Independent component analysis of interictal fMRI in focal epilepsy: comparison with general linear model-based EEG-correlated fMRI

The general linear model (GLM) has been used to analyze simultaneous EEG–fMRI to reveal BOLD changes linked to interictal epileptic discharges (IED) identified on scalp EEG. This approach is ineffective when IED are not evident in the EEG. Data-driven fMRI analysis techniques that do not require an EEG derived model may offer a solution in these circumstances. We compared the findings of independent components analysis (ICA) and EEG-based GLM analyses of fMRI data from eight patients with focal epilepsy. Spatial ICA was used to extract independent components (IC) which were automatically classified as either BOLD-related, motion artefacts, EPI-susceptibility artefacts, large blood vessels, noise at high spatial or temporal frequency. The classifier reduced the number of candidate IC by 78%, with an average of 16 BOLD-related IC. Concordance between the ICA and GLM-derived results was assessed based on spatio-temporal criteria. In each patient, one of the IC satisfied the criteria to correspond to IED-based GLM result. The remaining IC were consistent with BOLD patterns of spontaneous brain activity and may include epileptic activity that was not evident on the scalp EEG. In conclusion, ICA of fMRI is capable of revealing areas of epileptic activity in patients with focal epilepsy and may be useful for the analysis of EEG–fMRI data in which abnormalities are not apparent on scalp EEG

The DDG^G-classifier in the functional setting

The Maximum Depth was the first attempt to use data depths instead of multivariate raw data to construct a classification rule. Recently, the DD-classifier has solved several serious limitations of the Maximum Depth classifier but some issues still remain. This paper is devoted to extending the DD-classifier in the following ways: first, to surpass the limitation of the DD-classifier when more than two groups are involved. Second to apply regular classification methods (like $k$NN, linear or quadratic classifiers, recursive partitioning,...) to DD-plots to obtain useful insights through the diagnostics of these methods. And third, to integrate different sources of information (data depths or multivariate functional data) in a unified way in the classification procedure. Besides, as the DD-classifier trick is especially useful in the functional framework, an enhanced revision of several functional data depths is done in the paper. A simulation study and applications to some classical real datasets are also provided showing the power of the new proposal.Comment: 29 pages, 6 figures, 6 tables, Supplemental R Code and Dat

Atomic electron tomography in three and four dimensions

Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. Here, we review the recent experimental and algorithmic developments of AET and highlight several groundbreaking experiments, which include pinpointing the 3D atom positions and chemical order/disorder in technologically relevant materials and capturing how atoms rearrange during early nucleation at four-dimensional atomic resolution