An Overview on Application of Machine Learning Techniques in Optical Networks

Today's telecommunication networks have become sources of enormous amounts of widely heterogeneous data. This information can be retrieved from network traffic traces, network alarms, signal quality indicators, users' behavioral data, etc. Advanced mathematical tools are required to extract meaningful information from these data and take decisions pertaining to the proper functioning of the networks from the network-generated data. Among these mathematical tools, Machine Learning (ML) is regarded as one of the most promising methodological approaches to perform network-data analysis and enable automated network self-configuration and fault management. The adoption of ML techniques in the field of optical communication networks is motivated by the unprecedented growth of network complexity faced by optical networks in the last few years. Such complexity increase is due to the introduction of a huge number of adjustable and interdependent system parameters (e.g., routing configurations, modulation format, symbol rate, coding schemes, etc.) that are enabled by the usage of coherent transmission/reception technologies, advanced digital signal processing and compensation of nonlinear effects in optical fiber propagation. In this paper we provide an overview of the application of ML to optical communications and networking. We classify and survey relevant literature dealing with the topic, and we also provide an introductory tutorial on ML for researchers and practitioners interested in this field. Although a good number of research papers have recently appeared, the application of ML to optical networks is still in its infancy: to stimulate further work in this area, we conclude the paper proposing new possible research directions

Advances in Hyperspectral Image Classification: Earth monitoring with statistical learning methods

Hyperspectral images show similar statistical properties to natural grayscale or color photographic images. However, the classification of hyperspectral images is more challenging because of the very high dimensionality of the pixels and the small number of labeled examples typically available for learning. These peculiarities lead to particular signal processing problems, mainly characterized by indetermination and complex manifolds. The framework of statistical learning has gained popularity in the last decade. New methods have been presented to account for the spatial homogeneity of images, to include user's interaction via active learning, to take advantage of the manifold structure with semisupervised learning, to extract and encode invariances, or to adapt classifiers and image representations to unseen yet similar scenes. This tutuorial reviews the main advances for hyperspectral remote sensing image classification through illustrative examples.Comment: IEEE Signal Processing Magazine, 201

A Multi-Label Active Learning Framework for Microcontroller Performance Screening

In safety-critical applications, microcontrollers have to be tested to satisfy strict quality and performances constraints. It has been demonstrated that on-chip ring oscillators can be be used as speed monitors to reliably predict the performances. However, any machine-learning model is likely to be inaccurate if trained on an inadequate dataset, and labeling data for training is quite a costly process. In this paper, we present a methodology based on active learning to select the best samples to be included in the training set, significantly reducing the time and cost required. Moreover, since different speed measurements are available, we designed a multi-label technique to take advantage of their correlations. Experimental results demonstrate that the approach halves the training-set size, with respect to a random labelling, while it increases the predictive accuracy, with respect to standard single-label machine-learning models

Spectral-spatial classification of hyperspectral images: three tricks and a new supervised learning setting

Spectral-spatial classification of hyperspectral images has been the subject of many studies in recent years. In the presence of only very few labeled pixels, this task becomes challenging. In this paper we address the following two research questions: 1) Can a simple neural network with just a single hidden layer achieve state of the art performance in the presence of few labeled pixels? 2) How is the performance of hyperspectral image classification methods affected when using disjoint train and test sets? We give a positive answer to the first question by using three tricks within a very basic shallow Convolutional Neural Network (CNN) architecture: a tailored loss function, and smooth- and label-based data augmentation. The tailored loss function enforces that neighborhood wavelengths have similar contributions to the features generated during training. A new label-based technique here proposed favors selection of pixels in smaller classes, which is beneficial in the presence of very few labeled pixels and skewed class distributions. To address the second question, we introduce a new sampling procedure to generate disjoint train and test set. Then the train set is used to obtain the CNN model, which is then applied to pixels in the test set to estimate their labels. We assess the efficacy of the simple neural network method on five publicly available hyperspectral images. On these images our method significantly outperforms considered baselines. Notably, with just 1% of labeled pixels per class, on these datasets our method achieves an accuracy that goes from 86.42% (challenging dataset) to 99.52% (easy dataset). Furthermore we show that the simple neural network method improves over other baselines in the new challenging supervised setting. Our analysis substantiates the highly beneficial effect of using the entire image (so train and test data) for constructing a model.Comment: Remote Sensing 201

Ono: an open platform for social robotics

In recent times, the focal point of research in robotics has shifted from industrial ro- bots toward robots that interact with humans in an intuitive and safe manner. This evolution has resulted in the subfield of social robotics, which pertains to robots that function in a human environment and that can communicate with humans in an int- uitive way, e.g. with facial expressions. Social robots have the potential to impact many different aspects of our lives, but one particularly promising application is the use of robots in therapy, such as the treatment of children with autism. Unfortunately, many of the existing social robots are neither suited for practical use in therapy nor for large scale studies, mainly because they are expensive, one-of-a-kind robots that are hard to modify to suit a specific need. We created Ono, a social robotics platform, to tackle these issues. Ono is composed entirely from off-the-shelf components and cheap materials, and can be built at a local FabLab at the fraction of the cost of other robots. Ono is also entirely open source and the modular design further encourages modification and reuse of parts of the platform

Machine Learning for Microcontroller Performance Screening

In safety-critical applications, microcontrollers must satisfy strict quality constraints and performances in terms of Fmax (the maximum operating frequency). Traditional speed-binning techniques are not feasible to be applied to mass production, due to the high cost of the needed test equipment. Literature has proven that data extracted from on-chip ring oscillators (ROs) can model the Fmax of integrated circuits by means of machine learning models able to predict the actual operating frequency of the devices. Those models, once trained, can be easily applied to the ROs data coming from every produced device with low effort and no need for high-cost equipment. This research aims to develop machine learning methodologies to be deployed in the MCU screening process, allowing for a more efficient and accurate Fmax estimation, as well as improved speed binning. The effectiveness of this approach has been demonstrated on a real world dataset of microcontroller data