multi-physical representations. To address these major challenges, we venture into the development of sophisticated optimization approaches, exploiting confined and dimensionally reduced surrogate vehicles, automated feature-engineering-based optimization, and formal cognition-driven space mapping approaches, assisted by Bayesian and machine learning techniques.ITESO, A.C

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

A Survey of Adaptive Resonance Theory Neural Network Models for Engineering Applications

This survey samples from the ever-growing family of adaptive resonance theory (ART) neural network models used to perform the three primary machine learning modalities, namely, unsupervised, supervised and reinforcement learning. It comprises a representative list from classic to modern ART models, thereby painting a general picture of the architectures developed by researchers over the past 30 years. The learning dynamics of these ART models are briefly described, and their distinctive characteristics such as code representation, long-term memory and corresponding geometric interpretation are discussed. Useful engineering properties of ART (speed, configurability, explainability, parallelization and hardware implementation) are examined along with current challenges. Finally, a compilation of online software libraries is provided. It is expected that this overview will be helpful to new and seasoned ART researchers

Adaptive extreme edge computing for wearable devices

Wearable devices are a fast-growing technology with impact on personal healthcare for both society and economy. Due to the widespread of sensors in pervasive and distributed networks, power consumption, processing speed, and system adaptation are vital in future smart wearable devices. The visioning and forecasting of how to bring computation to the edge in smart sensors have already begun, with an aspiration to provide adaptive extreme edge computing. Here, we provide a holistic view of hardware and theoretical solutions towards smart wearable devices that can provide guidance to research in this pervasive computing era. We propose various solutions for biologically plausible models for continual learning in neuromorphic computing technologies for wearable sensors. To envision this concept, we provide a systematic outline in which prospective low power and low latency scenarios of wearable sensors in neuromorphic platforms are expected. We successively describe vital potential landscapes of neuromorphic processors exploiting complementary metal-oxide semiconductors (CMOS) and emerging memory technologies (e.g. memristive devices). Furthermore, we evaluate the requirements for edge computing within wearable devices in terms of footprint, power consumption, latency, and data size. We additionally investigate the challenges beyond neuromorphic computing hardware, algorithms and devices that could impede enhancement of adaptive edge computing in smart wearable devices