Rewired retiming for flip-flop reduction and low power without delay penalty.

Jiang, Mingqi.Thesis (M.Phil.)--Chinese University of Hong Kong, 2009.Includes bibliographical references (leaves [49]-51).Abstract also in Chinese.Abstract --- p.iAcknowledgement --- p.iiiChapter 1 --- Introduction --- p.1Chapter 2 --- Rewiring Background --- p.4Chapter 2.1 --- REWIRE --- p.6Chapter 2.2 --- GBAW --- p.7Chapter 3 --- Retiming --- p.9Chapter 3.1 --- Min-Clock Period Retiming --- p.9Chapter 3.2 --- Min-Area Retiming --- p.17Chapter 3.3 --- Retiming for Low Power --- p.18Chapter 3.4 --- Retiming with Interconnect Delay --- p.22Chapter 4 --- Rewired Retiming for Flip-flop Reduction --- p.26Chapter 4.1 --- Motivation and Problem Formulation --- p.26Chapter 4.2 --- Retiming Indication --- p.29Chapter 4.3 --- Target Wire Selection --- p.31Chapter 4.4 --- Incremental Placement Update --- p.33Chapter 4.5 --- Optimization Flow --- p.36Chapter 4.6 --- Experimental Results --- p.38Chapter 5 --- Power Analysis for Rewired Retiming --- p.41Chapter 5.1 --- Power Model --- p.41Chapter 5.2 --- Experimental Results --- p.44Chapter 6 --- Conclusion --- p.47Bibliography --- p.5

Design, Analysis and Test of Logic Circuits under Uncertainty.

Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects become detrimental to circuit reliability. In order to address this, we develop methods for analyzing, designing, and testing circuits subject to probabilistic effects. Our main contributions are: 1) a fast, soft-error rate (SER) analyzer that uses functional-simulation signatures to capture error effects, 2) novel design techniques that improve reliability using little area and performance overhead, 3) a matrix-based reliability-analysis framework that captures many types of probabilistic faults, and 4) test-generation/compaction methods aimed at probabilistic faults in logic circuits. SER analysis must account for the main error-masking mechanisms in ICs: logic, timing, and electrical masking. We relate logic masking to node testability of the circuit and utilize functional-simulation signatures, i.e., partial truth tables, to efficiently compute estability (signal probability and observability). To account for timing masking, we compute error-latching windows (ELWs) from timing analysis information. Electrical masking is incorporated into our estimates through derating factors for gate error probabilities. The SER of a circuit is computed by combining the effects of all three masking mechanisms within our SER analyzer called AnSER. Using AnSER, we develop several low-overhead techniques that increase reliability, including: 1) an SER-aware design method that uses redundancy already present within the circuit, 2) a technique that resynthesizes small logic windows to improve area and reliability, and 3) a post-placement gate-relocation technique that increases timing masking by decreasing ELWs. We develop the probabilistic transfer matrix (PTM) modeling framework to analyze effects beyond soft errors. PTMs are compressed into algebraic decision diagrams (ADDs) to improve computational efficiency. Several ADD algorithms are developed to extract reliability and error susceptibility information from PTMs representing circuits. We propose new algorithms for circuit testing under probabilistic faults, which require a reformulation of existing test techniques. For instance, a test vector may need to be repeated many times to detect a fault. Also, different vectors detect the same fault with different probabilities. We develop test generation methods that account for these differences, and integer linear programming (ILP) formulations to optimize test sets.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61584/1/smita_1.pd

Embedding Logic and Non-volatile Devices in CMOS Digital Circuits for Improving Energy Efficiency

