Digital-to-Analog Converter Interface for Computer Assisted Biologically Inspired Systems

In today\u27s integrated circuit technology, system interfaces play an important role of enabling fast, reliable data communications. A key feature of this work is the exploration and development of ultra-low power data converters. Data converters are present in some form in almost all mixed-signal systems; in particular, digital-to-analog converters present the opportunity for digitally controlled analog signal sources. Such signal sources are used in a variety of applications such as neuromorphic systems and analog signal processing. Multi-dimensional systems, such as biologically inspired neuromorphic systems, require vectors of analog signals. To use a microprocessor to control these analog systems, we must ultimately convert the digital control signal to an analog control signal and deliver it to the system. Integrating such capabilities of a converter on chip can yield significant power and chip area constraints. Special attention is paid to the power efficiency of the data converter, the data converter design discussed in this thesis yields the lowest power consumption to date. The need for a converter with these properties leads us to the concept of a scalable array of power-efficient digital-to-analog converters; the channels of which are time-domain multiplexed so that chip-area is minimized while preserving performance. To take further advantage of microprocessor capabilities, an analog-to- digital design is proposed to return the analog system\u27s outputs to the microprocessor in a digital form. A current-steering digital-to-analog converter was chosen as a candidate for the conversion process because of its natural speed and voltage-to-current translation properties. This choice is nevertheless unusual, because current-steering digital- to-analog converters have a reputation for high performance with high power consumption. A time domain multiplexing scheme is presented such that a digital data set of any size is synchronously multiplexed through a finite array of converters, minimizing the total area and power consumption. I demonstrate the suitability of current-steering digital-to-analog converters for ultra low-power operation with a proof-of-concept design in a widely available 130 nm CMOS technology. In statistical simulation, the proposed digital-to-analog converter was capable of 8-bit, 100 kSps operation while consuming 231 nW of power from a 1 V supply

5-Bit Dual-Slope Analog-to-Digital Converter-Based Time-to-Digital Converter Chip Design in CMOS Technology

Time-to-Digital Converters (TDC) have gained increasing importance in modern implementations of mixed-signal, data-acquisition and processing interfaces and are used to perform high precision time intervals in systems that incorporate Time-of-Flight (ToF) or Time-of-Arrival (ToA) measurements. The linearity of TDCs is very crucial since most Digital Signal Processing (DSP) systems require very linear inputs to achieve high accuracy. In this work, a TDC has been designed in the 0.5 μm n-well CMOS process that can be used for on-chip integration and in applications requiring high linearity. This TDC used a Dual-Slope-ADC-based architecture for the time-to-digital conversion and consists of the following three main sub-circuits: a time-to-voltage conversion part, an integrating part and digital circuitry. The design is operated with ±2.5V supply voltage and the digital circuitry, consisting of two digital counters and an adder, are operated with a clock frequency of 13MHz. The design of the TDC is discussed and simulated and experimental test results and linearity performance of the fabricated TDC are also presented

Fully digital-compatible built-in self-test solutions to linearity testing of embedded mixed-signal functions

Mixed-signal circuits, especially analog-to-digital and digital-to-analog converters, are the most widely used circuitry in electronic systems. In the most of the cases, mixed-signal circuits form the interface between the analog and digital worlds and enable the processing and recovering of the real-world information. Performance of mixed-signal circuits, such as linearity and noise, are then critical to any applications. Conventionally, mixed-signal circuits are tested by mixed-signal automatic test equipment (ATE). However, along with the continuous performance improvement, using conventionally methods increases test costs significantly since it takes much more time to test high-performance parts than low-performance ones and mixed-signal ATE testers could be extremely expensive depending on the test precision they provide. Another factor that makes mixed-signal testing more and more challenging is the advance of the integration level. In the popular system-on-chip applications, mixed-signal circuits are deeply embedded in the systems. With less observability and accessibility, conventionally external test methods can not guarantee the precision of the source signals and evaluations. Test performance is then degraded. This work investigates new methods using digital testers incorporated with on-chip, built-in self-test circuits to test the linearity performance of data converters with less test cost and better test performance. Digital testers are cheap to use since they only offer logic signals with direct connections. The analog sourcing and evaluation capabilities have to be absorbed by the on-chip BIST circuits, which, meanwhile, could benefit the test performance with access to the internal circuit nodes. The main challenge of the digital-compatible BIST methods is to implement the BIST circuits with enough high test performance but with low design complexity and cost. High-resolution data converter testing needs much higher-precision analog source signals and evaluation circuits. However, high-precision analog circuits are conventionally hard to design and costly, and their performance is subject to mismatch errors and process variations and cannot be guaranteed without careful testing. On the digital side, BIST circuits usually conduct procedure control and data processing. To make the BIST solution more universal, the control and processing performed by the digital BIST circuits should be simple and not rely on any complex microcontroller and DSP block. Therefore, the major tasks of this dissertation are 1) performance-robust analog BIST circuit design and 2) test procedure development. Analog BIST circuits in this work consist of only low-accuracy analog components, which are usually easy to design and cost effective. The precision is then obtained by applying the so-called deterministic dynamic element matching technique to the low-accuracy analog cells. The test procedure and data processing designed for the BIST system are simple and can be implemented by small logic circuits. In this dissertation, we discuss the proposed BIST solutions to ADC and DAC linearity testing in chapter 3 and chapter 5, respectively. In each case, the structure of the test system, the test procedure, and the theoretical analysis of the test performance are presented. Simulation results are shown to verify the efficacy of the methods. The ADC BIST system is also verified experimentally. In addition, chapter 4 introduces a system-identification based reduced-code testing method for pipeline ADCs. This method is able to reduce test time by more than 95%. And it is compatible with the proposed BIST method discussed in chapter 3

