Thermomechanical fatigue failure of interfaces in lead-free solders

The European Union Waste Electrical and Electronic Equipment Directive (WEEE) and Restriction of Hazardous Substances Directive (RoHS) banned lead from electronic systems from July 1, 2006 onwards, which has led to much interest in leadfree solders in the past years. Among several lead-free solder alternatives, SnAgCu is a widely accepted replacement due to its better creep-fatigue resistance and microstructural stability. SnAgCu has been extensively studied in the past decade, however, there are still issues to be resolved concerning solder reliability, the underlying mechanisms of thermo-mechanical fatigue failure, fatigue life predictions and the overall effect of decreasing component size, driven by the ongoing miniaturization trend. This thesis aims to scientifically contribute to this subject by a coupled experimental-numerical approach. In solder joint reliability, the bump/pad interface has a crucial role, the quality of which is determined by the metallization and interfacial defects. Solder balls, solder paste and cast eutectic SnAgCu are reflowed on Cu, Ni/Au and Cu/Ni(V)/Au metallization layers and the substrate influence on the bulk and interfacial metallurgy is examined. The damage propagation at SnAgCu soldered joints on Cu and Ni/Au substrates are investigated and microstructure related damage localization is identified as the dominant failure mechanism. Therefore, continuum damage approaches are believed to be inadequate for solder joint reliability predictions. Nano-indentation and tensile testing is used for the mechanical characterization of SnAgCu. An assessment on indentation parameters for solders is conducted and the influence of the Ag content on material properties of SnAgCu is presented. One of the main causes of ball grid array (BGA) failure is thermo-mechanical fatigue crack propagation in the solder, which is almost always observed at the bump/pad junction. Motivated by this fact, a combined experimental-numerical study on the cyclic mechanical response of SnAgCu/Ni-Au interface is conducted. In this study, damage evolution at the bond/pad interface is characterized by dedicated fatigue tests. Local deformations leading to crack propagation are simulated by separation of interfaces through a cohesive zone approach. Solder joints are tested under cyclic shear and cyclic tension for different specimen sizes and strain amplitudes. Two different damagemechanisms are observed: local deformations in the bulk and at the bonding interface. The interfacial failure mode is typically favored at a high initial stress, and a small solder volume. Crack propagation is simulated by an irreversible linear traction-separation cohesive zone law accompanied by a non-linear interfacial damage parameter. Later, tensile and shear experiments are used to characterize the cohesive zone parameters for the normal and the tangential opening, respectively. Interfacial fatigue damage in BGA solders is caused by the difference in coefficient of thermal expansion (CTE) of the materials in the package. Apart from this thermal incompatibility in the package, Sn based solders are themselves prone to thermal fatigue damage due to the intrinsic thermal anisotropy of the ß-Sn phase. Thermal fatigue causes local deformations especially at the grain boundaries. Hence, the thermal fatigue response of bulk SnAgCu is investigated as well. Bulk SnAgCu specimens are thermally cycled between -40 and 125¿C and mechanically tested afterwards in order to quantify the thermal fatigue damage. A size dependent cyclic softening behavior is observed. Test specimens are individually modeled including the microstructure and local crystallographic orientations, on the basis of orientation imaging scans (OIM). Both thermal cycling and tensile testing are imposed as boundary conditions. Reproducing the experimental results in the simulations, parameters of a cohesive zone based intergranular fatigue damagemodel are identified. Finally, the intergranular damage law characterized in this study is combined with the bump/pad interfacial damage law, and a 2Dmicrostructure-incorporated fatigue life prediction tool is established. Using this tool, it is shown that the failure mode of a soldered joint depends extensively on its geometry. The model presented above is extended to 3D for a more complete description of the problem. To provide the microstructural input, a database containing OIM scans of several SnAgCu solder balls is constructed. A missing constituent in the model so far, interfacial defects, i.e. voids, are examined statistically using newly manufactured BGA packages, revealing information on their size, position and frequency. Combining all the data collected, i.e. material properties, microstructure, defects, local damage laws, a 3D slice model from a BGA package is constructed. The slice model contains a single solder ball connecting the board and the chip. A series of case studies is created using experimental input such as different microstructures and initial defects allowing a statistical analysis. Fatigue life of these models are predicted and the results are validated by failure distribution analyses of BGA packages provided by the industry. Here the critical solder ball assumption is made: if a solder ball fails, the electrical circuit of the BGA package is open, thus the package fails. Setting a critical damage value for the interfaces accumulating fatigue damage, a good agreement with the experiments and simulations is obtained. It is seen that microstructural modeling allows to predict and understand the scatter in the solder ball fatigue life observed in reality. Finally, the effect of solder ball size and geometry on interconnect reliability is dis cussed on the basis of numerical analyses. For this purpose, a geometry factor and a microstructure factor is defined, and their influence on damage evolution is discusse

