A survey of an introduction to fault diagnosis algorithms

This report surveys the field of diagnosis and introduces some of the key algorithms and heuristics currently in use. Fault diagnosis is an important and a rapidly growing discipline. This is important in the design of self-repairable computers because the present diagnosis resolution of its fault-tolerant computer is limited to a functional unit or processor. Better resolution is necessary before failed units can become partially reuseable. The approach that holds the greatest promise is that of resident microdiagnostics; however, that presupposes a microprogrammable architecture for the computer being self-diagnosed. The presentation is tutorial and contains examples. An extensive bibliography of some 220 entries is included

A Comprehensive Survey on the Implementations, Attacks, and Countermeasures of the Current NIST Lightweight Cryptography Standard

This survey is the first work on the current standard for lightweight cryptography, standardized in 2023. Lightweight cryptography plays a vital role in securing resource-constrained embedded systems such as deeply-embedded systems (implantable and wearable medical devices, smart fabrics, smart homes, and the like), radio frequency identification (RFID) tags, sensor networks, and privacy-constrained usage models. National Institute of Standards and Technology (NIST) initiated a standardization process for lightweight cryptography and after a relatively-long multi-year effort, eventually, in Feb. 2023, the competition ended with ASCON as the winner. This lightweight cryptographic standard will be used in deeply-embedded architectures to provide security through confidentiality and integrity/authentication (the dual of the legacy AES-GCM block cipher which is the NIST standard for symmetric key cryptography). ASCON's lightweight design utilizes a 320-bit permutation which is bit-sliced into five 64-bit register words, providing 128-bit level security. This work summarizes the different implementations of ASCON on field-programmable gate array (FPGA) and ASIC hardware platforms on the basis of area, power, throughput, energy, and efficiency overheads. The presented work also reviews various differential and side-channel analysis attacks (SCAs) performed across variants of ASCON cipher suite in terms of algebraic, cube/cube-like, forgery, fault injection, and power analysis attacks as well as the countermeasures for these attacks. We also provide our insights and visions throughout this survey to provide new future directions in different domains. This survey is the first one in its kind and a step forward towards scrutinizing the advantages and future directions of the NIST lightweight cryptography standard introduced in 2023

Minimal test set for stuck-at faults in VLSI

Minimal test sets have the property that each input vector simultaneously tests several faults in a network. Existing techniques to determine a minimal set of detection tests rely heavily on complicated algebraic techniques. In this paper, two new methods are presented which do not require Boolean algebra or Karnaugh maps. The first is a graphical approach using fault folding graphs. The second is a design by inspection technique. This work follows the unique approach of first finding all the faults that can be detected by a single test. This tremendously reduces the work required to determine a minimal test set. The design by inspection method could be automated for programmatic generation of minimal stuck-at fault tests

Analysis of Hardware Descriptions

The design process for integrated circuits requires a lot of analysis of circuit descriptions. An important class of analyses determines how easy it will be to determine if a physical component suffers from any manufacturing errors. As circuit complexities grow rapidly, the problem of testing circuits also becomes increasingly difficult. This thesis explores the potential for analysing a recent high level hardware description language called Ruby. In particular, we are interested in performing testability analyses of Ruby circuit descriptions. Ruby is ammenable to algebraic manipulation, so we have sought transformations that improve testability while preserving behaviour. The analysis of Ruby descriptions is performed by adapting a technique called abstract interpretation. This has been used successfully to analyse functional programs. This technique is most applicable where the analysis to be captured operates over structures isomorphic to the structure of the circuit. Many digital systems analysis tools require the circuit description to be given in some special form. This can lead to inconsistency between representations, and involves additional work converting between representations. We propose using the original description medium, in this case Ruby, for performing analyses. A related technique, called non-standard interpretation, is shown to be very useful for capturing many circuit analyses. An implementation of a system that performs non-standard interpretation forms the central part of the work. This allows Ruby descriptions to be analysed using alternative interpretations such test pattern generation and circuit layout interpretations. This system follows a similar approach to Boute's system semantics work and O'Donnell's work on Hydra. However, we have allowed a larger class of interpretations to be captured and offer a richer description language. The implementation presented here is constructed to allow a large degree of code sharing between different analyses. Several analyses have been implemented including simulation, test pattern generation and circuit layout. Non-standard interpretation provides a good framework for implementing these analyses. A general model for making non-standard interpretations is presented. Combining forms that combine two interpretations to produce a new interpretation are also introduced. This allows complex circuit analyses to be decomposed in a modular manner into smaller circuit analyses which can be built independently