Multi-gigabit CMOS analog-to-digital converter and mixed-signal demodulator for low-power millimeter-wave communication systems

The objective of the research is to develop high-speed ADCs and mixed-signal demodulator for multi-gigabit communication systems using millimeter-wave frequency bands in standard CMOS technology. With rapid advancements in semiconductor technologies, mobile communication devices have become more versatile, portable, and inexpensive over the last few decades. However, plagued by the short lifetime of batteries, low power consumption has become an extremely important specification in developing mobile communication devices. The ever-expanding demand of consumers to access and share information ubiquitously at faster speeds requires higher throughputs, increased signal-processing functionalities at lower power and lower costs. In today’s technology, high-speed signal processing and data converters are incorporated in almost all modern multi-gigabit communication systems. They are key enabling technologies for scalable digital design and implementation of baseband signal processors. Ultimately, the merits of a high performance mixed-signal receiver, such as data rate, sensitivity, signal dynamic range, bit-error rate, and power consumption, are directly related to the quality of the embedded ADCs. Therefore, this dissertation focuses on the analysis and design of high-speed ADCs and a novel broadband mixed-signal demodulator with a fully-integrated DSP composed of low-cost CMOS circuitry. The proposed system features a novel dual-mode solution to demodulate multi-gigabit BPSK and ASK signals. This approach reduces the resolution requirement of high-speed ADCs, while dramatically reducing its power consumption for multi-gigabit wireless communication systems.PhDGee-Kung Chang - Committee Chair; Chang-Ho Lee - Committee Member; Geoffrey Ye Li - Committee Member; Paul A. Kohl - Committee Member; Shyh-Chiang Shen - Committee Membe

Built-In Self-Test Methodology for A/D Converters

A (partial) Built-in Self-Test (BIST) methodology is proposed for analog to digital (A/D) converters. In this methodology the number of bits of the A/D converter that needs to be monitored externally in a test is reduced. This reduction depends, among other things, on the frequency of the applied test signal. At low test signal frequencies only the least significant bit (LSB) needs to be monitored and a "full" BIST becomes feasible. An analysis is made of the trade-off between the size of the on-chip test circuitry and the accuracy of this BIST techniqu

Design of the 12-bit Delta-Sigma Modulator using SC Technique for Vibration Sensor Output Processing

The work deals with the design of the 12-bit Delta-Sigma modulator using switched capacitors (SC) technique. The modulator serves to vibration sensor output processing. The first part describes the Delta-Sigma modulator parameters definition. Results of the proposed topology ideal model were presented as well. Next, the Delta-Sigma modulator circuitry on the transistor level was done. The ONSemiconductor I2T100 0.7 um CMOS technology was used for design. Then, the Delta-Sigma modulator nonidealities were simulated and implemented into the MATLAB ideal model of the modulator. The model of real Delta-Sigma modulator was derived. Consequently, modulator coefficients were optimized. Finally, the corner analysis of the Delta-Sigma modulator with the optimized coefficients was simulated. The value of SNDR = 82.2 dB (ENOB = 13.4 bits) was achieved

Adder Based Residue to Binary Number Converters for (2n - 1; 2n; 2n + 1)

Copyright © 2002 IEEEBased on an algorithm derived from the new Chinese remainder theorem I, we present three new residue-to-binary converters for the residue number system (2n-1, 2n, 2n+1) designed using 2n-bit or n-bit adders with improvements on speed, area, or dynamic range compared with various previous converters. The 2n-bit adder based converter is faster and requires about half the hardware required by previous methods. For n-bit adder-based implementations, one new converter is twice as fast as the previous method using a similar amount of hardware, whereas another new converter achieves improvement in either speed, area, or dynamic range compared with previous convertersYuke Wang, Xiaoyu Song, Mostapha Aboulhamid and Hong She

Integrated circuit interface for artificial skins

Artificial sensitive skins are intended to emulate the human skin to improve the skills of robots and machinery in complex unstructured environments. They are basically smart arrays of pressure sensors. As in the case of artificial retinas, one problem to solve is the management of the huge amount of information that such arrays provide, especially if this information should be used by a central processing unit to implement some control algorithms. An approach to manage such information is to increment the signal processing performed close to the sensor in order to extract the useful information and reduce the errors caused by long wires. This paper proposes the use of voltage to frequency converters to implement a quite straightforward analog to digital conversion as front end interface to digital circuitry in a smart tactile sensor. The circuitry commonly implemented to read out the information from a piezoresistive tactile sensor can be modified to turn it into an array of voltage to frequency converters. This is carried out in this paper, where the feasibility of the idea is shown through simulations and its performance is discussed.Gobierno de España TEC2006-12376-C02-01, TEC2006-1572

A mixed-signal early vision chip with embedded image and programming memories and digital I/O

From a system level perspective, this paper presents a 128 × 128 flexible and reconfigurable Focal-Plane Analog Programmable Array Processor, which has been designed as a single chip in a 0.35μm standard digital 1P-5M CMOS technology. The core processing array has been designed to achieve high-speed of operation and large-enough accuracy (∼ 7bit) with low power consumption. The chip includes on-chip program memory to allow for the execution of complex, sequential and/or bifurcation flow image processing algorithms. It also includes the structures and circuits needed to guarantee its embedding into conventional digital hosting systems: external data interchange and control are completely digital. The chip contains close to four million transistors, 90% of them working in analog mode. The chip features up to 330GOPs (Giga Operations per second), and uses the power supply (180GOP/Joule) and the silicon area (3.8 GOPS/mm2) efficiently, as it is able to maintain VGA processing throughputs of 100Frames/s with about 15 basic image processing tasks on each frame