Model Comparison in the Introductory Physics Laboratory

Model comparison is at the heart of all scientific methodologies. Progress is made in science by constructing many models (possibly of different complexities), testing them against measurements, and determining which of them explain the data the best. It is my observation, however, that in many introductory physics labs we provide students with the materials and methods to verify the “correct” model of the experiment they are performing, e.g. measuring “g” or verifying the period of a pendulum. In this way, we do our students a disservice and don’t allow them to experience the richness and creativity that constitutes the scientific enterprise. Limiting the lab to the “correct” model can have its uses—for example, getting the students to practice the proper methods to measure lengths and times or to support the specific theory covered in the lecture portion of the class. However, when students perform these labs, they come to view these activities as repetitive and mechanical, reinforcing the notion that science concerns not the true exploration of nature but simply the verification of what we already know. By verifying what we already know, the laboratory experience does not improve overall understanding and can mislead students about the methods of science overall

Microelectronics Process Engineering at San Jose State University: A Manufacturing-Oriented Interdisciplinary Degree Program

San Jose State University\u27s new interdisciplinary curriculum in Microelectronics Process Engineering is described. This baccalaureate program emphasizes hands-on thin-film fabrication experience, manufacturing methods such as statistical process control, and fundamentals of materials science and semiconductor device physics. Each course of the core laboratory sequence integrates fabrication knowledge with process engineering and manufacturing methods. The curriculum development process relies on clearly defined and detailed program and course learning objectives. We also briefly discuss our strategy of making process engineering experiences accessible for all engineering students through both Lab Module and Statistics Module series

Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state of the art x ray mirrors

X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ray light sources, must have almost perfect surfaces, capable of delivering light to experiments without significant degradation of brightness and coherence. To accurately characterize such optics at an optical metrology lab, two basic types of surface slope profilometers are used the long trace profilers LTPs and nanometer optical measuring NOM like angular deflectometers, based on electronic autocollimator AC ELCOMAT 3000. The inherent systematic errors of the instrument s optical sensors set the principle limit to their measuring performance. Where autocollimator of a NOM like profiler may be calibrated at a unique dedicated facility, this is for a particular configuration of distance, aperture size, and angular range that does not always match the exact use in a scanning measurement with the profiler. Here we discuss the developed methodology, experimental set up, and numerical methods of transferring the calibration of one reference AC to the scanning AC of the Optical Surface Measuring System OSMS , recently brought to operation at the ALS Xray Optics Laboratory. We show that precision calibration of the OSMS performed in three steps, allows us to provide high confidence and accuracy low spatial frequency metrology and not print into measurements the inherent systematic error of tool in use. With the examples of the OSMS measurements with a state of the art x ray aspherical mirror, available from one of the most advanced vendors of X ray optics, we demonstrate the high efficacy of the developed calibration procedure. The results of our work are important for obtaining high reliability data, needed for sophisticated numerical simulations of beamline performance and optimization of beamline usage of the optics. This work was supported by the U. S. Department of Energy under contract number DE AC02 05CH1123

Monolithic optofluidic chips: from optical manipulation of single cells to quantum sensing of fluids

This paper was presented at the 4th Micro and Nano Flows Conference (MNF2014), which was held at University College, London, UK. The conference was organised by Brunel University and supported by the Italian Union of Thermofluiddynamics, IPEM, the Process Intensification Network, the Institution of Mechanical Engineers, the Heat Transfer Society, HEXAG - the Heat Exchange Action Group, and the Energy Institute, ASME Press, LCN London Centre for Nanotechnology, UCL University College London, UCL Engineering, the International NanoScience Community, www.nanopaprika.eu.We report on a new class of integrated optofluidic devices, fabricated by femtosecond laser micromachining. The capability to combine optical waveguides with microfluidic channels in the same glass chip provides a very powerful platform, introducing new tools in the field of optical sensing. Two recent applications that greatly benefitted from this novel technology are on-chip optical manipulation of single cells by optical forces and optical sensing of the refractive index of fluids by quantum states of light. The specific properties of robustness, alignment free and portability of these devices pave the way to the use of these advanced sensing technologies outside the lab, in a real application environment