Fast and accurate SER estimation for large combinational blocks in early stages of the design

Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the increased vulnerability brought by technology scaling. This paper presents a methodology to estimate in early stages of the design the susceptibility of combinational circuits to particle strikes. In the core of the framework lies MASkIt , a novel approach that combines signal probabilities with technology characterization to swiftly compute the logical, electrical, and timing masking effects of the circuit under study taking into account all input combinations and pulse widths at once. Signal probabilities are estimated applying a new hybrid approach that integrates heuristics along with selective simulation of reconvergent subnetworks. The experimental results validate our proposed technique, showing a speedup of two orders of magnitude in comparison with traditional fault injection estimation with an average estimation error of 5 percent. Finally, we analyze the vulnerability of the Decoder, Scheduler, ALU, and FPU of an out-of-order, superscalar processor design.This work has been partially supported by the Spanish Ministry of Economy and Competitiveness and Feder Funds under grant TIN2013-44375-R, by the Generalitat de Catalunya under grant FI-DGR 2016, and by the FP7 program of the EU under contract FP7-611404 (CLERECO).Peer ReviewedPostprint (author's final draft

Custom Integrated Circuits

Contains reports on twelve research projects.Analog Devices, Inc.International Business Machines, Inc.Joint Services Electronics Program (Contract DAAL03-86-K-0002)Joint Services Electronics Program (Contract DAAL03-89-C-0001)U.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)Rockwell International CorporationOKI Semiconductor, Inc.U.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)Charles Stark Draper LaboratoryNational Science Foundation (Grant MIP 84-07285)National Science Foundation (Grant MIP 87-14969)Battelle LaboratoriesNational Science Foundation (Grant MIP 88-14612)DuPont CorporationDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation (Grant MIP-88-58764

Encryption AXI Transaction Core for Enhanced FPGA Security

The current hot topic in cyber-security is not constrained to software layers. As attacks on electronic circuits have become more usual and dangerous, hardening digital System-on-Chips has become crucial. This article presents a novel electronic core to encrypt and decrypt data between two digital modules through an Advanced eXtensible Interface (AXI) connection. The core is compatible with AXI and is based on a Trivium stream cipher. Its implementation has been tested on a Zynq platform. The core prevents unauthorized data extraction by encrypting data on the fly. In addition, it takes up a small area—242 LUTs—and, as the core’s AXI to AXI path is fully combinational, it does not interfere with the system’s overall performance, with a maximum AXI clock frequency of 175 MHz.This work has been supported within the fund for research groups of the Basque university system IT1440-22 by the Department of Education and within the PILAR ZE-2020/00022 and COMMUTE ZE-2021/00931 projects by the Hazitek program, both of the Basque Government, the latter also by the Ministerio de Ciencia e Innovación of Spain through the Centro para el Desarrollo Tecnológico Industrial (CDTI) within the project IDI-20201264 and IDI-20220543 and through the Fondo Europeo de Desarrollo Regional 2014–2020 (FEDER funds)

Development of Boolean calculus and its application

Formal procedures for synthesis of asynchronous sequential system using commercially available edge-sensitive flip-flops are developed. Boolean differential is defined. The exact number of compatible integrals of a Boolean differential were calculated