Five-Axis Machine Tool Condition Monitoring Using dSPACE Real-Time System

This paper presents the design, development and SIMULINK implementation of the lumped parameter model of C-axis drive from GEISS five-axis CNC machine tool. The simulated results compare well with the experimental data measured from the actual machine. Also the paper describes the steps for data acquisition using ControlDesk and hardware-in-the-loop implementation of the drive models in dSPACE real-time system. The main components of the HIL system are: the drive model simulation and input – output (I/O) modules for receiving the real controller outputs. The paper explains how the experimental data obtained from the data acquisition process using dSPACE real-time system can be used for the development of machine tool diagnosis and prognosis systems that facilitate the improvement of maintenance activities

A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

A Framework for the Verification and Validation of Artificial Intelligence Machine Learning Systems

An effective verification and validation (V&V) process framework for the white-box and black-box testing of artificial intelligence (AI) machine learning (ML) systems is not readily available. This research uses grounded theory to develop a framework that leads to the most effective and informative white-box and black-box methods for the V&V of AI ML systems. Verification of the system ensures that the system adheres to the requirements and specifications developed and given by the major stakeholders, while validation confirms that the system properly performs with representative users in the intended environment and does not perform in an unexpected manner. Beginning with definitions, descriptions, and examples of ML processes and systems, the research results identify a clear and general process to effectively test these systems. The developed framework ensures the most productive and accurate testing results. Formerly, and occasionally still, the system definition and requirements exist in scattered documents that make it difficult to integrate, trace, and test through V&V. Modern system engineers along with system developers and stakeholders collaborate to produce a full system model using model-based systems engineering (MBSE). MBSE employs a Unified Modeling Language (UML) or System Modeling Language (SysML) representation of the system and its requirements that readily passes from each stakeholder for system information and additional input. The comprehensive and detailed MBSE model allows for direct traceability to the system requirements. xxiv To thoroughly test a ML system, one performs either white-box or black-box testing or both. Black-box testing is a testing method in which the internal model structure, design, and implementation of the system under test is unknown to the test engineer. Testers and analysts are simply looking at performance of the system given input and output. White-box testing is a testing method in which the internal model structure, design, and implementation of the system under test is known to the test engineer. When possible, test engineers and analysts perform both black-box and white-box testing. However, sometimes testers lack authorization to access the internal structure of the system. The researcher captures this decision in the ML framework. No two ML systems are exactly alike and therefore, the testing of each system must be custom to some degree. Even though there is customization, an effective process exists. This research includes some specialized methods, based on grounded theory, to use in the testing of the internal structure and performance. Through the study and organization of proven methods, this research develops an effective ML V&V framework. Systems engineers and analysts are able to simply apply the framework for various white-box and black-box V&V testing circumstances

A Literature Review of Fault Diagnosis Based on Ensemble Learning

The accuracy of fault diagnosis is an important indicator to ensure the reliability of key equipment systems. Ensemble learning integrates different weak learning methods to obtain stronger learning and has achieved remarkable results in the field of fault diagnosis. This paper reviews the recent research on ensemble learning from both technical and field application perspectives. The paper summarizes 87 journals in recent web of science and other academic resources, with a total of 209 papers. It summarizes 78 different ensemble learning based fault diagnosis methods, involving 18 public datasets and more than 20 different equipment systems. In detail, the paper summarizes the accuracy rates, fault classification types, fault datasets, used data signals, learners (traditional machine learning or deep learning-based learners), ensemble learning methods (bagging, boosting, stacking and other ensemble models) of these fault diagnosis models. The paper uses accuracy of fault diagnosis as the main evaluation metrics supplemented by generalization and imbalanced data processing ability to evaluate the performance of those ensemble learning methods. The discussion and evaluation of these methods lead to valuable research references in identifying and developing appropriate intelligent fault diagnosis models for various equipment. This paper also discusses and explores the technical challenges, lessons learned from the review and future development directions in the field of ensemble learning based fault diagnosis and intelligent maintenance

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

A framework and methods for on-board network level fault diagnostics in automobiles

A significant number of electronic control units (ECUs) are nowadays networked in automotive vehicles to help achieve advanced vehicle control and eliminate bulky electrical wiring. This, however, inevitably leads to increased complexity in vehicle fault diagnostics. Traditional off-board fault diagnostics and repair at service centres, by using only diagnostic trouble codes logged by conventional onboard diagnostics, can become unwieldy especially when dealing with intermittent faults in complex networked electronic systems. This can result in inaccurate and time consuming diagnostics due to lack of real-time fault information of the interaction among ECUs in the network-wide perspective. This thesis proposes a new framework for on-board knowledge-based diagnostics focusing on network level faults, and presents an implementation of a real-time in-vehicle network diagnostic system, using case-based reasoning. A newly developed fault detection technique and the results from several practical experiments with the diagnostic system using a network simulation tool, a hardware- in-the- loop simulator, a disturbance simulator, simulated ECUs and real ECUs networked on a test rig are also presented. The results show that the new vehicle diagnostics scheme, based on the proposed new framework, can provide more real-time network level diagnostic data, and more detailed and self-explanatory diagnostic outcomes. This new system can provide increased diagnostic capability when compared with conventional diagnostic methods in terms of detecting message communication faults. In particular, the underlying incipient network problems that are ignored by the conventional on-board diagnostics are picked up for thorough fault diagnostics and prognostics which can be carried out by a whole-vehicle fault management system, contributing to the further development of intelligent and fault-tolerant vehicles