Achieving fast and exact hazard-free logic minimization of extended burst-mode gC finite state machines

Journal ArticleAbstract This paper presents a new approach to two-level hazard-free logic minimization in the context of extended burst-mode finite state machine synthesis targeting generalized C-elements (gC). No currently available minimizers for literal-exact two-level hazard-free logic minimization of extended burst-mode gC controllers can handle large circuits without synthesis times ranging up over thousands of seconds. Even existing heuristic approaches take too much time when iterative exploration over a large design space is required and do not yield minimum results. The logic minimization approach presented in this paper is based on state graph exploration in conjunction with single-cube cover algorithms, an approach that has not been considered for minimization of extended burst-mode finite state machines previously. Our algorithm achieves very fast logic minimization by introducing compacted state graphs and cover tables and an efficient single-cube cover algorithm for single-output minimization. Our exact logic minimizer finds minimal number of literal solutions to all currently available benchmarks, in less than one second on a 333 MHz microprocessor - more than three orders of magnitude faster than existing literal exact methods, and over an order of magnitude faster than existing heuristic methods for the largest benchmarks. This includes a benchmark that has never been possible to solve exactly in number of literals before

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Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs

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Achieving fast and exact hazard-free logic minimization of extended burst-mode gC finite state machines

This paper presents a new approach to two-level hazardfree logic minimization in the context of extended burst-mode finite state machine synthesis targeting generalized C-elements (gC). No currently available minimizers for literal-exact two-level hazard-free logic minimization of extended burst-mode gC controllers can handle large circuits without synthesis times ranging up over thousands of seconds. Even existing heuristic approaches take too much time when iterative exploration over a large design space is required and do not yield minimum results. The logic minimization approach presented in this paper is based on state graph exploration in conjunction with single-cube cover algorithms, an approach that has not been considered for minimization of extended burst-mode finite state machines previously. Our algorithm achieves very fast logic minimization by introducing compacted state graphs and cover tables and an efficient singlecube cover algorithm for single-output minimization. Our exact logic minimizer finds minimal number of literal solutions to all currently available benchmarks, in less than one second on a 333 MHz microprocessor — more than three orders of magnitude faster than existing literal exact methods, and over an order of magnitude faster than existing heuristic methods for the largest benchmarks. This includes a benchmark that has never been possible to solve exactly in number of literals before.