FPGA Implementation of Real-Time Compressive Sensing with Partial Fourier Dictionary

This paper presents a novel real-time compressive sensing (CS) reconstruction which employs high density field-programmable gate array (FPGA) for hardware acceleration. Traditionally, CS can be implemented using a high-level computer language in a personal computer (PC) or multicore platforms, such as graphics processing units (GPUs) and Digital Signal Processors (DSPs). However, reconstruction algorithms are computing demanding and software implementation of these algorithms is extremely slow and power consuming. In this paper, the orthogonal matching pursuit (OMP) algorithm is refined to solve the sparse decomposition optimization for partial Fourier dictionary, which is always adopted in radar imaging and detection application. OMP reconstruction can be divided into two main stages: optimization which finds the closely correlated vectors and least square problem. For large scale dictionary, the implementation of correlation is time consuming since it often requires a large number of matrix multiplications. Also solving the least square problem always needs a scalable matrix decomposition operation. To solve these problems efficiently, the correlation optimization is implemented by fast Fourier transform (FFT) and the large scale least square problem is implemented by Conjugate Gradient (CG) technique, respectively. The proposed method is verified by FPGA (Xilinx Virtex-7 XC7VX690T) realization, revealing its effectiveness in real-time applications

A Review on Key Issues and Challenges in Devices Level MEMS Testing

The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market

A Review on Key Issues and Challenges in Devices Level MEMS Testing

The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market

Design Space Exploration and Resource Management of Multi/Many-Core Systems

The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

The survey on Near Field Communication

PubMed ID: 26057043Near Field Communication (NFC) is an emerging short-range wireless communication technology that offers great and varied promise in services such as payment, ticketing, gaming, crowd sourcing, voting, navigation, and many others. NFC technology enables the integration of services from a wide range of applications into one single smartphone. NFC technology has emerged recently, and consequently not much academic data are available yet, although the number of academic research studies carried out in the past two years has already surpassed the total number of the prior works combined. This paper presents the concept of NFC technology in a holistic approach from different perspectives, including hardware improvement and optimization, communication essentials and standards, applications, secure elements, privacy and security, usability analysis, and ecosystem and business issues. Further research opportunities in terms of the academic and business points of view are also explored and discussed at the end of each section. This comprehensive survey will be a valuable guide for researchers and academicians, as well as for business in the NFC technology and ecosystem.Publisher's Versio