Critical hazard free test generation for asynchronous circuits

Journal ArticleWe describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. We propose a 6 valued algebra to generate these tests which are guaranteed to be critical hazard free under an unbounded delay model. This algebra has been incorporated in a D-algorithm based automatic test pattern generator

ACT: A DFT tool for self-timed circuits

Journal ArticleThis paper presents a Design for Testability (DFT) tool called ACT (Asynchronous Circuit Testing) which uses a partial scan technique to make macro-module based selftimed circuits testable. The ACT tool is the first oFits kind for testing macro-module based self-timed circuits. ACT modifies designs automatically to incorporate partial scan and provides a complete path from schematic capturie to physical layout. It also has a test generation system to generate vectors for the testable design and to compute fault coverage of the generated tests. The test generatioin system includes a module for doing critical hazard free (.est generation using a new 6-valued algebra. ACT has been hilt around commercial tools from Viewlogic and Cascade. A Viewlogic schematic is used as the design entry point and Cascade tools are used for technology mapping

Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

Testing of delay-insensitive circuits using protocol extraction strategies

Delay-insensitive (DI) circuits are asynchronous circuits whose functional correctness is independent of the delays in their components and the interconnecting wires. The environment and circuit module follows a specified usage protocol, sometimes called handshake signals. It has been believed that purely DI circuits are easy to test because any fault will prevent the generation of an acknowledge signal. We show that this is not always true under a general set of components. A Petri net fault model is used to reveal the possibility of critical races/hazards during test. A design for test method using observation points is shown which guarantees 100% fault coverage, and structural theorems are proved which can reduce/eliminate these observation points. No automated techniques exist so far for reducing the test length of these circuits, in particular, two-phase transition signaling circuits which contain implicit state encoding. Since there can be very few combinational components, classic scan design would not apply. A theory for control point insertion is presented for test length reduction. The major difficulty is in deriving a safe hazard-free test; the specified usage protocol does not directly apply because of the alterations made. Algorithms based on partial order protocol extraction and partial states are presented which produce provably correct test behaviors. Finally, an impossibility result is proved for fault tolerance in the most common class of DI circuit

Deductive Fault Simulation Technique for Asynchronous Circuits

Fault simulator for acpASC needs to deal with hazards, oscillations and races. The simplest algorithm for simulating faults is the serial fault simulation technique which was successfully used for the acpASC. Faster fault simulation techniques, for example deductive fault simulation, was previously used for the combinational and synchronous sequential circuits only. In this paper a deductive fault simulator for the stuck-at faults of acSI acpASC is presented. An algorithm for the propagation of the fault lists is proposed which can deal with the complex gates of the acpASC. The implemented deductive fault simulator was tested using acSI benchmark circuits. The experimental results show significant reduction of the computation time and negligible increase of the memory requirements in comparison with the serial fault simulation technique

DPA on quasi delay insensitive asynchronous circuits: formalization and improvement

The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a formal modeling of the electrical signature of QDI asynchronous circuits. The DPA is then applied to the formal model in order to identify the source of leakage of this type of circuits. Finally, a complete design flow is specified to minimize the information leakage. The relevancy and efficiency of the approach is demonstrated using the design of an AES crypto-processor.Comment: Submitted on behalf of EDAA (http://www.edaa.com/

Practical advances in asynchronous design and in asynchronous/synchronous interfaces

Journal ArticleAsynchronous systems are being viewed as an increasingly viable alternative to purely synchronous systems. This paper gives an overview of the current state of the art in practical asynchronous circuit and system design in four areas: controllers, datapaths, processors, and the design of asynchronous/synchronous interfaces

Hazards, Critical Races, and Metastability

The various modes of failure of asynchronous sequential logic circuits due to timing problems are considered. These are hazards, critical races and metastable states. It is shown that there is a mechanism common to all forms of hazards and to metastable states. A similar mechanism, with added complications, is shown to characterize critical races. Means for defeating various types of hazards and critical races through the use of one sided delay constraints are introduced. A method is described for determining from a flow table situations in which metastable states may be entered. A circuit technique for defeating metastability problems in self timed systems is presented. It is shown that the use of simulation for verifying the correctness of a circuit with given bounds on the branch delays cannot be relied upon to expose all timing problems. An example is presented that refutes the conjecture that replacing pure delays with inertial delays can only eliminate glitches. Key Words asynchronous, critical race, delays, dynamic hazards, essential hazards, inertial delays, metastability, pure delays, sequential logic, timing problems, timing simulation

Synthesis of multiple-input change asynchronous finite state machines

Asynchronous finite state machines (AFSMS) have been limited because multiple-input changes have been disallowed. In this paper, we present an architecture and synthesis system to overcome this limitation. The AFSM marks potentially hazardous state transitions, and prevents output during them. A synthesis tool to create the AFS M incorporates novel algorithms to detect the hazardous states

Fast Heuristic and Exact Algorithms for Two-Level Hazard-Free Logic Minimization

None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and automated circuit partitioning techniques. This paper introduces two new 2-level logic minimizers:ESPRESSO-HF, a heuristic method which is loosely based on ESPRESSO-II, and IMPYMIN, an exact method based on implicit data structures. Both minimizers can solve all currently available examples, which range up to 32 inputs and 33 outputs.These include examples that have never been solved before.For examples that can be solved by other minimizers our methods are several orders of magnitude faster. As by-products of these algorithms, we also present two additional results. First, we introduce a fast new algorithm to check if a hazard-free covering problem can feasibly be solved. Second, we introduce a novel formulation of the 2-level hazard-free logic minimization problem by capturing hazard-freedom constraints within a synchronous function by adding new variables