44 research outputs found
Addressing On-Chip Power Conversion and Dissipation Issues in Many-Core System-on-a-Chip based on Conventional Silicon and Emerging Nanotechnologies
Title from PDF of title page viewed August 27, 2018Dissertation advisor: Masud H ChowdhuryVitaIncludes bibliographical references (pages 158-163)Thesis (Ph.D.)--School of Computing and Engineering and Department of Physics and Astronomy. University of Missouri--Kansas City, 2017Integrated circuits (ICs) are moving towards system-on-a-chip (SOC) designs. SOC
allows various small and large electronic systems to be implemented in a single chip. This
approach enables the miniaturization of design blocks that leads to high density transistor
integration, faster response time, and lower fabrication costs. To reap the benefits of SOC
and uphold the miniaturization of transistors, innovative power delivery and power
dissipation management schemes are paramount. This dissertation focuses on on-chip
integration of power delivery systems and managing power dissipation to increase the
lifetime of energy storage elements. We explore this problem from two different angels:
On-chip voltage regulators and power gating techniques. On-chip voltage regulators reduce
parasitic effects, and allow faster and efficient power delivery for microprocessors. Power
gating techniques, on the other hand, reduce the power loss incurred by circuit blocks
during standby mode.
Power dissipation (Ptotal = Pstatic and Pdynamic) in a complementary metal-oxide
semiconductor (CMOS) circuit comes from two sources: static and dynamic. A quadratic
dependency on the dynamic switching power and a more than linear dependency on static
power as a form of gate leakage (subthreshold current) exist. To reduce dynamic power
loss, the supply power should be reduced. A significant reduction in power dissipation
occurs when portions of a microprocessor operate at a lower voltage level. This reduction
in supply voltage is achieved via voltage regulators or converters. Voltage regulators are
used to provide a stable power supply to the microprocessor. The conventional off-chip
switching voltage regulator contains a passive floating inductor, which is difficult to be
implemented inside the chip due to excessive power dissipation and parasitic effects.
Additionally, the inductor takes a very large chip area while hampering the scaling process.
These limitations make passive inductor based on-chip regulator design very unattractive
for SOC integration and multi-/many-core environments. To circumvent the challenges,
three alternative techniques based on active circuit elements to replace the passive LC filter
of the buck convertor are developed. The first inductorless on-chip switching voltage
regulator architecture is based on a cascaded 2nd order multiple feedback (MFB) low-pass
filter (LPF). This design has the ability to modulate to multiple voltage settings via pulse
with modulation (PWM). The second approach is a supplementary design utilizing a hybrid
low drop-out scheme to lower the output ripple of the switching regulator over a wider
frequency range. The third design approach allows the integration of an entire power
management system within a single chipset by combining a highly efficient switching
regulator with an intermittently efficient linear regulator (area efficient), for robust and
highly efficient on-chip regulation.
The static power (Pstatic) or subthreshold leakage power (Pleak) increases with
technology scaling. To mitigate static power dissipation, power gating techniques are
implemented. Power gating is one of the popular methods to manage leakage power during
standby periods in low-power high-speed IC design. It works by using transistor based
switches to shut down part of the circuit block and put them in the idle mode. The efficiency
of a power gating scheme involves minimum Ioff and high Ion for the sleep transistor. A
conventional sleep transistor circuit design requires an additional header, footer, or both
switches to turn off the logic block. This additional transistor causes signal delay and
increases the chip area. We propose two innovative designs for next generation sleep
transistor designs. For an above threshold operation, we present a sleep transistor design
based on fully depleted silicon-on-insulator (FDSOI) device. For a subthreshold circuit
operation, we implement a sleep transistor utilizing the newly developed silicon-on
ferroelectric-insulator field effect transistor (SOFFET). In both of the designs, the ability
to control the threshold voltage via bias voltage at the back gate makes both devices more
flexible for sleep transistors design than a bulk MOSFET. The proposed approaches
simplify the design complexity, reduce the chip area, eliminate the voltage drop by sleep
transistor, and improve power dissipation. In addition, the design provides a dynamically
controlled Vt for times when the circuit needs to be in a sleep or switching mode.Introduction -- Background and literature review -- Fully integrated on-chip switching voltage regulator -- Hybrid LDO voltage regulator based on cascaded second order multiple feedback loop -- Single and dual output two-stage on-chip power management system -- Sleep transistor design using double-gate FDSOI -- Subthreshold region sleep transistor design -- Conclusio
Design of high frequency circuits for a gigabit per second data transmission system with isolation transformers and improved electrostatic protection
