Dynamic Calibration of Higher Eigenmode Parameters of a Cantilever in Atomic Force Microscopy Using Tip-Surface Interactions

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.Comment: 4 pages, 4 figure

DEVELOPMENT AND APPLICATIONS OF MULTIFREQUENCY IMAGING AND SPECTROSCOPY METHODS IN DYNAMIC ATOMIC FORCE MICROSCOPY

Force spectroscopy and surface dissipation mapping are two of the most important applications of dynamic atomic force microscopy (AFM), in addition to topographical imaging. These measurements are commonly performed using the conventional amplitude-modulation and frequency-modulation dynamic imaging modes. However, the acquisition of the tip-sample interaction force curves using these methods can generally be performed only at selected horizontal positions on the sample, which means that a 3-dimensional representation of the tip-sample forces requires fine-grid scanning of a volume above the surface, making the process lengthy and prone to instrument drift. This dissertation contains the development of two novel atomic force spectroscopy methods that could enable acquisition of 3-dimensional tip-sample force representations through a single 2-dimensional scan of the surface. The force curve reconstruction approach in the first method is based on 3-pass scanning of the surface using the recently proposed single-frequency imaging mode called frequency and force modulation AFM. A second, more versatile method based on bimodal AFM operation is introduced, wherein the fundamental eigenmode of the cantilever is excited to perform the topographical scan and a simultaneously excited higher eigenmode is used to perform force spectroscopy. The dissertation further presents the development of a trimodal AFM characterization method for ambient air operation, wherein three eigenmodes of the cantilever are simultaneously excited with the objective of rapidly and quantitatively mapping the variations in conservative and dissipative surface properties. The new methods have been evaluated within numerical simulations using a multiscale simulation methodology, and experimental implementation has been accomplished for two multifrequency variants that can provide 2-dimensional surface property contrast

High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

We present the proof-of-principle experiments of a high-speed actuationmethod to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.TUBITAK (110T732

Modal response and frequency shift of the cantilever in a noncontact atomic force microscope

The force-sensing cantilever in a noncontact atomic force microscope is a continuous system with infinite number of eigenmodes. Although the frequently used point mass model was found sufficient in many cases, its conditions for validity and the insights on how higher eigen-modes could affect the selection of operation parameters were not established. In this letter, we formulate the cantilever motion using modal response analysis, a powerful means enabling an efficient numerical solution and a first order analytical solution. The origins and impacts of the higher eigenfrequency oscillation are then investigated, which sheds lights on achieving optimal imaging conditions.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/87824/2/183506_1.pd

Macromodel-based simulation and measurement of the dynamic pull-in of viscously damped RF-MEMS switches

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Repulsive bimodal atomic force microscopy on polymers

Bimodal atomic force microscopy can provide high-resolution images of polymers. In the bimodal operation mode, two eigenmodes of the cantilever are driven simultaneously. When examining polymers, an effective mechanical contact is often required between the tip and the sample to obtain compositional contrast, so particular emphasis was placed on the repulsive regime of dynamic force microscopy. We thus investigated bimodal imaging on a polystyrene-block-polybutadiene diblock copolymer surface and on polystyrene. The attractive operation regime was only stable when the amplitude of the second eigenmode was kept small compared to the amplitude of the fundamental mode. To clarify the influence of the higher eigenmode oscillation on the image quality, the amplitude ratio of both modes was systematically varied. Fourier analysis of the time series recorded during imaging showed frequency mixing. However, these spurious signals were at least two orders of magnitude smaller than the first two fundamental eigenmodes. Thus, repulsive bimodal imaging of polymer surfaces yields a good signal quality for amplitude ratios smaller than A 01/A 02 = 10:1 without affecting the topography feedback. © 2012 Gigler et al; licensee Beilstein-Institut.This work was financially supported by the European Commission (FORCETOOL, NMP4-CT-2004-013684) and the Excellence Cluster “Nanosystems Initiative Munich> (NIM).Peer Reviewe