Generalized disjunction decomposition for evolvable hardware

Evolvable hardware (EHW) refers to self-reconfiguration hardware design, where the configuration is under the control of an evolutionary algorithm (EA). One of the main difficulties in using EHW to solve real-world problems is scalability, which limits the size of the circuit that may be evolved. This paper outlines a new type of decomposition strategy for EHW, the “generalized disjunction decomposition” (GDD), which allows the evolution of large circuits. The proposed method has been extensively tested, not only with multipliers and parity bit problems traditionally used in the EHW community, but also with logic circuits taken from the Microelectronics Center of North Carolina (MCNC) benchmark library and randomly generated circuits. In order to achieve statistically relevant results, each analyzed logic circuit has been evolved 100 times, and the average of these results is presented and compared with other EHW techniques. This approach is necessary because of the probabilistic nature of EA; the same logic circuit may not be solved in the same way if tested several times. The proposed method has been examined in an extrinsic EHW system using the$(1 + lambda)$evolution strategy. The results obtained demonstrate that GDD significantly improves the evolution of logic circuits in terms of the number of generations, reduces computational time as it is able to reduce the required time for a single iteration of the EA, and enables the evolution of larger circuits never before evolved. In addition to the proposed method, a short overview of EHW systems together with the most recent applications in electrical circuit design is provided

Open-ended evolution to discover analogue circuits for beyond conventional applications

This is the author's accepted manuscript. The final publication is available at Springer via http://dx.doi.org/10.1007/s10710-012-9163-8. Copyright @ Springer 2012.Analogue circuits synthesised by means of open-ended evolutionary algorithms often have unconventional designs. However, these circuits are typically highly compact, and the general nature of the evolutionary search methodology allows such designs to be used in many applications. Previous work on the evolutionary design of analogue circuits has focused on circuits that lie well within analogue application domain. In contrast, our paper considers the evolution of analogue circuits that are usually synthesised in digital logic. We have developed four computational circuits, two voltage distributor circuits and a time interval metre circuit. The approach, despite its simplicity, succeeds over the design tasks owing to the employment of substructure reuse and incremental evolution. Our findings expand the range of applications that are considered suitable for evolutionary electronics

A novel genetic algorithm for evolvable hardware

Evolutionary algorithms are used for solving search and optimization problems. A new field in which they are also applied is evolvable hardware, which refers to a self-configurable electronic system. However, evolvable hardware is not widely recognized as a tool for solving real-world applications, because of the scalability problem, which limits the size of the system that may be evolved. In this paper a new genetic algorithm, particularly designed for evolving logic circuits, is presented and tested for its scalability. The proposed algorithm designs and optimizes logic circuits based on a Programmable Logic Array (PLA) structure. Furthermore it allows the evolution of large logic circuits, without the use of any decomposition techniques. The experimental results, based on the evolution of several logic circuits taken from three different benchmarks, prove that the proposed algorithm is very fast, as only a few generations are required to fully evolve the logic circuits. In addition it optimizes the evolved circuits better than the optimization offered by other evolutionary algorithms based on a PLA and FPGA structures

Measurements, Models, Systems and Design

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Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit

Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for structure optimization of a deterministic test pattern generator using genetic algorithm(GA)

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%