Microwave flaw detector Patent

Surface defect detection by reflected microwave radiation patter

2-D iteratively reweighted least squares lattice algorithm and its application to defect detection in textured images

In this paper, a 2-D iteratively reweighted least squares lattice algorithm, which is robust to the outliers, is introduced and is applied to defect detection problem in textured images. First, the philosophy of using different optimization functions that results in weighted least squares solution in the theory of 1-D robust regression is extended to 2-D. Then a new algorithm is derived which combines 2-D robust regression concepts with the 2-D recursive least squares lattice algorithm. With this approach, whatever the probability distribution of the prediction error may be, small weights are assigned to the outliers so that the least squares algorithm will be less sensitive to the outliers. Implementation of the proposed iteratively reweighted least squares lattice algorithm to the problem of defect detection in textured images is then considered. The performance evaluation, in terms of defect detection rate, demonstrates the importance of the proposed algorithm in reducing the effect of the outliers that generally correspond to false alarms in classification of textures as defective or nondefective

Fabric defect detection using the wavelet transform in an ARM processor

Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations

Optical detection and modulation at 2µm-2.5µm in silicon

Recently the 2µm wavelength region has emerged as an exciting prospect for the next generation of telecommunications. In this paper we experimentally characterise silicon based plasma dispersion effect optical modulation and defect based photodetection in the 2-2.5µm wavelength range. It is shown that the effectiveness of the plasma dispersion effect is dramatically increased in this wavelength window as compared to the traditional telecommunications wavelengths of 1.3µm and 1.55µm. Experimental results from the defect based photodetectors show that detection is achieved in the 2-2.5µm wavelength range, however the responsivity is reduced as the wavelength is increased away from 1.55µm

Using FCA to Suggest Refactorings to Correct Design Defects

Design defects are poor design choices resulting in a hard-to- maintain software, hence their detection and correction are key steps of a\ud disciplined software process aimed at yielding high-quality software\ud artifacts. While modern structure- and metric-based techniques enable\ud precise detection of design defects, the correction of the discovered\ud defects, e.g., by means of refactorings, remains a manual, hence\ud error-prone, activity. As many of the refactorings amount to re-distributing\ud class members over a (possibly extended) set of classes, formal concept\ud analysis (FCA) has been successfully applied in the past as a formal\ud framework for refactoring exploration. Here we propose a novel approach\ud for defect removal in object-oriented programs that combines the\ud effectiveness of metrics with the theoretical strength of FCA. A\ud case study of a specific defect, the Blob, drawn from the\ud Azureus project illustrates our approach