abstract: Static CMOS logic has remained the dominant design style of digital systems for more than four decades due to its robustness and near zero standby current. Static CMOS logic circuits consist of a network of combinational logic cells and clocked sequential elements, such as latches and flip-flops that are used for sequencing computations over time. The majority of the digital design techniques to reduce power, area, and leakage over the past four decades have focused almost entirely on optimizing the combinational logic. This work explores alternate architectures for the flip-flops for improving the overall circuit performance, power and area. It consists of three main sections. First, is the design of a multi-input configurable flip-flop structure with embedded logic. A conventional D-type flip-flop may be viewed as realizing an identity function, in which the output is simply the value of the input sampled at the clock edge. In contrast, the proposed multi-input flip-flop, named PNAND, can be configured to realize one of a family of Boolean functions called threshold functions. In essence, the PNAND is a circuit implementation of the well-known binary perceptron. Unlike other reconfigurable circuits, a PNAND can be configured by simply changing the assignment of signals to its inputs. Using a standard cell library of such gates, a technology mapping algorithm can be applied to transform a given netlist into one with an optimal mixture of conventional logic gates and threshold gates. This approach was used to fabricate a 32-bit Wallace Tree multiplier and a 32-bit booth multiplier in 65nm LP technology. Simulation and chip measurements show more than 30% improvement in dynamic power and more than 20% reduction in core area. The functional yield of the PNAND reduces with geometry and voltage scaling. The second part of this research investigates the use of two mechanisms to improve the robustness of the PNAND circuit architecture. One is the use of forward and reverse body biases to change the device threshold and the other is the use of RRAM devices for low voltage operation. The third part of this research focused on the design of flip-flops with non-volatile storage. Spin-transfer torque magnetic tunnel junctions (STT-MTJ) are integrated with both conventional D-flipflop and the PNAND circuits to implement non-volatile logic (NVL). These non-volatile storage enhanced flip-flops are able to save the state of system locally when a power interruption occurs. However, manufacturing variations in the STT-MTJs and in the CMOS transistors significantly reduce the yield, leading to an overly pessimistic design and consequently, higher energy consumption. A detailed analysis of the design trade-offs in the driver circuitry for performing backup and restore, and a novel method to design the energy optimal driver for a given yield is presented. Efficient designs of two nonvolatile flip-flop (NVFF) circuits are presented, in which the backup time is determined on a per-chip basis, resulting in minimizing the energy wastage and satisfying the yield constraint. To achieve a yield of 98%, the conventional approach would have to expend nearly 5X more energy than the minimum required, whereas the proposed tunable approach expends only 26% more energy than the minimum. A non-volatile threshold gate architecture NV-TLFF are designed with the same backup and restore circuitry in 65nm technology. The embedded logic in NV-TLFF compensates performance overhead of NVL. This leads to the possibility of zero-overhead non-volatile datapath circuits. An 8-bit multiply-and- accumulate (MAC) unit is designed to demonstrate the performance benefits of the proposed architecture. Based on the results of HSPICE simulations, the MAC circuit with the proposed NV-TLFF cells is shown to consume at least 20% less power and area as compared to the circuit designed with conventional DFFs, without sacrificing any performance.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

Adaptation of High Performance and High Capacity Reconfigurable Systems to OpenCL Programming Environments

[EN] In this work, we adapt a reconfigurable computer system based on FPGA technologies to OpenCL programming environments. The reconfigurable system is part of a compute prototype of the MANGO European project that includes 96 FPGAs. To optimize the use and to obtain its maximum performance, it is essential to adapt it to heterogeneous systems programming environments such as OpenCL, which simplifies its programming. In this work, all the necessary activities for correct implementation of the software and hardware layer required for its use in OpenCL will be carried out, as well as an evaluation of the performance obtained and the flexibility offered by the solution provided. This work has been performed during an internship of 5 months. The internship is linked to an agreement between UPV and UniNa (Università degli Studi di Napoli Federico II).[ES] En este trabajo se va a realizar la adaptación de un sistema reconfigurable de cómputo basado en tecnologías de FPGAs hacia entornos de programación en OpenCL. El sistema reconfigurable forma parte de un prototipo de cálculo del proyecto Europeo MANGO que incluye 96 FPGAs. Con el fin de optimizar el uso y de obtener sus máximas prestaciones, se hace imprescindible una adaptación a entornos de programación de sistemas heterogéneos como OpenCL, lo cual simplifica su programación y uso. En este trabajo se realizarán todas las actividades necesarias para una correcta implementación de la capa software y hardware necesaria para su uso en OpenCL así como una evaluación de las prestaciones obtenidas y de la flexibilidad ofrecida por la solución aportada. Este trabajo se ha llevado a término durante una estancia de cinco meses en la Universitat Politécnica de Valéncia. Esta estancia está vinculada a un acuerdo entre la Universitat Politécnica de Valéncia y la Università degli Studi di Napoli Federico IIRusso, D. (2020). Adaptation of High Performance and High Capacity Reconfigurable Systems to OpenCL Programming Environments. http://hdl.handle.net/10251/150393TFG