The focus of this dissertation is the design of a 10 Gbit/s wireline data communication system. The data is sent from the driver chip to the receiver chip on a printed circuit board (PCB). In the GHz frequency range, the parasitic effect of various circuits along the signal path affect the quality of the signal sent. Electrostatic Discharge (ESD) protection, PCB traces and packaging increase the signal loss and distortion;The parasitic effect of ESD protection circuits limits the maximum bandwidth for data transmission. The current high speed driver architectures have the driver circuit directly connected to the chip pads and PCB traces. This causes the chip to be prone to ESD discharge effects. Placing large ESD devices that shunt the output driver to ground, results in their parasitic capacitances acting as low pass filters that severely limit the data transmission rate. The packaging and PCB material are investigated in this project too. An electrical model of the bonding wire is developed through MATLAB RTM and HSPICERTM;In order to increase the data rate, changes in the architecture are performed. The contribution of this project is the introduction of on chip monolithic 4 port RF transformers at the driver and receiver front-end circuits. The transformers act as ESD isolation devices because they filter the low frequency components of the ESD signals before they damage the driver. The driver is physically isolated from the chip exterior. The signal in the driver is conveyed to the traces outside the chip by transformer induction behavior. Spark gap devices are added as ESD discharge paths too. Through investigating several transformer architectures, planar interleaved transformers are fabricated and characterized to have a bandwidth beyond 5GHz needed for suitable data transmission. A design and characterization method of RF transformers by geometric scaling is presented;The transformers are used in the driver and receiver circuit. Through simulation, the improved design proves to increase the bandwidth of the data link significantly
Nonterrestrial utilization of materials: Automated space manufacturing facility
Four areas related to the nonterrestrial use of materials are included: (1) material resources needed for feedstock in an orbital manufacturing facility, (2) required initial components of a nonterrestrial manufacturing facility, (3) growth and productive capability of such a facility, and (4) automation and robotics requirements of the facility
Topical Workshop on Electronics for Particle Physics
The purpose of the workshop was to present results and original concepts for electronics research and development relevant to particle physics experiments as well as accelerator and beam instrumentation at future facilities; to review the status of electronics for the LHC experiments; to identify and encourage common efforts for the development of electronics; and to promote information exchange and collaboration in the relevant engineering and physics communities
Study of spaceborne multiprocessing - Phase 2 Volume 2 - Technical description Final report
Advanced multiprocessor computer organization for manned Mars lander missio
Low-frequency noise in downscaled silicon transistors: Trends, theory and practice
By the continuing downscaling of sub-micron transistors in the range of few to one deca-nanometers, we focus on the increasing relative level of the low-frequency noise in these devices. Large amount of published data and models are reviewed and summarized, in order to capture the state-of-the-art, and to observe that the 1/area scaling of low-frequency noise holds even for carbon nanotube devices, but the noise becomes too large in order to have fully deterministic devices with area less than 10nmĂ10nm. The low-frequency noise models are discussed from the point of view that the noise can be both intrinsic and coupled to the charge transport in the devices, which provided a coherent picture, and more interestingly, showed that the models converge each to other, despite the many issues that one can find for the physical origin of each model. Several derivations are made to explain crossovers in noise spectra, variable random telegraph amplitudes, duality between energy and distance of charge traps, behaviors and trends for figures of merit by device downscaling, practical constraints for micropower amplifiers and dependence of phase noise on the harmonics in the oscillation signal, uncertainty and techniques of averaging by noise characterization. We have also shown how the unavoidable statistical variations by fabrication is embedded in the devices as a spatial âfrozen noiseâ, which also follows 1/area scaling law and limits the production yield, from one side, and from other side, the âfrozen noiseâ contributes generically to temporal 1/f noise by randomly probing the embedded variations during device operation, owing to the purely statistical accumulation of variance that follows from cause-consequence principle, and irrespectively of the actual physical process. The accumulation of variance is known as statistics of âinnovation varianceâ, which explains the nearly log-normal distributions in the values for low-frequency noise parameters gathered from different devices, bias and other conditions, thus, the origin of geometric averaging in low-frequency noise characterizations. At present, the many models generally coincide each with other, and what makes the difference, are the values, which, however, scatter prominently in nanodevices. Perhaps, one should make some changes in the approach to the low-frequency noise in electronic devices, to emphasize the âstatistics behind the numbersâ, because the general physical assumptions in each model always fail at some point by the device downscaling, but irrespectively of that, the statistics works, since the low-frequency noise scales consistently with the 1/area law