MICROSTRUCTURAL CHARACTERIZATION AND THERMAL CYCLING RELIABILITY OF SOLDERS UNDER ISOTHERMAL AGING AND ELECTRICAL CURRENT

Solder joints on printed circuit boards provide electrical and mechanical connections between electronic devices and metallized patterns on boards. These solder joints are often the cause of failure in electronic packages. Solders age under storage and operational life conditions, which can include temperature, mechanical loads, and electrical current. Aging occurring at a constant temperature is called isothermal aging. Isothermal aging leads to coarsening of the bulk microstructure and increased interfacial intermetallic compounds at the solder-pad interface. The coarsening of the solder bulk degrades the creep properties of solders, whereas the voiding and brittleness of interfacial intermetallic compounds leads to mechanical weakness of the solder joint. Industry guidelines on solder interconnect reliability test methods recommend preconditioning the solder assemblies by isothermal aging before conducting reliability tests. The guidelines assume that isothermal aging simulates a "reasonable use period," but do not relate the isothermal aging levels with specific use conditions. Studies on the effect of isothermal aging on the thermal cycling reliability of tin-lead and tin-silver-copper solders are limited in scope, and results have been contradictory. The effect of electrical current on solder joints has been has mostly focused on current densities above 104A/cm2 with high ambient temperature (≥100oC), where electromigration, thermomigration, and Joule heating are the dominant failure mechanisms. The effect of current density below 104A/cm2 on temperature cycling fatigue of solders has not been established. This research provides the relation between isothermal aging and the thermal cycling reliability of select Sn-based solders. The Sn-based solders with 3%, 1%, and 0% silver content that have replaced tin-lead are studied and compared against tin-lead solder. The activation energy and growth exponents of the Arrhenius model for the intermetallic growth in the solders are provided. An aging metric to quantify the aging of solder joints, in terms of phase size in the solder bulk and interfacial intermetallic compound thickness at the solder-pad interface, is established. Based on the findings of thermal cycling tests on aged solder assemblies, recommendations are made for isothermal aging of solders before thermal cycling tests. Additionally, the effect of active electrical current at 103 A/cm2 on thermal cycling reliability is reported

