Transistor-Level Synthesis of Pipeline Analog-to-Digital Converters Using a Design-Space Reduction Algorithm

A novel transistor-level synthesis procedure for pipeline ADCs is presented. This procedure is able to directly map high-level converter specifications onto transistor sizes and biasing conditions. It is based on the combination of behavioral models for performance evaluation, optimization routines to minimize the power and area consumption of the circuit solution, and an algorithm to efficiently constraint the converter design space. This algorithm precludes the cost of lengthy bottom-up verifications and speeds up the synthesis task. The approach is herein demonstrated via the design of a 0.13 μm CMOS 10 bits@60 MS/s pipeline ADC with energy consumption per conversion of only 0.54 pJ@1 MHz, making it one of the most energy-efficient 10-bit video-rate pipeline ADCs reported to date. The computational cost of this design is of only 25 min of CPU time, and includes the evaluation of 13 different pipeline architectures potentially feasible for the targeted specifications. The optimum design derived from the synthesis procedure has been fine tuned to support PVT variations, laid out together with other auxiliary blocks, and fabricated. The experimental results show a power consumption of 23 [email protected] V and an effective resolution of 9.47-bit@1 MHz. Bearing in mind that no specific power reduction strategy has been applied; the mentioned results confirm the reliability of the proposed approach.Ministerio de Ciencia e Innovación TEC2009-08447Junta de Andalucía TIC-0281

Simulation-based high-level synthesis of Nyquist-rate data converters using MATLAB/SIMULINK

This paper presents a toolbox for the simulation, optimization and high-level synthesis of Nyquist-rate Analog-to-Digital (A/D) and Digital-to-Analog (D/A) Converters in MATLAB®. The embedded simulator uses SIMULINK® C-coded S-functions to model all required subcircuits including their main error mechanisms. This approach allows to drastically speed up the simulation CPU-time up to 2 orders of magnitude as compared with previous approaches - based on the use of SIMULINK® elementary blocks. Moreover, S-functions are more suitable for implementing a more detailed description of the circuit. For all subcircuits, the accuracy of the behavioral models has been verified by electrical simulation using HSPICE. For synthesis purposes, the simulator is used for performance evaluation and combined with an hybrid optimizer for design parameter selection. The optimizer combines adaptive statistical optimization algorithm inspired in simulated annealing with a design-oriented formulation of the cost function. It has been integrated in the MATLAB/SIMULINK® platform by using the MATLAB® engine library, so that the optimization core runs in background while MATLAB® acts as a computation engine. The implementation on the MATLAB® platform brings numerous advantages in terms of signal processing, high flexibility for tool expansion and simulation with other electronic subsystems. Additionally, the presented toolbox comprises a friendly graphical user interface to allow the designer to browse through all steps of the simulation, synthesis and post-processing of results. In order to illustrate the capabilities of the toolbox, a 0.13)im CMOS 12bit@80MS/s analog front-end for broadband power line communications, made up of a pipeline ADC and a current steering DAC, is synthesized and high-level sized. Different experiments show the effectiveness of the proposed methodology.Ministerio de Ciencia y Tecnología TIC2003-02355RAICONI

Calibration of pipeline ADC with pruned Volterra kernels

A Volterra model is used to calibrate a pipeline ADC simulated in Cadence Virtuoso using the STMicroelectronics CMOS 45 nm process. The ADC was designed to work at 50 MSps, but it is simulated at up to 125 MSps, proving that calibration using a Volterra model can significantly increase sampling frequency. Equivalent number of bits (ENOB) improves by 1-2.5 bits (6-15 dB) with 37101 model parameters. The complexity of the calibration algorithm is reduced using different lengths for each Volterra kernels and performing iterative pruning. System identification is performed by least squares techniques with a set of sinusoids at different frequencies spanning the whole Nyquist band. A comparison with simplified Volterra models proposed in the literature shows better performance for the pruned Volterra model with comparable complexity, improving linearity by as much as 1.5 bits more than the other techniques

A 13-bit, 2.2-MS/s, 55-mW multibit cascade ΣΔ modulator in CMOS 0.7-μm single-poly technology

