Mixed-Field Radiation Qualification of a COTS Space On-Board Computer along with its CMOS Camera Payload

The radiation qualification of a complex space system made out of multiple commercial electronic components and modules is a non-standardized task with certain limitations, but also wide potentialities. This paper delves into the features of a system-level test methodologies and explains how to use the data retrieved with a mixed-field characterization. Lesson learned concepts can be applied to the the system level irradiation test preparation as well as the actual application

Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors

International audienceThis article investigates the dark current as well as the dark current random telegraph signal (RTS) after 1-MeV electron, 3-MeV electron, and 10-keV X-ray irradiations in a pinned photodiode CMOS image sensor (CIS). A large range of deposited ionizing dose from 10 to 525 krad(SiO 2 ) is considered. The displacement damage dose deposited through electron irradiation ranges from 60 to 1200 TeV · g -1 . Results on dark current distributions highlight the predominance of the ionizing damage in opposition to the displacement damage induced by the electron irradiations. Moreover, the dark current distributions also suggest that if the ionizing dose is high enough [i.e., beyond 50 krad(SiO 2 )], the trapped positive charges in the silicon oxides create high magnitude electric field regions leading to an electric field enhancement (EFE) of the dark current which is neither present at lower doses nor in pristine image sensors. This EFE mechanism also seems to have a strong influence on the RTS leading to a clear discrepancy from the existing dark current nonuniformity model developed for amplitude distributions in CISs as well as from what is reported in the literature in the more studied ionizing dose range. Annealing treatments after electron irradiations have highlighted the existence of specific population of pixels sharing the same well-defined maximum transition amplitudes (i.e., maximum amplitude between two dark current levels). The results suggest the use of maximum transition amplitude spectroscopy applied to dark current RTS to push forward the investigation on radiation-induced defects creation and identification

A first look at the SuperCam RMI images aboard Perseverance

International audience<p>Starting in February 2021, the <strong>Perseverance rover</strong> will characterize a new landing site, the Jezero crater on Mars, and assemble a returnable cache of samples [1]. Among the remote sensing instruments, SuperCam combines chemical, mineralogical and organic spectroscopy, sound recording and imaging [2, 3, 4]. SuperCam’s <strong>RMI (Remote Micro-Imager)</strong> provides pictures for local context and site imaging at high-resolution.</p><p><br>The 110-mm SuperCam telescope with a focal length of 563 mm allows to take color images of 2048x2048 pixels with a CMOS camera on a bandwidth from ~375 to ~655 nm. The images will be divided by a reference flat-field to correct the attenuation factor of ~5 due to vignetting. The diameter of the circular field-of-view is ~18.8 mrad. The angular size of the RMI pixels is slightly less than 10 microrads, and the effective image resolution is better than 80 microrads, which represents 0.24 mm at 3 m.</p><p><br>Images will be taken at the start and end of the SuperCam raster observations [3] and assembled into annotated mosaics, which will provide information on the nature of the targets at the scale of the SuperCam investigation. Images will also be taken to study remote outcrops. At the time of the conference, Perseverance will have been on Mars for 2 months. Although the first images of the RMI will be used to check the health of the instrument, we also hope to have a first view of the landing site by then.</p><p><br><strong>References:</strong> [1] Farley K.A. et al. (2020) SSR, 216, 142. [2] Maurice S. et al. (in revision) SSR. [3] Wiens R.C. et al. (2021) SSR, 217, 4. [4] Maurice S. et al. (this issue). </p&gt

DROID: A mission concept to accompany and characterize Apophis through its 2029 Earth closest approach

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Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

International audienceFunctional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricted intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system, in general, because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test are provided to allow understanding which information can be extracted from these kinds of functional verification schemes in order to compare them with the reliability and availability requirements. The use of a general scaling factor for the observed high-level cross sections allows converting test cross sections into orbit rates