Atomic spectroscopy and atomic spectral analysis. Bibliography of Russian books on the theory, equipment and practical methods of application

В журнале «Аналитика и контроль» ранее были опубликованы четыре части обзорного библиографического списка русскоязычных книг по атомной спектроскопии и атомному спектральному анализу (Пупышев А.А. // Аналитика и контроль. 1998. Т. 2, № 1(3). С. 99-101; 1998. Т. 2, № 2(4). С. 88-104; 1998. Т. 2, № 3-4. С. 147-160; 2010, Т.14, № 4. С. 268-277). Список оказался весьма востребован аналитиками-спектроскопистами. В последние годы появились электронные каталоги книжных фондов крупнейших библиотек России. Это позволило уточнить библиографическую информацию по большинству книг, упоминаемых в списке, и существенно расширить объем списка за счет ранее не упомянутых книг.Previously the “Analytics and Control” journal published four parts of the bibliography index of Russian books on the atomic spectroscopy and atomic spectral analysis (A.A. Pupyshev. Analitika i kontrol’ ( Analytics and Control ), 1998, vol. 2, no. 1(3), pp. 99-101; 1998, vol. 2, no. 2(4), pp. 88-104; 1998, vol. 2, no. 3-4. pp. 147-160; 2010, vol. 14, no. 4, pp. 268-277). The index has been in very high demand by analysts and spectroscopists. In recent years, major Russian libraries have established electronic catalogs of the book collections. This has allowed refining the bibliographic information on the majority of the books mentioned in the above index, and significantly expanding the scope of the index by including previously omitted books

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Study of a confined Hydrogen-like atom by the Asymptotic Iteration Method

The asymptotic iteration method (AIM) is used to obtain both special exact solutions and general approximate solutions for a Hydrogen-like atom confined in a spherical box of arbitrary radius R. Critical box radii, at which states are no longer bound, are also calculated. The results are compared with those in the literature.Comment: 10 page

Extractants selection for hyphenated electrothermal atomic absorption method

The theoretical approach for extractants selection during hyphenated atomic absorption determination of highly volatile metals (Pb, Cd), hydride- (Sb, Bi) and carbide-forming (Cr) metals using thermodynamic modelling was proposed. The calculated parameter - maximum pyrolysis temperature - can be used for selection of the extractants and chemical modifiers. Using this approach the antimony extract with Brilliant green was modified for which the 1.8-fold sensitivity and 2.6-fold repeatability decreasing while extract sampling in graphite furnace was observed. A chemical modifier - mixture of hydrazine nitrate with the palladium(II) complex with Xylenol orange - was theoretically selected and experimentally tested, which allowed to enhance the maximum pyrolysis temperature on 200 C, to eliminate extract matrix influence. Using this modifier two-fold increasing in sensitivity and 3-fold decreasing in relative standard deviation was achieved while extraction atomic absorption determination. [Figure not available: see fulltext.] © 2013 Versita Warsaw and Springer-Verlag Wien

ЖУРНАЛУ «АНАЛИТИКА И КОНТРОЛЬ» - 25 ЛЕТ!

The anniversary of the magazineЮбилей журнал

АТОМНАЯ СПЕКТРОСКОПИЯ И АТОМНЫЙ СПЕКТРАЛЬНЫЙ АНАЛИЗ. БИБЛИОГРАФИЧЕСКИЙ УКАЗАТЕЛЬ РУССКОЯЗЫЧНЫХ КНИГ ПО ТЕОРИИ, АППАРАТУРЕ И ПРАКТИКЕ ПРИМЕНЕНИЯ МЕТОДОВ

  Previously the “Analytics and Control” journal published four parts of the bibliography index of Russian books on the atomic spectroscopy and atomic spectral analysis (A.A. Pupyshev. Analitika i kontrol’ (Analytics and Control),  1998, vol. 2, no. 1(3), pp. 99-101; 1998,  vol. 2, no. 2(4), pp. 88-104; 1998, vol. 2, no. 3-4. pp. 147-160; 2010, vol. 14, no. 4, pp. 268-277). The index has been in very high demand by analysts and spectroscopists. In recent years, major Russian libraries have established electronic catalogs of the book collections. This has allowed refining the bibliographic information on the majority of the books mentioned in the above index, and significantly expanding the scope of the index by including previously omitted books.(Russian)DOI: http://dx.doi.org/10.15826/analitika.2015.20.1.005В журнале «Аналитика и контроль» ранее были  опубликованы четыре части обзорного библиографического списка русскоязычных книг по атомной спектроскопии и атомному спектральному анализу (Пупышев А.А. // Аналитика и контроль. 1998. Т. 2, № 1(3). С. 99-101; 1998. Т. 2, № 2(4). С. 88-104; 1998. Т. 2, № 3-4. С. 147-160; 2010, Т.14, № 4. С. 268-277). Список оказался весьма востребован аналитиками-спектроскопистами. В последние годы появились электронные каталоги книжных фондов крупнейших библиотек России. Это позволило уточнить библиографическую информацию по большинству книг, упоминаемых в списке, и существенно расширить объем списка за счет ранее не упомянутых книг.DOI: http://dx.doi.org/10.15826/analitika.2015.20.1.00

SPECTRAL INTERFERENCES AND THEIR CORRECTION IN ATOMIC EMISSION SPECTRAL ANALYSIS

The main sources of spectral interferences in atomic emission spectral analysis (AESA) are considered, including both wide-range (bremsstrahlung and recombination continuum, radiation of hot condensed particles and electrode ends, scattered light in the spectrometer, overlapping of the analytical line by the wings of the neighbor strong spectral lines of interfering elements, imposition of the components of molecular bands with the very close lines) and narrow-band (partial or complete overlapping of the analytical line with atomic or ionic lines of the sample elements, electrodes and discharge atmosphere; superposition of spectra from higher orders of reflection in conventional diffraction spectrometers and from neighboring orders in two-dimensional echelle spectrometers). The features of their manifestation in various sources of spectrum excitation (flames, DC arc, spark discharges, arc plasma discharges, inductively coupled plasma, microwave plasma, low-pressure electric discharges, laser spark) are considered. The possibilities of reducing the level of spectral interferences or elimination of the spectral noise at the stage of design and manufacturing of AESA devices, as well as upon selecting and adjusting of operation conditions of the analysis are shown. Much attention is paid to the most easily implemented in practice off-peak correction of wide-range spectral interferences. The modern methods of background correction under the spectral peak (under-peak) using a software for atomic emission spectrometers and providing creation of various mathematical models of the background signal in the vicinity of the analytical line at the stage of developing a specific AESA technique are considered. The issues of the choice of spectral lines for analytical measurements, tables and atlases of spectral lines, electronic databases used for this purpose are considered in detail. Specific features of application of the method of inter-element correction with direct spectral overlapping of the lines are given. The operating sequence for taking into account spectral interferences when developing the analysis techniques is proposed. © 2019 by the Author(s)

Thickness determinination of electroplated Ni-P, Sn-Bi and Sn-Pb coatings by atomic emission spectrometry with a direct current glow discharge

Метод атомно-эмиссионной спектрометрии с тлеющим разрядом позволяет определять химический состав покрытий и их толщину, проводить послойный анализ. Используя значения скорости катодного распыления покрытий различного химического состава можно проводить атомно-эмиссионное определение толщины их покрытий по единому градуировочному графику. Для реализации этого способа изготовлен комплект образцов сравнения с покрытием Ni-P. Образцы аттестованы по толщине покрытия с применением регламентированных химического, металлографического и рентгенофлуоресцентного методов анализа. С использованием атомно-эмиссионного спектрометра с тлеющим разрядом постоянного тока в оптимальных операционных параметрах, обеспечивающих плоское дно кратера прожига, получена градуировочная зависимость толщины покрытия Ni-P от времени его катодного травления. Показано, что метрологические показатели данного метода контроля толщины покрытий Ni-P не хуже, чем для методов, регламентируемых ГОСТ. Изготовлены образцы покрытий Sn-Bi и Sn-Pb. Регламентируемыми методами анализа определена толщина этих покрытий, установлены оптимальные операционные параметры тлеющего разряда, обеспечивающие плоское дно кратера, измерены абсолютные и относительные скорости распыления покрытий в тлеющем разряде постоянного тока. С использованием атомно-эмиссионной градуировочной зависимости для покрытия Ni-P и установленных относительных скоростей распыления на ряде образцов определена толщина покрытий Sn-Bi и Sn-Pb Показано, что метрологические показатели данного метода контроля не хуже, чем методами, регламентируемыми ГОСТ. Разработана и аттестована методика измерения толщины покрытий Ni-P, Sn-Bi и Sn-Pb методом атомно-эмиссионной спектрометрии с тлеющим разрядом постоянного тока.Glow discharge atomic emission spectrometry allows determining the chemical composition of the coatings and their thickness as well as to conduct the depth analysis. Atomic-emission determination of the coating thickness on a single calibration curve can be performed by using the sputtering rates of coatings with different chemical composition. To realize this method the set of comparative samples with Ni-P coating was made. Samples are certified for the coating thickness by a regulated chemical, metallographic and X-ray fluorescence analysis methods. Using the atomic emission spectrometer with a dc glow discharge under optimal operating parameters, which provides a flat bottom of the crater, the calibration curve for dependence of the Ni-P coating thickness against its cathode etching was obtained. It is shown that the metrological characteristics of the current method for control of Ni-P coating thickness is not worse than the methods regulated by GOST. Samples of Sn-Bi and Sn-Pb coatings were made. The thickness of the coating was determined by the regulated methods of analysis, the optimal operating parameters of the glow discharge, which provides a flat bottom of the crater, were determined, and the absolute and relative sputtering rates of coatings in dc glow discharge were measured. Using the atomic emission calibration curve for Ni-P coating and established relative rates of sputtering, the thickness of Sn-Bi and Sn-Pb coatings was determined. It is shown that the metrological characteristics of this method are not worse than the methods regulated by GOST. Methodology for measuring the thickness of Ni-P, Sn-Bi and Sn-Pb coatings using atomic emission spectrometry with a dc glow discharge was developed and certified