Effect of clock gating in conditional pulse enhancement flip-flop for low power applications

Flip-Flops (FFs) play a fundamental role in digital designs. A clock system consumes above 25% of total system power. The use of pulse-triggered flip-flops (P-FFs) in digital design provides better performance than conventional flip-flop designs. This paper presents the design of a new power-efficient implicit pulse-triggered flip-flop suitable for low power applications. This flip-flop architecture is embedded with two key features. Firstly, the enhancement in width and height of triggering pulses during specific conditions gives a solution for the longest discharging path problem in existing P-FFs. Secondly, the clock gating concept reduces unwanted switching activities at sleep/idle mode of operation and thereby reducing dynamic power consumption. The post-layout simulation results in cadence software based on CMOS 90-nm technology shows that the proposed design features less power dissipation and better power delay performance (PDP) when compared with conventional P-FFs. Its maximum power saving against conventional designs is up to 30.65%

Ultra-Low Leakage, Energy-Efficient Digital Integrated Circuit and System Design

The advances of the complementary metal-oxide-semiconductor (CMOS) technology manufacturing and design over the years have enabled a diverse range of applications across the power consumption, performance, and area (PPA) spectra. Many of the recent and prospective applications rely on the availability of energy-autonomous, miniaturized systems, i.e., ultra-low power (ULP) VLSI systems, which are generally characterized by extreme resource limitations. Some examples of applications are wireless sensing platforms, body-area sensor networks (BASN), biomedical and implantable devices, wearables, hearables, and monitors. Within the context of such applications, the key requirements are long lifetime and miniaturized size (sub-/millimeter-scale). In order to enable both requirements, energy-efficiency is the key metric. It allows for extended battery lifetime and operation with the energy that can be harvested from the environment, and it limits the size (volume) of the energy sources utilized to power these systems. Ultra-low voltage (ULV) operation is a key technique in which the VDD of circuits is reduced from nominal to near or below the threshold voltage of the transistor. It is a powerful knob that has been largely exploited by designers in order to achieve ultra-low power consumption and high energy-efficiency in CMOS. Existing ULP VLSI systems typically operate at a lower supply voltage thereby reducing their energy consumption by one to two orders of magnitude in order to enable the aforementioned applications. While supply voltage scaling is a promising measure for achieving low power and reducing energy consumption, it brings up several challenges. One critical issue is the leakage energy dissipated by the devices, which is magnified in portion to the total energy consumption at ULV. The reason is that, as VDD scales from nominal to near-threshold and sub-threshold, transistors become increasingly slower and they accumulate more leakage (i.e., static) power over longer cycle times. This energy waste accounts for a significant portion of the system's total energy consumption, offsets the gains provided by voltage scaling, defines the minimum energy per operation, and poses a practical limit for the system's energy-efficiency. This thesis presents selected research works on ultra-low leakage, energy-efficient digital integrated circuit design. More specifically, it describes novel and key techniques for minimizing the energy waste of idle/underutilized and always-on hardware. The main goal of such techniques is to push the envelope of energy-efficiency in energy-autonomous, miniaturized VLSI systems. Such techniques are applied to key building blocks of emerging mobile and embedded computing devices resulting in state-of-the-art energy-efficiencies

