A statistical noise model for a class of Physically Unclonable Functions

The interest in "Physically Unclonable Function"-devices has increased rapidly over the last few years, as they have several interesting properties for system security related applications like, for example, the management of cryptographic keys. Unfortunately, the output provided by these devices is noisy and needs to be corrected for these applications. Related error correcting mechanisms are typically constructed on the basis of an equal error probability for each output bit. This assumption does not hold for Physically Unclonable Functions, where varying error probabilities can be observed. This results in a generalized binomial distribution for the number of errors in the output. The intention of this paper is to discuss a novel Bayesian statistical model for the noise of an especially wide-spread class of Physically Unclonable Functions, which properly handles the varying output stability and also reflects the different noise behaviors observed in a collection of such devices. Furthermore, we compare several different methods for estimating the model parameters and apply the proposed model to concrete measurements obtained within the CODES research project in order to evaluate typical correction and stabilization approaches