Thermomechanical fatigue failure of interfaces in lead-free solders

The European Union Waste Electrical and Electronic Equipment Directive (WEEE) and Restriction of Hazardous Substances Directive (RoHS) banned lead from electronic systems from July 1, 2006 onwards, which has led to much interest in leadfree solders in the past years. Among several lead-free solder alternatives, SnAgCu is a widely accepted replacement due to its better creep-fatigue resistance and microstructural stability. SnAgCu has been extensively studied in the past decade, however, there are still issues to be resolved concerning solder reliability, the underlying mechanisms of thermo-mechanical fatigue failure, fatigue life predictions and the overall effect of decreasing component size, driven by the ongoing miniaturization trend. This thesis aims to scientifically contribute to this subject by a coupled experimental-numerical approach. In solder joint reliability, the bump/pad interface has a crucial role, the quality of which is determined by the metallization and interfacial defects. Solder balls, solder paste and cast eutectic SnAgCu are reflowed on Cu, Ni/Au and Cu/Ni(V)/Au metallization layers and the substrate influence on the bulk and interfacial metallurgy is examined. The damage propagation at SnAgCu soldered joints on Cu and Ni/Au substrates are investigated and microstructure related damage localization is identified as the dominant failure mechanism. Therefore, continuum damage approaches are believed to be inadequate for solder joint reliability predictions. Nano-indentation and tensile testing is used for the mechanical characterization of SnAgCu. An assessment on indentation parameters for solders is conducted and the influence of the Ag content on material properties of SnAgCu is presented. One of the main causes of ball grid array (BGA) failure is thermo-mechanical fatigue crack propagation in the solder, which is almost always observed at the bump/pad junction. Motivated by this fact, a combined experimental-numerical study on the cyclic mechanical response of SnAgCu/Ni-Au interface is conducted. In this study, damage evolution at the bond/pad interface is characterized by dedicated fatigue tests. Local deformations leading to crack propagation are simulated by separation of interfaces through a cohesive zone approach. Solder joints are tested under cyclic shear and cyclic tension for different specimen sizes and strain amplitudes. Two different damagemechanisms are observed: local deformations in the bulk and at the bonding interface. The interfacial failure mode is typically favored at a high initial stress, and a small solder volume. Crack propagation is simulated by an irreversible linear traction-separation cohesive zone law accompanied by a non-linear interfacial damage parameter. Later, tensile and shear experiments are used to characterize the cohesive zone parameters for the normal and the tangential opening, respectively. Interfacial fatigue damage in BGA solders is caused by the difference in coefficient of thermal expansion (CTE) of the materials in the package. Apart from this thermal incompatibility in the package, Sn based solders are themselves prone to thermal fatigue damage due to the intrinsic thermal anisotropy of the ß-Sn phase. Thermal fatigue causes local deformations especially at the grain boundaries. Hence, the thermal fatigue response of bulk SnAgCu is investigated as well. Bulk SnAgCu specimens are thermally cycled between -40 and 125¿C and mechanically tested afterwards in order to quantify the thermal fatigue damage. A size dependent cyclic softening behavior is observed. Test specimens are individually modeled including the microstructure and local crystallographic orientations, on the basis of orientation imaging scans (OIM). Both thermal cycling and tensile testing are imposed as boundary conditions. Reproducing the experimental results in the simulations, parameters of a cohesive zone based intergranular fatigue damagemodel are identified. Finally, the intergranular damage law characterized in this study is combined with the bump/pad interfacial damage law, and a 2Dmicrostructure-incorporated fatigue life prediction tool is established. Using this tool, it is shown that the failure mode of a soldered joint depends extensively on its geometry. The model presented above is extended to 3D for a more complete description of the problem. To provide the microstructural input, a database containing OIM scans of several SnAgCu solder balls is constructed. A missing constituent in the model so far, interfacial defects, i.e. voids, are examined statistically using newly manufactured BGA packages, revealing information on their size, position and frequency. Combining all the data collected, i.e. material properties, microstructure, defects, local damage laws, a 3D slice model from a BGA package is constructed. The slice model contains a single solder ball connecting the board and the chip. A series of case studies is created using experimental input such as different microstructures and initial defects allowing a statistical analysis. Fatigue life of these models are predicted and the results are validated by failure distribution analyses of BGA packages provided by the industry. Here the critical solder ball assumption is made: if a solder ball fails, the electrical circuit of the BGA package is open, thus the package fails. Setting a critical damage value for the interfaces accumulating fatigue damage, a good agreement with the experiments and simulations is obtained. It is seen that microstructural modeling allows to predict and understand the scatter in the solder ball fatigue life observed in reality. Finally, the effect of solder ball size and geometry on interconnect reliability is dis cussed on the basis of numerical analyses. For this purpose, a geometry factor and a microstructure factor is defined, and their influence on damage evolution is discusse

A Finite Element approach to understanding constitutive elasto-plastic, visco-plastic behaviour in lead free micro-electronic BGA structures

This work investigates the non-linear elasto-plastic and visco-plastic behaviour of lead free solder material and soldered joints. Specifically, Finite Element (FE) tools were used to better understand the deformations within Ball Grid Array solder joints (BGA), and numerical and analytical methods were developed to quantify the identified constituent deformations. FE material models were based on the same empirical constitutive models (elastic, plastic and creep) used in analytical calculations. The current work recognises the large number of factors influencing material behaviour which has led to a wide range of published material properties for near eutectic SnAgCu alloys. The work discovered that the deformation within the BGA was more complex than is generally assumed in the literature. It was shown that shear deformation of the solder ball could account for less than 5% of total measured displacement in BGA samples. Shear displacement and rotation of the solder balls relative to the substrate are sensitive to the substrate orthotropic properties and substrate geometry (relative to solder volume and array pattern). The FE modelling was used to derive orthotropic FR4 properties independently using published data. An elastic modulus for Sn3.8Ag0.7Cu was measured using homologous temperatures below 0.3. Suggested values of Abaqus-specific creep parameters m and f (not found in literature) for Sn3.8Ag0.7Cu have been validated with published data. Basic verification against simple analytical calculations has given a better understanding of the components of overall specimen displacement that is normally missing from empirical validation alone. A combined approach of numerical and analytical modelling of BGAs, and mechanical tests, is recommended to harmonise published work, exploit new material data and for more informed analysis of new configurationsEPSRC-funded PhD studentshi

An Investigation of Reliability of High Density Electronic Package-to-Board Interconnections from the Perspective of Solder Joint Metallurgy

The integration and miniaturization trend of the electronic packaging leads to much finer pitch of the device and package lead terminations. Several reliability concerns and issues that were previously not encountered are now surfacing. The objective of this thesis work is to investigate the reliability of the package-to-board interconnection from the perspective of solder joint metallurgy. It was carried out with several advanced packages such as CSP, WLCSP and leadless ceramic packages on organic laminate PWBs using tin-silver-copper based interconnection materials. The assemblies were subjected to several loading conditions and levels such as thermal, mechanical, and environmental stresses. As expected, the board level reliability (BLR) of electronic assemblies strongly depended on microstructure and morphology of the solder joints. Dispersion strengthening effect of the intermetallic compounds (IMCs), coarsening of the IMC particles, strain rate hardening, solder fatigue, and recrystallization of Sn grains in the highly stressed areas were observed. These were found to directly impact Pb-free solder joint reliability. Appropriate thermal aging can improve joint reliability up to 50% due to coarsening of the IMC particles. In addition, other factors such as dissolution of metals, interfacial reactions, IMC spalling, and cross interaction of surface materials on the two sides of the joints were also observed and discussed. The effects can be expressed as a series of interactive relationships: materials (pad surface materials and solder alloy composition) and/or soldering process lead to microstructure change in bulk solder and/or at interface, which in turn leads to joint reliability variation

Growth of the IMC at the interface of SnAgCuBi (Bi = 0,5; 1,0) solder joints with Cu substrate

Ovdje se analizira utjecaj dodavanja Bi na stvaranje intermetalne faze u bezolovno lemljenim spojevima od Sn-Ag-0.5Cu0.5Bi (SAC0,5B) i Sn-Ag-0.5Cu-1.0Bi (SAC1,0B), sastav dan u težinskim %, na bakrenoj podlozi. Lemljenje bakrene ploče je provedeno na 255 °C u trajanju od 5 s. Spojevi su zatim ostavljeni na temperaturi od 100 °C, 130 °C i 160 °C u trajanju od 1, 3, 7, 15 dana u konvekcijskoj peći. Međupovršine su tada analizirane optičkim mikroskopom i energetskom disperzivnom rendgenskom spektrometrijskom mikroanalizom (EDX, JEOL-JXA-840A). Dva intermetalna sloja su zapažena na međupovršini - Cu3Sn i Cu6Sn5. Sloj Cu6Sn5 je nastao tijekom lemljenja. Sloj Cu3Sn je nastao tijekom sazrijevanja u čvrstom stanju. Dodavanjem Bi smanjuje se nastanak Cu3Sn jer se tako sprječava širenje Sn duž granica zrna. U članku se dalje raspravlja mehanizam nastanka sloja Cu6Sn5 i daju se zaključci za optimalni kemijski sastav lemila.The effects of Bi addition on the intermetallic phase formation in the lead-free solder joints of Sn-Ag-0.5Cu0.5Bi (SAC0,5B) and Sn-Ag-0.5Cu-1.0Bi (SAC1,0B), composition given in weight (measured in %), with copper substrate are studied. The soldering of the copper plate was conducted at 255 °C for 5 s. The joints were subsequently aged at temperatures of 100 °C, 130 °C and 160 °C for 1, 3, 7, 15 days in a convection oven. The aged interfaces were analysed by the optical microscopy and energy dispersive x-ray spectrometry (EDX, JEOL-JXA-840A) microanalysis. Two intermetallic layers are observed at the interface – Cu3Sn and Cu6Sn5. Cu6Sn5 is formed during soldering. Cu3Sn is formed during solid state ageing. Bi decreases the growth rate of Cu3Sn since it can possibly inhibit Sn diffusion along the grain boundaries. The mechanism of the Cu6Sn5 layer growth is discussed and the conclusions for the optimal solder chemical composition are presented

