631 research outputs found
When Do WOM Codes Improve the Erasure Factor in Flash Memories?
Flash memory is a write-once medium in which reprogramming cells requires
first erasing the block that contains them. The lifetime of the flash is a
function of the number of block erasures and can be as small as several
thousands. To reduce the number of block erasures, pages, which are the
smallest write unit, are rewritten out-of-place in the memory. A Write-once
memory (WOM) code is a coding scheme which enables to write multiple times to
the block before an erasure. However, these codes come with significant rate
loss. For example, the rate for writing twice (with the same rate) is at most
0.77.
In this paper, we study WOM codes and their tradeoff between rate loss and
reduction in the number of block erasures, when pages are written uniformly at
random. First, we introduce a new measure, called erasure factor, that reflects
both the number of block erasures and the amount of data that can be written on
each block. A key point in our analysis is that this tradeoff depends upon the
specific implementation of WOM codes in the memory. We consider two systems
that use WOM codes; a conventional scheme that was commonly used, and a new
recent design that preserves the overall storage capacity. While the first
system can improve the erasure factor only when the storage rate is at most
0.6442, we show that the second scheme always improves this figure of merit.Comment: to be presented at ISIT 201
Time-Space Constrained Codes for Phase-Change Memories
Phase-change memory (PCM) is a promising non-volatile solid-state memory
technology. A PCM cell stores data by using its amorphous and crystalline
states. The cell changes between these two states using high temperature.
However, since the cells are sensitive to high temperature, it is important,
when programming cells, to balance the heat both in time and space.
In this paper, we study the time-space constraint for PCM, which was
originally proposed by Jiang et al. A code is called an
\emph{-constrained code} if for any consecutive
rewrites and for any segment of contiguous cells, the total rewrite
cost of the cells over those rewrites is at most . Here,
the cells are binary and the rewrite cost is defined to be the Hamming distance
between the current and next memory states. First, we show a general upper
bound on the achievable rate of these codes which extends the results of Jiang
et al. Then, we generalize their construction for -constrained codes and show another construction for -constrained codes. Finally, we show that these two
constructions can be used to construct codes for all values of ,
, and
Trajectory Codes for Flash Memory
Flash memory is well-known for its inherent asymmetry: the flash-cell charge
levels are easy to increase but are hard to decrease. In a general rewriting
model, the stored data changes its value with certain patterns. The patterns of
data updates are determined by the data structure and the application, and are
independent of the constraints imposed by the storage medium. Thus, an
appropriate coding scheme is needed so that the data changes can be updated and
stored efficiently under the storage-medium's constraints.
In this paper, we define the general rewriting problem using a graph model.
It extends many known rewriting models such as floating codes, WOM codes,
buffer codes, etc. We present a new rewriting scheme for flash memories, called
the trajectory code, for rewriting the stored data as many times as possible
without block erasures. We prove that the trajectory code is asymptotically
optimal in a wide range of scenarios.
We also present randomized rewriting codes optimized for expected performance
(given arbitrary rewriting sequences). Our rewriting codes are shown to be
asymptotically optimal.Comment: Submitted to IEEE Trans. on Inform. Theor
Coding scheme for 3D vertical flash memory
Recently introduced 3D vertical flash memory is expected to be a disruptive
technology since it overcomes scaling challenges of conventional 2D planar
flash memory by stacking up cells in the vertical direction. However, 3D
vertical flash memory suffers from a new problem known as fast detrapping,
which is a rapid charge loss problem. In this paper, we propose a scheme to
compensate the effect of fast detrapping by intentional inter-cell interference
(ICI). In order to properly control the intentional ICI, our scheme relies on a
coding technique that incorporates the side information of fast detrapping
during the encoding stage. This technique is closely connected to the
well-known problem of coding in a memory with defective cells. Numerical
results show that the proposed scheme can effectively address the problem of
fast detrapping.Comment: 7 pages, 9 figures. accepted to ICC 2015. arXiv admin note: text
overlap with arXiv:1410.177
Rank-Modulation Rewrite Coding for Flash Memories
The current flash memory technology focuses on the cost minimization of its static storage capacity. However, the resulting approach supports a relatively small number of program-erase cycles. This technology is effective for consumer devices (e.g., smartphones and cameras) where the number of program-erase cycles is small. However, it is not economical for enterprise storage systems that require a large number of lifetime writes. The proposed approach in this paper for alleviating this problem consists of the efficient integration of two key ideas: 1) improving reliability and endurance by representing the information using relative values via the rank modulation scheme and 2) increasing the overall (lifetime) capacity of the flash device via rewriting codes, namely, performing multiple writes per cell before erasure. This paper presents a new coding scheme that combines rank-modulation with rewriting. The key benefits of the new scheme include: 1) the ability to store close to 2 bit per cell on each write with minimal impact on the lifetime of the memory and 2) efficient encoding and decoding algorithms that make use of capacity-achieving write-once-memory codes that were proposed recently
Towards Endurable, Reliable and Secure Flash Memories-a Coding Theory Application
Storage systems are experiencing a historical paradigm shift from hard disk to nonvolatile memories due to its advantages such as higher density, smaller size and non-volatility. On the other hand, Solid Storage Disk (SSD) also poses critical challenges to application and system designers. The first challenge is called endurance. Endurance means flash memory can only experience a limited number of program/erase cycles, and after that the cell quality degradation can no longer be accommodated by the memory system fault tolerance capacity. The second challenge is called reliability, which means flash cells are sensitive to various noise and disturbs, i.e., data may change unintentionally after experiencing noise/disturbs. The third challenge is called security, which means it is impossible or costly to delete files from flash memory securely without leaking information to possible eavesdroppers.
In this dissertation, we first study noise modeling and capacity analysis for NAND flash memories (which is the most popular flash memory in market), which gains us some insight on how flash memories are working and their unique noise. Second, based on the characteristics of content-replication codewords in flash memories, we propose a joint decoder to enhance the flash memory reliability. Third, we explore data representation schemes in flash memories and optimal rewriting code constructions in order to solve the endurance problem. Fourth, in order to make our rewriting code more practical, we study noisy write-efficient memories and Write-Once Memory (WOM) codes against inter-cell interference in NAND memories. Finally, motivated by the secure deletion problem in flash memories, we study coding schemes to solve both the endurance and the security issues in flash memories. This work presents a series of information theory and coding theory research studies on the aforesaid three critical issues, and shows that how coding theory can be utilized to address these challenges
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