This paper presents a CMOS 0.7-μm ΣΔ modulator IC that achieves 13-bit dynamic range at 2.2 MS/s with an oversampling ratio of 16. It uses fully differential switched-capacitor circuits with a clock frequency of 35.2 MHz, and has a power consumption of 55 mW. Such a low oversampling ratio has been achieved through the combined usage of fourth-order filtering and multibit quantization. To guarantee stable operation for any input signal and/or initial condition, the fourth-order shaping function has been realized using a cascade architecture with three stages; the first stage is a second-order modulator, while the others are first-order modulators - referred to as a 2-1-1mb architecture. The quantizer of the last stage is 3 bits, while the other quantizers are single bit. The modulator architecture and coefficients have been optimized for reduced sensitivity to the errors in the 3-bit quantization process. Specifically, the 3-bit digital-to-analog converter tolerates 2.8% FS nonlinearity without significant degradation of the modulator performance. This makes the use of digital calibration unnecessary, which is a key point for reduced power consumption. We show that, for a given oversampling ratio and in the presence of 0.5% mismatch, the proposed modulator obtains a larger signal-to-noise-plus-distortion ratio than previous multibit cascade architectures. On the other hand, as compared to a 2-1-1single-bit modulator previously designed for a mixed-signal asymmetrical digital subscriber line modem in the same technology, the modulator in this paper obtains one more bit resolution, enhances the operating frequency by a factor of two, and reduces the power consumption by a factor of four.Comisión Interministerial de Ciencia y Tecnología TIC97-0580European Commission ESPRIT 879

Nonlinear models and algorithms for RF systems digital calibration

Focusing on the receiving side of a communication system, the current trend in pushing the digital domain ever more closer to the antenna sets heavy constraints on the accuracy and linearity of the analog front-end and the conversion devices. Moreover, mixed-signal implementations of Systems-on-Chip using nanoscale CMOS processes result in an overall poorer analog performance and a reduced yield. To cope with the impairments of the low performance analog section in this "dirty RF" scenario, two solutions exist: designing more complex analog processing architectures or to identify the errors and correct them in the digital domain using DSP algorithms. In the latter, constraints in the analog circuits' precision can be offloaded to a digital signal processor. This thesis aims at the development of a methodology for the analysis, the modeling and the compensation of the analog impairments arising in different stages of a receiving chain using digital calibration techniques. Both single and multiple channel architectures are addressed exploiting the capability of the calibration algorithm to homogenize all the channels' responses of a multi-channel system in addition to the compensation of nonlinearities in each response. The systems targeted for the application of digital post compensation are a pipeline ADC, a digital-IF sub-sampling receiver and a 4-channel TI-ADC. The research focuses on post distortion methods using nonlinear dynamic models to approximate the post-inverse of the nonlinear system and to correct the distortions arising from static and dynamic errors. Volterra model is used due to its general approximation capabilities for the compensation of nonlinear systems with memory. Digital calibration is applied to a Sample and Hold and to a pipeline ADC simulated in the 45nm process, demonstrating high linearity improvement even with incomplete settling errors enabling the use of faster clock speeds. An extended model based on the baseband Volterra series is proposed and applied to the compensation of a digital-IF sub-sampling receiver. This architecture envisages frequency selectivity carried out at IF by an active band-pass CMOS filter causing in-band and out-of-band nonlinear distortions. The improved performance of the proposed model is demonstrated with circuital simulations of a 10th-order band pass filter, realized using a five-stage Gm-C Biquad cascade, and validated using out-of-sample sinusoidal and QAM signals. The same technique is extended to an array receiver with mismatched channels' responses showing that digital calibration can compensate the loss of directivity and enhance the overall system SFDR. An iterative backward pruning is applied to the Volterra models showing that complexity can be reduced without impacting linearity, obtaining state-of-the-art accuracy/complexity performance. Calibration of Time-Interleaved ADCs, widely used in RF-to-digital wideband receivers, is carried out developing ad hoc models because the steep discontinuities generated by the imperfect canceling of aliasing would require a huge number of terms in a polynomial approximation. A closed-form solution is derived for a 4-channel TI-ADC affected by gain errors and timing skews solving the perfect reconstruction equations. A background calibration technique is presented based on cyclo-stationary filter banks architecture. Convergence speed and accuracy of the recursive algorithm are discussed and complexity reduction techniques are applied

Error modeling, self-calibration and design of pipelined analog to digital converters