High-speed Energy-efficient Soft Error Tolerant Flip-flops

Single event upset (SEU) or soft error caused by alpha particles and cosmic neutrons has emerged as a key reliability concern in nanoscale CMOS technologies. The decrease in signal charge due to the reduction of the operating voltage and node capacitance primarily increases the soft error rate (SER) in integrated circuits. The situation is aggravated by the increasing number of memory elements (e.g., flip-flops) on chip, the lack of inherent error masking mechanisms in these elements, and the below-nominal voltage operation for reducing the power consumption. In fact, limiting the power consumption is critical to enhance the battery life of portable electronic devices. In this thesis, I present several soft error tolerant flip-flops that offer high speed while consuming low power either inherently or through low-energy clocking scheme. The proposed soft error tolerant flip-flops can be divided into two major categories: i) flip-flops with square-wave clock and ii) flip-flops with energy recovery sinusoidal clock, which is very attractive to significantly lower the clock power consumption. The two square-wave clock based proposed flip-flops are: a true single phase clock (TSPC) DICE flip-flop and a clocked precharge soft error robust flip-flop. These flip-flops use fewer transistors and offer as much as 35% lower power-delay-product (PDP) than existing soft error robust pulsed DICE flip-flop. The energy recovery clock based proposed flip-flops are: a soft clock edge SEU hardened (SCESH) flip-flop, C2-DICE flip-flop, a conditional pass Quatro (CPQ) flip-flop, and two energy recovery TSPC flip-flops. These flip-flops exhibit lower PDP ranging from 30% to 69% when compared to the pulsed DICE flip-flop and the single-ended conditional capturing energy recovery (SCCER) flip-flop. Thus, the proposed flip-flops provide a wide range of power and delay choices and as such can be used in a variety of low-power or high performance applications including high-end microprocessors, low-power system-on-chips (SOCs), and implantable medical devices

Methods to improve the reliability and resiliency of near/sub-threshold digital circuits

Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy required for computations by as much as 6 times. However, when operating at near/sub-threshold voltages (where the supply voltage is near or below the threshold of the transistors), imperfections in transistor manufacturing, changes in temperature, and other difficult-to-predict factors cause wide variations in the timing of Complementary Metal-Oxide Semiconductor (CMOS) circuits due to an increased sensitivity at lower voltages. These increased variations result in poor aggregate performance and cause increased rates of error occurrence in computation. This work introduces several new methods to improve the reliability of near/sub-threshold circuits. The first is a design automation technique that is used to aid in low-voltage digital standard cell synthesis. Second, two circuit-level techniques are also introduced that aim to improve the reliability and resiliency of digital circuits by means of completion/error detection. These techniques are shown to improve speed and lower energy consumption at low overheads compared to previous methods. Most importantly, these circuit-level methods are specifically designed to operate at low voltages and can themselves tolerate variations and operation in harsh environments. Finally, a test-chip prototype designed in 65nm-CMOS demonstrates the practicality and feasibility of a proposed current sensing error detector

Design and Characterization of Standard Cell Library using FinFETs

The processors and digital circuits designed today contain billions of transistors on a small piece of silicon. As devices are becoming smaller, slimmer, faster, and more efficient, the transistors also have to keep up with the demands and needs of the daily user. Unfortunately, the CMOS technology has reached its limit and cannot be used to scale down due to the transistor\u27s breakdown caused by short channel effects. An alternative solution to this is the FinFET transistor technology, where the gate of the transistor is a three dimensional fin that surrounds the transistor and prevents the breakdown caused by scaling and short channel effects. FinFET devices are reported to have excellent control over short channel effects, high On/Off Ratio, extremely low gate leakage current and relative immunization over gate edge line roughness. Sub 20 nm node size is perceived to be the limit of scaling the CMOS transistors, but FinFETs can be scaled down further because of its unique design. Due to these advantages, the VLSI industry has now shifted to FinFET in implementation of their designs. However, these transistors have not been completely opened to academia. Analyzing and observing the effects of these devices can be pivotal in gaining an in-depth understanding of them. This thesis explores the implementation of FinFETs using a standard cell library designed using these transistors. The FinFET package file used to design these cells is a 15nm FinFET technology file developed by NCSU in collaboration with Cadence and Mentor Graphics. Post design, the cells were characterized, the results were analyzed and compared with cells designed using CMOS transistors at different node sizes to understand and extrapolate conclusions on FinFET devices

