Behavioral synthesis from VHDL using structured modeling

This dissertation describes work in behavioral synthesis involving the development of a VHDL Synthesis System VSS which accepts a VHDL behavioral input specification and performs technology independent synthesis to generate a circuit netlist of generic components. The VHDL language is used for input and output descriptions. An intermediate representation which incorporates signal typing and component attributes simplifies compilation and facilitates design optimization.A Structured Modeling methodology has been developed to suggest standard VHDL modeling practices for synthesis. Structured modeling provides recommendations for the use of available VHDL description styles so that optimal designs will be synthesized.A design composed of generic components is synthesized from the input description through a process of Graph Compilation, Graph Criticism, and Design Compilation. Experiments were performed to demonstrate the effects of different modeling styles on the quality of the design produced by VSS. Several alternative VHDL models were examined for each benchmark, illustrating the improvements in design quality achieved when Structured Modeling guidelines were followed

Advanced engineering - Supporting research and technology

Telemetry simulations, radar equipment and experiments, and related supporting research for Deep Space Networ

Fabric defect detection using the wavelet transform in an ARM processor

Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations