Oscillation-based DFT for Second-order Bandpass OTA-C Filters

This document is the Accepted Manuscript version. Under embargo until 6 September 2018. The final publication is available at Springer via https://doi.org/10.1007/s00034-017-0648-9.This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.Peer reviewedFinal Accepted Versio

Oscillation-Based Test Structure and Method for OTA-C Filters

“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”This paper describes a design for testability technique for operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. The oscillation frequency may be considered as a digital signal and it can be evaluated using digital circuitry therefore the test time is very small. These characteristics imply that the proposed method is very suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two integrator loop and Tow-Thomas filters. Simulation results in 0.25 mum CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters has 87% fault coverage and with a minimum number of extra components, requires a negligible area overhead

Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell

A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST.European Union 2635

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In this paper we will explain in depth how we have used Simulink with the addition of Xilinx System Generation to design a simulation framework for testing and analyzing neuro-inspired elements for spikes rate coded signals processing. Those elements have been designed as building blocks, which represent spikes processing primitives, combining them we have designed more complex blocks, which behaves like analog frequency filter using digital circuits. This kind of computation performs a massively parallel processing without complex hardware units. Spikes processing building blocks have been written in VHDL to be implemented for FPGA. Xilinx System Generator allows co-simulating VHDL entities together with Simulink components, providing an easy interface for presented building block simulations and analysis.Ministerio de Ciencia e Innovación TEC2009-10639-C04-0

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Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs

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A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

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Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using easy to measure CUT information that correlates with circuit performances. In this work, a multiple specification band guarding technique is proposed as a method to achieve a test target of misclassified circuits. The acceptance/rejection test regions are encoded using octrees in the measurement space, where the band guarding factors precisely tune the test decision boundary according to the required test yield targets. The generated octree data structure serves to cluster the forthcoming circuits in the production testing phase by solely relying on indirect measurements. The combined use of octree based encoding and multiple specification band guarding makes the testing procedure fast, efficient and highly tunable. The proposed band guarding methodology has been applied to test a band-pass Butterworth filter under parametric variations. Promising simulation results are reported showing remarkable improvements when the multiple specification band guarding criterion is used.Peer ReviewedPostprint (author's final draft

Communication Subsystems for Emerging Wireless Technologies

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Analog arrays are a promising upcoming hardware technology with the potential to drastically speed up deep learning. Their main advantage is that they compute matrix-vector products in constant time, irrespective of the size of the matrix. However, early convolution layers in ConvNets map very unfavorably onto analog arrays, because kernel matrices are typically small and the constant time operation needs to be sequentially iterated a large number of times, reducing the speed up advantage for ConvNets. Here, we propose to replicate the kernel matrix of a convolution layer on distinct analog arrays, and randomly divide parts of the compute among them, so that multiple kernel matrices are trained in parallel. With this modification, analog arrays execute ConvNets with an acceleration factor that is proportional to the number of kernel matrices used per layer (here tested 16-128). Despite having more free parameters, we show analytically and in numerical experiments that this convolution architecture is self-regularizing and implicitly learns similar filters across arrays. We also report superior performance on a number of datasets and increased robustness to adversarial attacks. Our investigation suggests to revise the notion that mixed analog-digital hardware is not suitable for ConvNets

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Summary form only given. Moore's Law drives VLSI technology to continuous increases in transistor densities and higher clock frequencies. This tutorial will review the trends in VLSI technology scaling in the last few years and discuss the challenges facing process and circuit engineers in the 100nm generation and beyond. The first focus area is the process technology, including transistor scaling trends and research activities for the 100nm technology node and beyond. The transistor leakage and interconnect RC delays will continue to increase. The tutorial will review new circuit design techniques for emerging process technologies, including dual Vt transistors and silicon-on-insulator. It will also cover circuit and layout techniques to reduce clock distribution skew and jitter, model and reduce transistor leakage and improve the electrical performance of flip-chip packages. Finally, the tutorial will review the test challenges for the 100nm technology node due to increased clock frequency and power consumption (both active and passive) and present several potential solution