Energy-Efficient Digital Circuit Design using Threshold Logic Gates

abstract: Improving energy efficiency has always been the prime objective of the custom and automated digital circuit design techniques. As a result, a multitude of methods to reduce power without sacrificing performance have been proposed. However, as the field of design automation has matured over the last few decades, there have been no new automated design techniques, that can provide considerable improvements in circuit power, leakage and area. Although emerging nano-devices are expected to replace the existing MOSFET devices, they are far from being as mature as semiconductor devices and their full potential and promises are many years away from being practical. The research described in this dissertation consists of four main parts. First is a new circuit architecture of a differential threshold logic flipflop called PNAND. The PNAND gate is an edge-triggered multi-input sequential cell whose next state function is a threshold function of its inputs. Second a new approach, called hybridization, that replaces flipflops and parts of their logic cones with PNAND cells is described. The resulting \hybrid circuit, which consists of conventional logic cells and PNANDs, is shown to have significantly less power consumption, smaller area, less standby power and less power variation. Third, a new architecture of a field programmable array, called field programmable threshold logic array (FPTLA), in which the standard lookup table (LUT) is replaced by a PNAND is described. The FPTLA is shown to have as much as 50% lower energy-delay product compared to conventional FPGA using well known FPGA modeling tool called VPR. Fourth, a novel clock skewing technique that makes use of the completion detection feature of the differential mode flipflops is described. This clock skewing method improves the area and power of the ASIC circuits by increasing slack on timing paths. An additional advantage of this method is the elimination of hold time violation on given short paths. Several circuit design methodologies such as retiming and asynchronous circuit design can use the proposed threshold logic gate effectively. Therefore, the use of threshold logic flipflops in conventional design methodologies opens new avenues of research towards more energy-efficient circuits.Dissertation/ThesisDoctoral Dissertation Computer Science 201

Exploration and Design of High Performance Variation Tolerant On-Chip Interconnects

Siirretty Doriast

Low Power Circuits for Miniature Sensor Systems.

With the development of VLSI technologies, the sensor systems of all kinds of applications have entered our everyday's life. For specific applications such as medical implants, the form factor of such systems is the crucial concern. In order to minimize of size of the power sources with a given lifetime, the ability to operate the system with low power consumption is the key. An effective way of lowering the active power dissipation is through aggressive voltage scaling. For minimal energy operation, the optimum supply voltage is typical lower than the subthreshold voltage. On the other hand, a sensor system spends most of the time idling while only actively obtaining data in a short period of time. As a result, strong power gating is needed for reducing the leakage power. We discuss the design challenges for several building blocks for the sensor system that have not been gotten much emphasis in term of power consumption. To monitor the period for idle time and to wake up the system periodically, two types of ultra low power timers are proposed. The first one utilizes the gate leakage of a MOS transistor to achieve low temperature dependency and large time constant. The second one implements a program-and-hold technique to compensate for the temperature coefficient of a one-shot oscillator with 150pW of average power. We propose a low power temperature sensor that is suitable for passive RFID transponder. To retrieve the data out of the sensor chip, two passive proximity communication schemes are presented. Capacitive coupling can be used for chips on a stack where the key challenge is misalignment. A alignment detection and microplate reconfiguration method is proposed to solve the problem. We also propose a passive inductive coupling scheme using pulse signaling. Compared to the traditional backscattering technique, the limitations on the quality factor of the inductor and the signal sensitivity of the receiver can be relaxed.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61782/1/yushiang_1.pd

