Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%

Hardware, Software and Data Analysis Techniques for SRAM-Based Field Programmable Gate Array Circuits

This work presents a built, tested, and demonstrated test structure that is low-cost, flexible, and re-usable for robust radiation experimentation, primarily to investigate memory, in this case SRAMs and SRAM-based FPGAs. The space environment can induce many kinds of failures due to radiation effects. These failures result in a loss of money, time, intelligence, and information. In order to evaluate technologies for potential failures, a detailed test methodology and associated structure are required. In this solution, an FPGA board was used as the controller platform, with multiple VHDL circuit controllers, data collection and reporting modules. The structure was demonstrated by programming an SRAM-based FPGA board as the device under test (DUT) with various types of adders, counters and RAM modules. The controllers, hardware, and data collection operations were tested and validated using gamma radiation from a Co-60 source at the Ohio State University Nuclear Reactor to irradiate the DUT. The test structure is easily modified to allow for a broad range of experiments on the same DUT. In addition, this structure is easily adaptable for other memory types, such as DRAM, FlashRam, and MRAM. These additions will be discussed further in this document. The system fits in a backpack and costs less than $1000

Characterization of Hardening by Design Techniques on Commercial, Small Feature Sized Field-Programmable Gate Arrays

In this thesis, a methodology is developed to experimentally test and evaluate a programmable logic device unde r gamma irradiation. The purpose of which is to determine the radiation effects and characterize the improvements of various hardening by design techniques. The techniques analyzed in this thesis include Error Correction Coding (ECC) and Triple Modular Redundancy (TMR). The TMR circuit includes three different functional implementations of adders compared to TMR voted circuits of those same adders. The TMR is implemented with the same functional adders and as a Functional TMR (FTMR) with three different function adders that are voted on. The three functional adders are: a behavioral adder that allows the FPGA synthesis software to create the implementation, a ripple carry adder that consists of multiple single bit full adders linked together, and a carry look ahead adder that operates the fastest by using an algorithm that creates generate and propagate signals. These adders are connected to single voter TMR and FTMR circuits to evaluate the improvements that could be obtained. The ECC circuit includes Block RAM (BRAM) and Distributed RAM memory elements that are loaded both with ECC and non-error corrected data. The circuit is designed to check for errors in memory data, stuck bit values in the memory, and the performance improvements that ECC provides the system

Microprocessor fault-tolerance via on-the-fly partial reconfiguration

This paper presents a novel approach to exploit FPGA dynamic partial reconfiguration to improve the fault tolerance of complex microprocessor-based systems, with no need to statically reserve area to host redundant components. The proposed method not only improves the survivability of the system by allowing the online replacement of defective key parts of the processor, but also provides performance graceful degradation by executing in software the tasks that were executed in hardware before a fault and the subsequent reconfiguration happened. The advantage of the proposed approach is that thanks to a hardware hypervisor, the CPU is totally unaware of the reconfiguration happening in real-time, and there's no dependency on the CPU to perform it. As proof of concept a design using this idea has been developed, using the LEON3 open-source processor, synthesized on a Virtex 4 FPG

NASA SpaceCube Intelligent Multi-Purpose System for Enabling Remote Sensing, Communication, and Navigation in Mission Architectures

New, innovative CubeSat mission concepts demand modern capabilities such as artificial intelligence and autonomy, constellation coordination, fault mitigation, and robotic servicing – all of which require vastly more processing resources than legacy systems are capable of providing. Enabling these domains within a scalable, configurable processing architecture is advantageous because it also allows for the flexibility to address varying mission roles, such as a command and data-handling system, a high-performance application processor extension, a guidance and navigation solution, or an instrument/sensor interface. This paper describes the NASA SpaceCube Intelligent Multi-Purpose System (IMPS), which allows mission developers to mix-and-match 1U (10 cm × 10 cm) CubeSat payloads configured for mission-specific needs. The central enabling component of the system architecture to address these concerns is the SpaceCube v3.0 Mini Processor. This single-board computer features the 20nm Xilinx Kintex UltraScale FPGA combined with a radiation-hardened FPGA monitor, and extensive IO to integrate and interconnect varying cards within the system. To unify the re-usable designs within this architecture, the CubeSat Card Standard was developed to guide design of 1U cards. This standard defines pinout configurations, mechanical, and electrical specifications for 1U CubeSat cards, allowing the backplane and mechanical enclosure to be easily extended. NASA has developed several cards adhering to the standard (System-on-Chip, power card, etc.), which allows the flexibility to configure a payload from a common catalog of cards