Typescript (photocopy).As the field of signal processing accelerates toward the use of high performance digital techniques, there is a growing need for increasingly fast and accurate analog to digital converters. Three highly visible examples of this trend originated in the last decade. The advent of the compact disc revolutionized the way high-fidelity audio is stored, reproduced, recorded and processed. Digital communication links, fiber optic cables and in the near future ISDN networks (Integrated Services Digital Network) are steadily replacing major portions of telephone systems. Finally, video-conferencing, multi-media computing and currently emerging high definition television (HDTV) systems rely more and more on real-time digital data compression and image enhancing techniques. All these applications rely on analog to digital conversion. In the field of digital audio, the required conversion accuracy is high, but the conversion speed limited (16 bits, 2 x 20 kHz signal bandwidth). In the field of image processing, the required accuracy is less, but the data conversion speed high (8-10 bits, 5-20MHz bandwidth). New applications keep pushing for increasing conversion rates and simultaneously higher accuracies. This dissertation discusses new analog to digital converter architectures that could accomplish this. As a consequence of the trend towards digital processing, prominent analog designers throughout the world have engaged in very active research on the topic of data conversion. Unfortunately, literature has not always kept up. At the time of this writing, it seemed rather difficult to find detailed fundamental publications about analog to digital converter design. This dissertation represents a modest attempt to remedy this situation. It is hoped that anyone with a back-ground in analog design could go through this work and pick up the fundamentals of converter operation, as well as a number of more advanced design techniques

Highly Linear 2,5-V CMOS ΣΔ Modulator for ADSL+

We present a 90-dB spurious-free dynamic range sigma–delta modulator (ΣΔM) for asymmetric digital subscriber line applications (both ADSL and ADSL+), with up to a 4.4-MS/s digital output rate. It uses a cascade (MASH) multibit architecture and has been implemented in a 2.5-V supply, 0.25μm CMOS process with metal–insulator–metal capacitors. The prototypes feature 78-dB dynamic range (DR) in the 30-kHz to 2.2-MHz band (ADSL+) and 85-dB DR in the 30-kHz to 1.1-MHz band (ADSL). Integral and differential nonlinearity are within +/-0.85 and +/-0.80 LSB, respectively. The ΣΔ modulator and its auxiliary blocks (clock phase and reference voltage generators, and I/O buffers) dissipate 65.8 mW. Only 55 mW are dissipated in the ΣΔ modulator.This work was supported by the European Union under IST Project 29261/MIXMODEST and IST Project 2001-34283/TAMES-2 and the Spanish MCyT and the ERDF under Project TIC2001-0929/ADAVERE.This work was supported by the European Union under IST Project 29261/MIXMODEST and IST Project 2001-34283/TAMES-2 and the Spanish MCyT and the ERDF under Project TIC2001-0929/ADAVERE.Peer reviewe

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Built-in self-test and self-calibration for analog and mixed signal circuits