Dynamically reconfigurable asynchronous processor

The main design requirements for today's mobile applications are: · high throughput performance. · high energy efficiency. · high programmability. Until now, the choice of platform has often been limited to Application-Specific Integrated Circuits (ASICs), due to their best-of-breed performance and power consumption. The economies of scale possible with these high-volume markets have traditionally been able to hide the high Non-Recurring Engineering (NRE) costs required for designing and fabricating new ASICs. However, with the NREs and design time escalating with each generation of mobile applications, this practice may be reaching its limit. Designers today are looking at programmable solutions, so that they can respond more rapidly to changes in the market and spread costs over several generations of mobile applications. However, there have been few feasible alternatives to ASICs: Digital Signals Processors (DSPs) and microprocessors cannot meet the throughput requirements, whereas Field-Programmable Gate Arrays (FPGAs) require too much area and power. Coarse-grained dynamically reconfigurable architectures offer better solutions for high throughput applications, when power and area considerations are taken into account. One promising example is the Reconfigurable Instruction Cell Array (RICA). RICA consists of an array of cells with an interconnect that can be dynamically reconfigured on every cycle. This allows quite complex datapaths to be rendered onto the fabric and executed in a single configuration - making these architectures particularly suitable to stream processing. Furthermore, RICA can be programmed from C, making it a good fit with existing design methodologies. However the RICA architecture has a drawback: poor scalability in terms of area and power. As the core gets bigger, the number of sequential elements in the array must be increased significantly to maintain the ability to achieve high throughputs through pipelining. As a result, a larger clock tree is required to synchronise the increased number of sequential elements. The clock tree therefore takes up a larger percentage of the area and power consumption of the core. This thesis presents a novel Dynamically Reconfigurable Asynchronous Processor (DRAP), aimed at high-throughput mobile applications. DRAP is based on the RICA architecture, but uses asynchronous design techniques - methods of designing digital systems without clocks. The absence of a global clock signal makes DRAP more scalable in terms of power and area overhead than its synchronous counterpart. The DRAP architecture maintains most of the benefits of custom asynchronous design, whilst also providing programmability via conventional high-level languages. Results show that the DRAP processor delivers considerably lower power consumption when compared to a market-leading Very Long Instruction Word (VLIW) processor and a low-power ARM processor. For example, DRAP resulted in a reduction in power consumption of 20 times compared to the ARM7 processor, and 29 times compared to the TIC64x VLIW, when running the same benchmark capped to the same throughput and for the same process technology (0.13μm). When compared to an equivalent RICA design, DRAP was up to 22% larger than RICA but resulted in a power reduction of up to 1.9 times. It was also capable of achieving up to 2.8 times higher throughputs than RICA for the same benchmarks

Soft-Error Resilience Framework For Reliable and Energy-Efficient CMOS Logic and Spintronic Memory Architectures

The revolution in chip manufacturing processes spanning five decades has proliferated high performance and energy-efficient nano-electronic devices across all aspects of daily life. In recent years, CMOS technology scaling has realized billions of transistors within large-scale VLSI chips to elevate performance. However, these advancements have also continually augmented the impact of Single-Event Transient (SET) and Single-Event Upset (SEU) occurrences which precipitate a range of Soft-Error (SE) dependability issues. Consequently, soft-error mitigation techniques have become essential to improve systems\u27 reliability. Herein, first, we proposed optimized soft-error resilience designs to improve robustness of sub-micron computing systems. The proposed approaches were developed to deliver energy-efficiency and tolerate double/multiple errors simultaneously while incurring acceptable speed performance degradation compared to the prior work. Secondly, the impact of Process Variation (PV) at the Near-Threshold Voltage (NTV) region on redundancy-based SE-mitigation approaches for High-Performance Computing (HPC) systems was investigated to highlight the approach that can realize favorable attributes, such as reduced critical datapath delay variation and low speed degradation. Finally, recently, spin-based devices have been widely used to design Non-Volatile (NV) elements such as NV latches and flip-flops, which can be leveraged in normally-off computing architectures for Internet-of-Things (IoT) and energy-harvesting-powered applications. Thus, in the last portion of this dissertation, we design and evaluate for soft-error resilience NV-latching circuits that can achieve intriguing features, such as low energy consumption, high computing performance, and superior soft errors tolerance, i.e., concurrently able to tolerate Multiple Node Upset (MNU), to potentially become a mainstream solution for the aerospace and avionic nanoelectronics. Together, these objectives cooperate to increase energy-efficiency and soft errors mitigation resiliency of larger-scale emerging NV latching circuits within iso-energy constraints. In summary, addressing these reliability concerns is paramount to successful deployment of future reliable and energy-efficient CMOS logic and spintronic memory architectures with deeply-scaled devices operating at low-voltages