Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers

This paper presents the study of an original closed-loop conditioning approach for fully-integrated convective inertial sensors. The method is applied to an accelerometer manufactured on a standard CMOS technology using an auto-aligned bulk etching step. Using the thermal behavior of the sensor as a summing function, a first order sigma-delta modulator is built. This "electro-physical" modulator realizes an analog-to-digital conversion of the signal. Besides the feedback scheme should improve the sensor performance.Comment: Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/16838

Investigation of the power-clock network impact on adiabatic logic

International audienceAdiabatic logic is architecture design style which seems to be a good candidate to reduce the power consumption of digital cores. One key difference is that the power supply is also the clock signal. A lot of work on different adiabatic logic families has been done but the impact of the power supply and the power-clock network still remains to be studied. In this paper, we investigate the power-clock network effect on adiabatic energy dissipation. We derive closed-form analytical formulas to represent the output signal voltage and energy dissipation while taking into account the parasitic impedance of the power-clock network with respect to switching frequency such that adiabatic conditions are still met. Experiments, based on simulation, show that the power-clock network impacts both the energy efficiency of the circuit and its frequency

Impact of Technology Spreading on MEMS design Robustness

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Design for Manufacturing of MNT-based Systems: a test case

National audienc

Challenges in Manufacturing Test of MNT-based Systems

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Conception de Microsystèmes Monolithiques Testables et Robustes aux Variations de Process

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Tutorial on Test Engineering and Design for Testability of Micro- and Nano- Systems

- Part I: Reliability, Failures and Test Structures in Micro- and Nano- Systems, 1h30International audienc

Design for Test of MNT-Based Systems: Alternative Test Solutions for Reduced Test Costs

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