The durability of solder joints under thermo-mechanical loading; application to Sn-37Pb and Sn-3.8Ag-0.7Cu lead-free replacement alloy

Solder joints in electronic packages provide mechanical, electrical and thermal connections. Hence, their reliability is also a major concern to the electronic packaging industry. Ball Grid Arrays (BGAs) are a very common type of surface mount technology for electronic packaging. This work primarily addresses the thermo-mechanical durability of BGAs and is applied to the exemplar alloys; traditional leaded solder and a popular lead-free solder. Isothermal mechanical fatigue tests were carried out on 4-ball test specimens of the lead-free (Sn-3.8Ag-0.7Cu) and leaded (Sn-37Pb) solder under load control at room temperature, 35°C and 75°C. As well as this, a set of combined thermal and mechanical cycling tests were carried out, again under load control with the thermal cycles either at a different frequency from the mechanical cycles (not-in-phase) or at the same frequency (both in phase and out-of-phase). The microstructural evaluation of both alloys was investigated by carrying out a series of simulated ageing tests, coupled with detailed metallurgical analysis and hardness testing. The results were treated to produce stress-life, cyclic behaviour and creep curves for each of the test conditions. Careful calibration allowed the effects of substrate and grips to be accounted for and so a set of strain-life curves to be produced. These results were compared with other results from the literature taking into account the observations on microstructure made in the ageing tests. It is generally concluded that the TMF performance is better for the Sn-Ag-Cu alloy than for the Sn-Pb alloy, when expressed as stress-life curves. There is also a significant effect on temperature and phase for each of the alloys, the Sn-Ag-Cu being less susceptible to these effects. When expressed as strain life, the effects of temperature, phase and alloy type are much diminished. Many of these conclusions coincided with only parts of the literature and reasons for the remaining differences are advanced

Mechanical behaviour and reliability of Sn3.8AgO.7Cu solder for a surface mount assembly

