A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

Quick Screening of Well Survivability in a Producing Reservoir

Imperial Users onl

Exploiting Don\u27t Cares to Enhance Functional Tests

In simulation based design verification, deterministic or pseudo-random tests are used to check functional correctness of a design. In this paper we present a technique generating tests by specifying the don’t care inputs in the functional specifications so as to improve their coverage of both design errors and manufacturing faults. The don’t cares are chosen to maximize sensitization of signals in the circuit. The tests generated in this way require only a fraction of pseudo-exhaustive test patterns to achieve a high multiplicity of fault coverage

Block v. City of Lewiston Clerk\u27s Record v. 2 Dckt. 39685

https://digitalcommons.law.uidaho.edu/idaho_supreme_court_record_briefs/5070/thumbnail.jp

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing

At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs inactive as possible by disabling corresponding clock-control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to make as many remaining active FFs as possible to have equal input and output values in Stage-2 (FF-Silencing). CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.2008 17th Asian Test Symposium (ATS 2008), 24-27 November 2008, Sapporo, Japa

Field Identification of Soils and Aggregates for County Roads

The primary purpose of this bulletin is to provide instruction to Indiana county road personnel on rating the quality of soils and pit-run materials used in the construction and maintenance of county roads. A system of soil classification is presented which provides the county highway engineer, road supervisor and inspector alike, with a common language for identifying soil types, properties and problems

Farm, Ranch and Home Quarterly Institute of Agriculture and Natural Resources, University of Nebraska- Lincoln

In this issue: From the Vice Chancellor ............................... 2 Good Management Controls Feedlot Flies................. 3 Tractor Day-Something for Everyone...................... 5 How Not to Hit Your Children ........................... 7 Cottonwoods for Nebraska.......................... 9 Agricultural job Openings Forecast ........................ 11 Range judging-An Outdoor Classroom ................... 12 To Expand or Not to Expand? ............................ 14 Dry Bean Disease Plagues Farmers ........................ 16 Pest Center Serves Growers, Gardeners .................... 19 joint Venture Beef Fabrication ............................ 21 Rural Services: Worth the Cost? .......................... 2

Farm, Ranch and Home Quarterly Institute of Agriculture and Natural Resources, University of Nebraska- Lincoln

In this issue: From the Vice Chancellor ............................... 2 Good Management Controls Feedlot Flies................. 3 Tractor Day-Something for Everyone...................... 5 How Not to Hit Your Children ........................... 7 Cottonwoods for Nebraska.......................... 9 Agricultural job Openings Forecast ........................ 11 Range judging-An Outdoor Classroom ................... 12 To Expand or Not to Expand? ............................ 14 Dry Bean Disease Plagues Farmers ........................ 16 Pest Center Serves Growers, Gardeners .................... 19 joint Venture Beef Fabrication ............................ 21 Rural Services: Worth the Cost? .......................... 2

Gifted and Talented Science Instruction at the Middle Level: A Mixed Methods Evaluation of Teacher Practices and Impact on Student Achievement

Middle school students (Grades 6-8) face a unique set of challenges. Add a gifted and talented (GT) identification, and the need for differentiation in instruction for the exceptional adolescent becomes critical. This research focused on specific practices such as ability grouping, curriculum compaction, providing students choice, problem-based learning, and professional development among others in a primarily rural school district. This mixed methods research used an explanatory sequential design and sought to examine what practices are being used in a middle school GT sixth-grade science classroom using a survey instrument to assess frequency of practice. The results of the survey indicated some best practices are present, but the frequency of practice is minimal. It also sought to understand if there is any relationship to how students served in the GT science classroom did on the state achievement test (SCPASS Science). The results of an independent t test using unequal variances revealed that the district of study, as a whole, showed no statistically significant growth on the state test following implementation. Focus groups were used to assess both teachers\u27 and instructional leaders’ satisfaction. There was general dissatisfaction but also an acknowledgement that the implementation of the program has some positive outcomes which could be built upon. There appears to be a relationship between minimal best practice and overall growth that was not statistically significant on the state assessment. Recommendations for future action and research may help a gifted program in its early stages become more effective