Time-to-Digital Converters (TDC) have gained increasing importance in modern implementations of mixed-signal, data-acquisition and processing interfaces and are used to perform high precision time intervals in systems that incorporate Time-of-Flight (ToF) or Time-of-Arrival (ToA) measurements. The linearity of TDCs is very crucial since most Digital Signal Processing (DSP) systems require very linear inputs to achieve high accuracy.
In this work, a TDC has been designed in the 0.5 μm n-well CMOS process that can be used for on-chip integration and in applications requiring high linearity. This TDC used a Dual-Slope-ADC-based architecture for the time-to-digital conversion and consists of the following three main sub-circuits: a time-to-voltage conversion part, an integrating part and digital circuitry. The design is operated with ±2.5V supply voltage and the digital circuitry, consisting of two digital counters and an adder, are operated with a clock frequency of 13MHz. The design of the TDC is discussed and simulated and experimental test results and linearity performance of the fabricated TDC are also presented