The demands for compact, light weight and Iow cost electronic products have resulted in the miniaturisation of solder interconnects to a sub-millimetre scale. With such a reduction in size, the solder joints cannot be assumed to behave in the same way as bulk solder in terms of reliability due to the fact that their material behaviours are influenced by the joint size and microstructure. The complexity of their reliability assessment is furthermore compounded by the demand for the replacement of traditional SnPb solder alloys with lead-free alloys, due to the presence of the toxic and health hazardous element (Pb) in the former alloy. However, these new lead-free alloys have much less history of industrial applications, and their material and reliability data is not as well developed as traditional lead-based alloys. In addition, most previous reliability assessments using finite element analysis have assumed a uniform distribution of temperature within the electronic assembly, which conflicts the actual temperature conditions during circuit operation. Therefore, this research was undertaken to analyse the effect of solder joint size on solder material properties from which material models were developed, and to determine the effect of an actual (nonuniform) temperature distribution in an electronic assembly on the reliability of its solder joints. Following a review of lead-free solders and potential lead-free alloys, lead-free solder microstructures, and the reliability issues and factors affecting the reliability of solder joints, the practical aspects of this research were carried out in two main parts. The first part consisted of substantial work on the experimental determination of the temperature distribution in a typical surface mount chip resistor assembly for power cycling conditions, and the stress-strain and creep behaviour for both Sn3.8AgO.7Cu solder joints and reflowed bulk solder. This also included building material models based on the experimental data for the solder joints tested and comparison with that for bulk solder. Based on the comparison of the material properties, two extreme material models were selected for the reliability study. Size and microstructure effects on the solder material properties were also discussed in this part. The second part comprised of extensive finite element analysis of a surface mount chip resistor assembly and reliability assessment of its solder joints. The simulation began with elasto-plastic analysis for 2D and 3D chip resistor assemblies to decide upon the kind of formulation to be used when the full complexity of both plasticity and creep is considered. The simulation was carried out considering the determined non-uniform temperature distribution and idealized or traditional uniform temperature condition. The solder joint's material properties were modelled using the two material models determined from the experimental results. The effect of temperature distribution during thermal cycling and of the selected material models on the solder joint reliability was demonstrated using finite element analysis and subsequent fatigue life estimation. In summary, this research has concluded that the material behaviour of the solder joint is different from that of bulk solder due to the effect of its size and microstructure. The anisotropic behaviour of the solder joint cannot be ignored in reliability studies, since it has a significant effect on the solder joint's fatigue life. The research also showed the significant effect of an actual (non-uniform) temperature distribution in the electronic assembly on the solder joint fatigue life

PERFORMANCE ASSESSMENT OF MEMS GYROSCOPE AND SHOCK DURABILITY EVALUATION OF SAC305-X SOLDERS FOR HIGH TEMPERATURE APPLICATIONS

Recent advances in MEMS technology have resulted in relatively low cost MEMS gyroscopes. Their unique features compared to macro-scale devices, such as lighter weight, smaller size, and less power consumption, have made them popular in many applications with environmental conditions ranging from mild to harsh. This dissertation aims to address a gap in the literature on MEMS gyroscopes by investigating the effects of elevated temperatures on the performance of MEMS gyroscopes. MEMS gyroscopes are characterized at room and elevated temperatures for both stationary and rotary conditions. During the test, MEMS gyroscopes are subjected to five thermal cycles at each of four temperature ranges (viz. 25degC to 85degC, 25degC to 125degC, 25degC to 150degC and 25degC to 175degC). A simulation model is developed in MATLAB Simulink to simulate the temperature effect on the MEMS gyroscope. Simulation results show good agreement with experimental results and confirm that Young's modulus and damping coefficient are the dominant factors responsible for temperature-dependent bias at elevated temperatures. Solder interconnects are one of the weakest elements in MEMS devices. Thus, the reliability of solder interconnects is separately studied in this dissertation. Though, SAC305 (96.5%Sn3.0%Ag0.5%Cu) is the industry preferred solder in combined thermal cycling and shock/drop environments, it exhibits better thermal cycling reliability than drop/shock reliability. One of the ways to improve drop/shock reliability of SnAgCu solder is by microalloy addition of various dopants such as Mn, Ce, Ti, Y, Ge, Bi, Zn, In, Ni, Co etc. Thus, the second part of this dissertation aims to evaluate the shock durability of SAC305 and SAC305-X (where X refers to two different concentrations of Mn and Ce dopants). High temperature isothermal aging tests are conducted on selected solders using QFN44, QFN32 and R2512 package types at 185degC and 200degC up to 1000 hours. Isothermal aging test results showed that interfacial IMC growth reduction can be achieved by microalloy addition of selected dopants in SAC305 on both copper and nickel leaded package types. Shock durability of selected solders is examined on as-reflowed and thermally aged test boards. Mechanical shock is performed using a custom shock machine that utilizes a shock pulse of 500G with a 1.3 millisecond duration. The shock test results showed that the mechanical shock reliability of SAC305 was significantly improved on both as-reflowed and thermally aged test boards by microalloy addition of one of the selected dopant in SAC305