Testing embedded system through optimal mining technique (OMT) based on multi-input domain

Testing embedded systems must be done carefully particularly in the significant regions of the embedded systems. Inputs from an embedded system can happen in multiple order and many relationships can exist among the input sequences. Consideration of the sequences and the relationships among the sequences is one of the most important considerations that must be tested to find the expected behavior of the embedded systems. On the other hand combinatorial approaches help determining fewer test cases that are quite enough to test the embedded systems exhaustively. In this paper, an Optimal Mining Technique that considers multi-input domain which is based on built-in combinatorial approaches has been presented. The method exploits multi-input sequences and the relationships that exist among multi-input vectors. The technique has been used for testing an embedded system that monitors and controls the temperature within the Nuclear reactors

Metaheuristic algorithm for the construction of mixed covering arrays of different strength levels to be used in the design of black box software test cases

Introduction: Currently, software quality is a fundamental feature to ensure a space in the global market that day by day is more competitive and demanding. Software testing allows software developers to find and fix bugs and, thereby, raise the quality of their products. The cost of testing is now estimated at 50% of the total cost of software development, so it is necessary to find less expensive ways to ensure elevated levels of fault detection. In this scenario, black box tests play a key role; within these tests, combinatorial approaches are one of the best options. In combinatorial tests, test users must have a tool that provides them with the least number of test cases with the greatest coverage (failure detection) according to the parameters of the method (procedure, function, or other) that they want to test, and this is the main objective of this work. Objective: This paper presents an algorithm that supports the generation of test cases in black box tests based on creating Mixed Covering Arrays (MCA). These fixes allow you to generate the smallest number of test cases required to test a unit of code with the highest required coverage. The proposed algorithm builds an initial solution based on a greedy algorithm and then improves this solution through an iterative process oriented by simulated annealing (metaheuristic algorithm). Methodology: The research was conducted following the Iterative Research Pattern proposed by Pratt. First, the main problems reported in the state of the art for the construction of CSF were identified, then a review of the proposed solutions to these problems was performed. Then a first algorithm was created and then iteratively modified this algorithm, including, and removing components according to the experimental results of its operation. When the desired version was obtained, a process of refinement of parameters was performed and compared with the best results presented in the literature, results obtained by different algorithms. Results: The proposed algorithm obtains MCAs that are competitive (on average 3 additional test cases) against the best reported in the state of the art in an abbreviated execution time, an aspect that is of special interest for software testers. Conclusions: It was confirmed that the greedy and metaheuristic approach based on simulated annealing is a suitable alternative for the construction of a CSF. Neighboring solution construction algorithms are key to finding the required MCA in a shorter execution time

An investigation of distributed computing for combinatorial testing

Combinatorial test generation, also calledt-way testing, is the process ofgenerating sets of input parameters for a system under test, by consideringinteractions between values of multiple parameters. In order to decrease totaltesting time, there is an interest in techniques that generate smaller test suites.In our previous work, we used graph techniques to produce high-quality testsuites. However, these techniques require a lot of computing power andmemory, which is why this paper investigates distributed computing fort-waytesting. We first introduce our distributed graph colouring method, with newalgorithms for building the graph and for colouring it. Second, we present ourdistributed hypergraph vertex covering method and a new heuristic. Third, weshow how to build a distributed IPOG algorithm by leveraging either graphcolouring or hypergraph vertex covering as vertical growth algorithms.Finally, we test these new methods on a computer cluster and compare themto existingt-way testing tools