74 research outputs found
Spectral analysis of sidewall roughness during resist-core self-aligned double patterning integration
International audienc
Electrical Instabilities of HfO2 Metal-insulator-metal Devices Under Dc and Ac Voltage Stresses
International audienc
Atomic Layer Deposition of high k materials for MIM devices : MIM capacitors and non volatile memories (RRAM)
International audienc
Comparing the switching characteristics of two resistive RAM technologies: Cu-SiO2 Conductive-Bridging-RAMs and HfO2 Oxide-RAMs
International audienc
Dielectric relaxation in hafnium oxide: a study of transient currents and admittance spectroscopy in HfO2 metal-insulator-metal devices
International audienc
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