Flash Memory Devices

Flash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration. The NOR Flash technology is still the workhorse of many code storage applications in the embedded world, ranging from microcontrollers for automotive environment to IoT smart devices. Their usage is also forecasted to be fundamental in emerging AI edge scenario. On the contrary, when massive data storage is required, NAND Flash memories are necessary to have in a system. You can find NAND Flash in USB sticks, cards, but most of all in Solid-State Drives (SSDs). Since SSDs are extremely demanding in terms of storage capacity, they fueled a new wave of innovation, namely the 3D architecture. Today “3D” means that multiple layers of memory cells are manufactured within the same piece of silicon, easily reaching a terabit capacity. So far, Flash architectures have always been based on "floating gate," where the information is stored by injecting electrons in a piece of polysilicon surrounded by oxide. On the contrary, emerging concepts are based on "charge trap" cells. In summary, flash memory devices represent the largest landscape of storage devices, and we expect more advancements in the coming years. This will require a lot of innovation in process technology, materials, circuit design, flash management algorithms, Error Correction Code and, finally, system co-design for new applications such as AI and security enforcement

A Scalable Flash-Based Hardware Architecture for the Hierarchical Temporal Memory Spatial Pooler

Hierarchical temporal memory (HTM) is a biomimetic machine learning algorithm focused upon modeling the structural and algorithmic properties of the neocortex. It is comprised of two components, realizing pattern recognition of spatial and temporal data, respectively. HTM research has gained momentum in recent years, leading to both hardware and software exploration of its algorithmic formulation. Previous work on HTM has centered on addressing performance concerns; however, the memory-bound operation of HTM presents significant challenges to scalability. In this work, a scalable flash-based storage processor unit, Flash-HTM (FHTM), is presented along with a detailed analysis of its potential scalability. FHTM leverages SSD flash technology to implement the HTM cortical learning algorithm spatial pooler. The ability for FHTM to scale with increasing model complexity is addressed with respect to design footprint, memory organization, and power efficiency. Additionally, a mathematical model of the hardware is evaluated against the MNIST dataset, yielding 91.98% classification accuracy. A fully custom layout is developed to validate the design in a TSMC 180nm process. The area and power footprints of the spatial pooler are 30.538mm2 and 5.171mW, respectively. Storage processor units have the potential to be viable platforms to support implementations of HTM at scale

A Practical Nonbinary Decoder for Low-Density Parity-Check Codes with Packet-Sized Symbols

This paper presents a practical decoder for regular low-density parity-check (LDPC) codes with flexible packet-sized symbols. The proposed hMP-VSD (Combined hard-decision message-passing with vector symbol decoding) is much less complex than the conventional VSD and has the same decoding performance. Regular LDPC codes with systematic encoding are selected for implementation. The channel is assumed to be the q-ary symmetric channel (q-SC). Different code lengths and column weights of LDPC codes are investigated. The results show that the codes with a column weight of 7 provide the best performance for hMP-VSD, while hMP works best with codes having a column weight of 5. With packet-sized symbols, even the rather short (60, 30) code structure has code lengths of 1,920 to 245,760 bits with symbol sizes of 32 to 4,096 bits. Both the decoder and its encoder were implemented on Raspberry-pi 4 model B boards and these results confirm that the computation time of hMP-VSD is 60% to 70% lower than that of VSD for pe in the range 0.05 to 0.1

High-Density Solid-State Memory Devices and Technologies

This Special Issue aims to examine high-density solid-state memory devices and technologies from various standpoints in an attempt to foster their continuous success in the future. Considering that broadening of the range of applications will likely offer different types of solid-state memories their chance in the spotlight, the Special Issue is not focused on a specific storage solution but rather embraces all the most relevant solid-state memory devices and technologies currently on stage. Even the subjects dealt with in this Special Issue are widespread, ranging from process and design issues/innovations to the experimental and theoretical analysis of the operation and from the performance and reliability of memory devices and arrays to the exploitation of solid-state memories to pursue new computing paradigms

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems