5,100 research outputs found

    One-Class Classification: Taxonomy of Study and Review of Techniques

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    One-class classification (OCC) algorithms aim to build classification models when the negative class is either absent, poorly sampled or not well defined. This unique situation constrains the learning of efficient classifiers by defining class boundary just with the knowledge of positive class. The OCC problem has been considered and applied under many research themes, such as outlier/novelty detection and concept learning. In this paper we present a unified view of the general problem of OCC by presenting a taxonomy of study for OCC problems, which is based on the availability of training data, algorithms used and the application domains applied. We further delve into each of the categories of the proposed taxonomy and present a comprehensive literature review of the OCC algorithms, techniques and methodologies with a focus on their significance, limitations and applications. We conclude our paper by discussing some open research problems in the field of OCC and present our vision for future research.Comment: 24 pages + 11 pages of references, 8 figure

    TSE-IDS: A Two-Stage Classifier Ensemble for Intelligent Anomaly-based Intrusion Detection System

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    Intrusion detection systems (IDS) play a pivotal role in computer security by discovering and repealing malicious activities in computer networks. Anomaly-based IDS, in particular, rely on classification models trained using historical data to discover such malicious activities. In this paper, an improved IDS based on hybrid feature selection and two-level classifier ensembles is proposed. An hybrid feature selection technique comprising three methods, i.e. particle swarm optimization, ant colony algorithm, and genetic algorithm, is utilized to reduce the feature size of the training datasets (NSL-KDD and UNSW-NB15 are considered in this paper). Features are selected based on the classification performance of a reduced error pruning tree (REPT) classifier. Then, a two-level classifier ensembles based on two meta learners, i.e., rotation forest and bagging, is proposed. On the NSL-KDD dataset, the proposed classifier shows 85.8% accuracy, 86.8% sensitivity, and 88.0% detection rate, which remarkably outperform other classification techniques recently proposed in the literature. Results regarding the UNSW-NB15 dataset also improve the ones achieved by several state of the art techniques. Finally, to verify the results, a two-step statistical significance test is conducted. This is not usually considered by IDS research thus far and, therefore, adds value to the experimental results achieved by the proposed classifier

    Multiple Imputation Ensembles (MIE) for dealing with missing data

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    Missing data is a significant issue in many real-world datasets, yet there are no robust methods for dealing with it appropriately. In this paper, we propose a robust approach to dealing with missing data in classification problems: Multiple Imputation Ensembles (MIE). Our method integrates two approaches: multiple imputation and ensemble methods and compares two types of ensembles: bagging and stacking. We also propose a robust experimental set-up using 20 benchmark datasets from the UCI machine learning repository. For each dataset, we introduce increasing amounts of data Missing Completely at Random. Firstly, we use a number of single/multiple imputation methods to recover the missing values and then ensemble a number of different classifiers built on the imputed data. We assess the quality of the imputation by using dissimilarity measures. We also evaluate the MIE performance by comparing classification accuracy on the complete and imputed data. Furthermore, we use the accuracy of simple imputation as a benchmark for comparison. We find that our proposed approach combining multiple imputation with ensemble techniques outperform others, particularly as missing data increases

    Software defect prediction: do different classifiers find the same defects?

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    Open Access: This article is distributed under the terms of the Creative Commons Attribution 4.0 International License CC BY 4.0 (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.During the last 10 years, hundreds of different defect prediction models have been published. The performance of the classifiers used in these models is reported to be similar with models rarely performing above the predictive performance ceiling of about 80% recall. We investigate the individual defects that four classifiers predict and analyse the level of prediction uncertainty produced by these classifiers. We perform a sensitivity analysis to compare the performance of Random Forest, Naïve Bayes, RPart and SVM classifiers when predicting defects in NASA, open source and commercial datasets. The defect predictions that each classifier makes is captured in a confusion matrix and the prediction uncertainty of each classifier is compared. Despite similar predictive performance values for these four classifiers, each detects different sets of defects. Some classifiers are more consistent in predicting defects than others. Our results confirm that a unique subset of defects can be detected by specific classifiers. However, while some classifiers are consistent in the predictions they make, other classifiers vary in their predictions. Given our results, we conclude that classifier ensembles with decision-making strategies not based on majority voting are likely to perform best in defect prediction.Peer reviewedFinal Published versio
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