Criticality Aware Soft Error Mitigation in the Configuration Memory of SRAM based FPGA

Efficient low complexity error correcting code(ECC) is considered as an effective technique for mitigation of multi-bit upset (MBU) in the configuration memory(CM)of static random access memory (SRAM) based Field Programmable Gate Array (FPGA) devices. Traditional multi-bit ECCs have large overhead and complex decoding circuit to correct adjacent multibit error. In this work, we propose a simple multi-bit ECC which uses Secure Hash Algorithm for error detection and parity based two dimensional Erasure Product Code for error correction. Present error mitigation techniques perform error correction in the CM without considering the criticality or the execution period of the tasks allocated in different portion of CM. In most of the cases, error correction is not done in the right instant, which sometimes either suspends normal system operation or wastes hardware resources for less critical tasks. In this paper,we advocate for a dynamic priority-based hardware scheduling algorithm which chooses the tasks for error correction based on their area, execution period and criticality. The proposed method has been validated in terms of overhead due to redundant bits, error correction time and system reliabilityComment: 6 pages, 8 figures, conferenc

Fault-tolerant fpga for mission-critical applications.

One of the devices that play a great role in electronic circuits design, specifically safety-critical design applications, is Field programmable Gate Arrays (FPGAs). This is because of its high performance, re-configurability and low development cost. FPGAs are used in many applications such as data processing, networks, automotive, space and industrial applications. Negative impacts on the reliability of such applications result from moving to smaller feature sizes in the latest FPGA architectures. This increases the need for fault-tolerant techniques to improve reliability and extend system lifetime of FPGA-based applications. In this thesis, two fault-tolerant techniques for FPGA-based applications are proposed with a built-in fault detection region. A low cost fault detection scheme is proposed for detecting faults using the fault detection region used in both schemes. The fault detection scheme primarily detects open faults in the programmable interconnect resources in the FPGAs. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can be detected. For fault recovery, each scheme has its own fault recovery approach. The first approach uses a spare module and a 2-to-1 multiplexer to recover from any fault detected. On the other hand, the second approach recovers from any fault detected using the property of Partial Reconfiguration (PR) in the FPGAs. It relies on identifying a Partially Reconfigurable block (P_b) in the FPGA that is used in the recovery process after the first faulty module is identified in the system. This technique uses only one location to recover from faults in any of the FPGA’s modules and the FPGA interconnects. Simulation results show that both techniques can detect and recover from open faults. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can also be detected. Finally, both techniques require low area overhead

Evaluation of Single-Chip, Real-Time Tomographic Data Processing on FPGA - SoC Devices

A novel approach to tomographic data processing has been developed and evaluated using the Jagiellonian PET (J-PET) scanner as an example. We propose a system in which there is no need for powerful, local to the scanner processing facility, capable to reconstruct images on the fly. Instead we introduce a Field Programmable Gate Array (FPGA) System-on-Chip (SoC) platform connected directly to data streams coming from the scanner, which can perform event building, filtering, coincidence search and Region-Of-Response (ROR) reconstruction by the programmable logic and visualization by the integrated processors. The platform significantly reduces data volume converting raw data to a list-mode representation, while generating visualization on the fly.Comment: IEEE Transactions on Medical Imaging, 17 May 201