Analog-to-digital converters (ADC) are one of the most important components in modern electronic systems. In the mission-critical applications such as automotive, the reliability of the ADC is critical as the ADC impacts the system level performance. Due to the aging effect and environmental changes, the performance of the ADC may degrade and even fail to meet the accuracy requirement over time. Built-in self-test (BIST) and self-calibration are becoming the ultimate solution to achieve lifetime reliability. This dissertation introduces two ADC testing algorithms and two ADC built-in self-test circuit implementations to test the ADC integral nonlinearity (INL) and differential nonlinearity (DNL) on-chip. In the first testing algorithm, the ultrafast stimulus error removal and segmented model identification of linearity errors (USER-SMILE) is developed for ADC built-in self-test, which eliminates the need for precision stimulus and reduces the overall test time. In this algorithm, the ADC is tested twice with a nonlinear ramp, instead of using a linear ramp signal. Therefore, the stimulus can be easily generated on-chip in a low-cost way. For the two ramps, there is a constant voltage shift in between. As the input stimulus linearity is completely relaxed, there is no requirement on the waveform of the input stimulus as long as it covers the ADC input range. In the meantime, the high-resolution ADC linearity is modeled with segmented parameters, which reduces the number of samples required for achieving high-precision test, thus saving the test time. As a result, the USER-SMILE algorithm is able to use less than 1 sample/code nonlinear stimulus to test high resolution ADCs with less than 0.5 least significant bit (LSB) INL estimation error, achieving more than 10-time test time reduction. This algorithm is validated with both board-level implementation and on-chip silicon implementation. The second testing algorithm is proposed to test the INL/DNL for multi-bit-per-stages pipelined ADCs with reduced test time and better test coverage. Due to the redundancy characteristics of multi-bit-per-stages pipelined ADC, the conventional histogram test cannot estimate and calibrate the static linearity accurately. The proposed method models the pipelined ADC nonlinearity as segmented parameters with inter-stage gain errors using the raw codes instead of the final output codes. During the test phase, a pure sine wave is sent to the ADC as the input and the model parameters are estimated from the output data with the system identification method. The modeled errors are then removed from the digital output codes during the calibration phase. A high-speed 12-bit pipelined ADC is tested and calibrated with the proposed method. With only 4000 samples, the 12-bit ADC is accurately tested and calibrated to achieve less than 1 LSB INL. The ADC effective number of bits (ENOB) is improved from 9.7 bits to 10.84 bits and the spurious-free dynamic range (SFDR) is improved by more than 20dB after calibration. In the first circuit implementation, a low-cost on-chip built-in self-test solution is developed using an R2R digital-to-analog converter (DAC) structure as the signal generator and the voltage shift generator for ADC linearity test. The proposed DAC is a subradix-2 R2R DAC with a constant voltage shift generation capability. The subradix-2 architecture avoids positive voltage gaps caused by mismatches, which relaxes the DAC matching requirements and reduces the design area. The R2R DAC based BIST circuit is fabricated in TSMC 40nm technology with a small area of 0.02mm^2. Measurement results show that the BIST circuit is capable of testing a 15-bit ADC INL accurately with less than 0.5 LSB INL estimation error. In the second circuit implementation, a complete SAR ADC built-in self-test solution using the USER-SMILE is developed and implemented in a 28nm automotive microcontroller. A low-cost 12-bit resistive DAC with less than 12-bit linearity is used as the signal generator to test and calibrate a SAR ADC with a target linearity of 12 bits. The voltage shift generation is created inside the ADC with capacitor switching. The entire algorithm processing unit for USER-SMILE algorithm is also implemented on chip. The final testing results are saved in the memory for further digital calibration. Both the total harmonic distortion (THD) and the SFDR are improved by 20dB after calibration, achieving -84.5dB and 86.5dB respectively. More than 700 parts are tested to verify the robustness of the BIST solution

Methodology for testing high-performance data converters using low-accuracy instruments

There has been explosive growth in the consumer electronics market during the last decade. As the IC industry is shifting from PC-centric to consumer electronics-centric, digital technologies are no longer solving all the problems. Electronic devices integrating mixed-signal, RF and other non-purely digital functions are becoming new challenges to the industry. When digital testing has been studied for long time, testing of analog and mixed-signal circuits is still in its development stage. Existing solutions have two major problems. First, high-performance mixed-signal test equipments are expensive and it is difficult to integrate their functions on chip. Second, it is challenging to improve the test capability of existing methods to keep up with the fast-evolving performance of mixed-signal products demanded on the market. The International Technology Roadmap for Semiconductors identified mixed-signal testing as one of the most daunting system-on-a-chip challenges;My works have been focused on developing new strategies for testing the analog-to-digital converter (ADC) and digital-to-analog converter (DAC). Different from conventional methods that require test instruments to have better performance than the device under test, our algorithms allow the use of medium and low-accuracy instruments in testing. Therefore, we can provide practical and accurate test solutions for high-performance data converters. Meanwhile, the test cost is dramatically reduced because of the low price of such test instruments. These algorithms have the potential for built-in self-test and can be generalized to other mixed-signal circuitries. When incorporated with self-calibration, these algorithms can enable new design techniques for mixed-signal integrated circuits. Following contents are covered in the dissertation:;(1) A general stimulus error identification and removal (SEIR) algorithm that can test high-resolution ADCs using two low-linearity signals with a constant offset in between; (2) A center-symmetric interleaving (CSI) strategy for generating test signals to be used with the SEIR algorithm; (3) An architecture-based test algorithm for high-performance pipelined or cyclic ADCs using a single nonlinear stimulus; (4) Using Kalman Filter to improve the efficiency of ADC testing; and (5) A testing algorithm for high-speed high-resolution DACs using low-resolution ADCs with dithering